Proceedings Of The 2001 8th International Symposium On The Physical Failure Analysis Of Integrated Circuits
Download Proceedings Of The 2001 8th International Symposium On The Physical Failure Analysis Of Integrated Circuits full books in PDF, epub, and Kindle. Read online free Proceedings Of The 2001 8th International Symposium On The Physical Failure Analysis Of Integrated Circuits ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads.
Author |
: Wilson Tan |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: 262 |
Release |
: 2001 |
ISBN-10 |
: 0780366751 |
ISBN-13 |
: 9780780366756 |
Rating |
: 4/5 (51 Downloads) |
Synopsis Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001 by : Wilson Tan
This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Author |
: IEEE ELECTRON DEVICES SOCIETY |
Publisher |
: IEEE |
Total Pages |
: 200 |
Release |
: 2001-01-01 |
ISBN-10 |
: 078036676X |
ISBN-13 |
: 9780780366763 |
Rating |
: 4/5 (6X Downloads) |
Synopsis The Physical and Failure Analysis of Integrated Circuits, 2001 by : IEEE ELECTRON DEVICES SOCIETY
Author |
: |
Publisher |
: |
Total Pages |
: 378 |
Release |
: 2005 |
ISBN-10 |
: UOM:39015058329940 |
ISBN-13 |
: |
Rating |
: 4/5 (40 Downloads) |
Synopsis Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits by :
Author |
: IEEE, Reliability/CPMT/ED Singapore Chap Staff |
Publisher |
: |
Total Pages |
: |
Release |
: 2001 |
ISBN-10 |
: OCLC:1316289728 |
ISBN-13 |
: |
Rating |
: 4/5 (28 Downloads) |
Synopsis 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits by : IEEE, Reliability/CPMT/ED Singapore Chap Staff
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 540 |
Release |
: 2019-12-01 |
ISBN-10 |
: 9781627082730 |
ISBN-13 |
: 1627082735 |
Rating |
: 4/5 (30 Downloads) |
Synopsis ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis by :
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Author |
: Institute of Electrical and Electronics Engineers |
Publisher |
: |
Total Pages |
: |
Release |
: 2006 |
ISBN-10 |
: 1424402069 |
ISBN-13 |
: 9781424402069 |
Rating |
: 4/5 (69 Downloads) |
Synopsis Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the by : Institute of Electrical and Electronics Engineers
Author |
: |
Publisher |
: |
Total Pages |
: 258 |
Release |
: 2002 |
ISBN-10 |
: OCLC:755263210 |
ISBN-13 |
: |
Rating |
: 4/5 (10 Downloads) |
Synopsis Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002 by :
Author |
: Souvik Mahapatra |
Publisher |
: IEEE Computer Society Press |
Total Pages |
: 309 |
Release |
: 2007-01-01 |
ISBN-10 |
: 1424410142 |
ISBN-13 |
: 9781424410149 |
Rating |
: 4/5 (42 Downloads) |
Synopsis Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits by : Souvik Mahapatra
Author |
: |
Publisher |
: |
Total Pages |
: 309 |
Release |
: 2007 |
ISBN-10 |
: 1509085300 |
ISBN-13 |
: 9781509085309 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits by :
Author |
: Lawrence C. Wagner |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 256 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461549192 |
ISBN-13 |
: 1461549191 |
Rating |
: 4/5 (92 Downloads) |
Synopsis Failure Analysis of Integrated Circuits by : Lawrence C. Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.