Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits
Author :
Publisher : Springer Science & Business Media
Total Pages : 256
Release :
ISBN-10 : 9781461549192
ISBN-13 : 1461549191
Rating : 4/5 (92 Downloads)

Synopsis Failure Analysis of Integrated Circuits by : Lawrence C. Wagner

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

Integrated Circuit Failure Analysis

Integrated Circuit Failure Analysis
Author :
Publisher : John Wiley & Sons
Total Pages : 198
Release :
ISBN-10 : 0471974013
ISBN-13 : 9780471974017
Rating : 4/5 (13 Downloads)

Synopsis Integrated Circuit Failure Analysis by : Friedrich Beck

Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.

Failure-Free Integrated Circuit Packages

Failure-Free Integrated Circuit Packages
Author :
Publisher : McGraw Hill Professional
Total Pages : 394
Release :
ISBN-10 : 0071434844
ISBN-13 : 9780071434843
Rating : 4/5 (44 Downloads)

Synopsis Failure-Free Integrated Circuit Packages by : Charles Cohn

The shrinking of integrated circuits (ICs) puts tremendous stress on overall device reliability. This unique treatment uses graphic illustration to clearly identify all major failure mode types, so engineers can spot failures before they occur.

CMOS Electronics

CMOS Electronics
Author :
Publisher : John Wiley & Sons
Total Pages : 370
Release :
ISBN-10 : 0471476692
ISBN-13 : 9780471476696
Rating : 4/5 (92 Downloads)

Synopsis CMOS Electronics by : Jaume Segura

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.