Increasing possibilities of computer-aided data processing have caused a new revival of optical techniques in many areas of mechanical and chemical en gineering. Optical methods have a long tradition in heat and mass transfer and in fluid dynamics. Global experimental information is not sufficient for developing constitution equations to describe complicated phenomena in fluid dynamics or in transfer processes by a computer program . Furthermore, a detailed insight with high local and temporal resolution into the thermo-and fluiddynamic situations is necessary. Sets of equations for computer program in thermo dynamics and fluid dynamics usually consist of two types of formulations: a first one derived from the conservation laws for mass, energy and momentum, and a second one mathematically modelling transport processes like laminar or turbulent diffusion. For reliably predicting the heat transfer, for example, the velocity and temperature field in the boundary layer must be known, or a physically realistic and widely valid correlation describing the turbulence must be avail able. For a better understanding of combustion processes it is necessary to know the local concentration and temperature just ahead of the flame and in the ignition zone.

Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Fundamental measurement problems in engineering, mechanics, manufacturing, and physics are now being solved by powerful optical methods. This book presents a lucid, up-to-date discussion of these optical methods. Beginning from a firm base in modern optics, the book proceeds through relevant theory of interference and diffraction and integrates this theory with descriptions of laboratory techniques and apparatus. Among the techniques discussed are classical interferometry, photoelasticity, geometric moire, spatial filtering, moire interferometry, holography, holographic interferometry, laser speckle interferometry, and video-based speckle methods. By providing a firm base in the physical principles and at the same time allowing the reader to perform meaningful experiments related to the topic being studied, the book offers a unique user-oriented approach that will appeal to students, researchers and practising engineers.

This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.

The design of mechanical components for various engineering applications requires the understanding of stress distribution in the materials. The need of determining the nature of stress distribution on the components can be achieved with experimental techniques. Applications and Techniques for Experimental Stress Analysis is a timely research publication that examines how experimental stress analysis supports the development and validation of analytical and numerical models, the progress of phenomenological concepts, the measurement and control of system parameters under working conditions, and identification of sources of failure or malfunction. Highlighting a range of topics such as deformation, strain measurement, and element analysis, this book is essential for mechanical engineers, civil engineers, designers, aerospace engineers, researchers, industry professionals, academicians, and students.

Fiber Optic Measurement Techniques is an indispensable collection of key optical measurement techniques essential for developing and characterizing today's photonic devices and fiber optic systems. The book gives comprehensive and systematic descriptions of various fiber optic measurement methods with the emphasis on the understanding of optoelectronic signal processing methodologies, helping the reader to weigh up the pros and cons of each technique and establish their suitability for the task at hand. Carefully balancing descriptions of principle, operations and optoelectronic circuit implementation, this indispensable resource will enable the engineer to: - Understand the implications of various measurement results and system performance qualifications - Characterize modern optical systems and devices - Select optical devices and subsystems in optical network design and implementation - Design innovative instrumentations for fiber optic systems The 2nd edition of this successful reference has been extensively updated (with 150 new pages) to reflect the advances in the field since publication in 2008 and includes: - A new chapter on fiber-based optical sensors and spectroscopy techniques - A new chapter on measurement uncertainty and error analysis Fiber Optic Measurement Techniques brings together in one volume the fundamental principles with the latest techniques, making it a complete resource for the optical and communications engineer developing future optical devices and fiber optic systems. - The only book to combine explanations of the basic principles with latest techniques to enable the engineer to develop photonic systems of the future - Careful and systematic presentation of measurement methods to help engineers to choose the most appropriate for their application - The latest methods covered, such as real-time optical monitoring and phase coded systems and subsystems, making this the most up-to-date guide to fiber optic measurement

A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.

This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications. - Written by the leading international experts from industry, government, and academia - Written as a handbook, with in depth discussion of the topics - Focus on making the most accurate and reproducible measurements - Many practical applications and examples

The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. · Written by one of the world's leading metrologists · Covers electronics and optics applications as well as mechanical · Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia