The Physical And Failure Analysis Of Integrated Circuits 2001
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Author |
: Wilson Tan |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: 262 |
Release |
: 2001 |
ISBN-10 |
: 0780366751 |
ISBN-13 |
: 9780780366756 |
Rating |
: 4/5 (51 Downloads) |
Synopsis Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001 by : Wilson Tan
This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Author |
: IEEE ELECTRON DEVICES SOCIETY |
Publisher |
: IEEE |
Total Pages |
: 200 |
Release |
: 2001-01-01 |
ISBN-10 |
: 078036676X |
ISBN-13 |
: 9780780366763 |
Rating |
: 4/5 (6X Downloads) |
Synopsis The Physical and Failure Analysis of Integrated Circuits, 2001 by : IEEE ELECTRON DEVICES SOCIETY
Author |
: IEEE, Reliability/CPMT/ED Singapore Chap Staff |
Publisher |
: |
Total Pages |
: |
Release |
: 2001 |
ISBN-10 |
: OCLC:1316289728 |
ISBN-13 |
: |
Rating |
: 4/5 (28 Downloads) |
Synopsis 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits by : IEEE, Reliability/CPMT/ED Singapore Chap Staff
Author |
: Lawrence C. Wagner |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 256 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461549192 |
ISBN-13 |
: 1461549191 |
Rating |
: 4/5 (92 Downloads) |
Synopsis Failure Analysis of Integrated Circuits by : Lawrence C. Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Author |
: Wilson Tan |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: 324 |
Release |
: 2001 |
ISBN-10 |
: 0780366751 |
ISBN-13 |
: 9780780366756 |
Rating |
: 4/5 (51 Downloads) |
Synopsis Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits by : Wilson Tan
This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Author |
: |
Publisher |
: |
Total Pages |
: |
Release |
: |
ISBN-10 |
: OCLC:1026445071 |
ISBN-13 |
: |
Rating |
: 4/5 (71 Downloads) |
Synopsis Physical & Failure Analysis of Integrated Circuits, International Symposium on by :
Author |
: IEEE Singapore Section |
Publisher |
: |
Total Pages |
: |
Release |
: 1987 |
ISBN-10 |
: OCLC:79075313 |
ISBN-13 |
: |
Rating |
: 4/5 (13 Downloads) |
Synopsis Physical and Failure Analysis of Integrated Circuits by : IEEE Singapore Section
Author |
: |
Publisher |
: |
Total Pages |
: 309 |
Release |
: 2007 |
ISBN-10 |
: 1509085300 |
ISBN-13 |
: 9781509085309 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits by :
Author |
: Souvik Mahapatra |
Publisher |
: IEEE Computer Society Press |
Total Pages |
: 309 |
Release |
: 2007-01-01 |
ISBN-10 |
: 1424410142 |
ISBN-13 |
: 9781424410149 |
Rating |
: 4/5 (42 Downloads) |
Synopsis Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits by : Souvik Mahapatra
Author |
: |
Publisher |
: |
Total Pages |
: |
Release |
: 2011 |
ISBN-10 |
: OCLC:778789805 |
ISBN-13 |
: |
Rating |
: 4/5 (05 Downloads) |
Synopsis Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the by :