Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001

Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Total Pages : 262
Release :
ISBN-10 : 0780366751
ISBN-13 : 9780780366756
Rating : 4/5 (51 Downloads)

Synopsis Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001 by : Wilson Tan

This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author :
Publisher : ASM International
Total Pages : 540
Release :
ISBN-10 : 9781627082730
ISBN-13 : 1627082735
Rating : 4/5 (30 Downloads)

Synopsis ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis by :

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits
Author :
Publisher : Springer Science & Business Media
Total Pages : 256
Release :
ISBN-10 : 9781461549192
ISBN-13 : 1461549191
Rating : 4/5 (92 Downloads)

Synopsis Failure Analysis of Integrated Circuits by : Lawrence C. Wagner

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.