The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.

The function of a component part can be profoundly affected by its surface topography. There are many examples in nature of surfaces that have a well-controlled topography to affect their function. Examples include the hydrophobic effect of the lotus leaf, the reduction of fluid drag due to the riblet structure of shark skin, the directional adhesion of the gecko foot and the angular sensitivity of the multi-faceted fly eye. Surface structuring is also being used extensively in modern manufacturing. In this way many properties can be altered, for example optical, tribological, biological and fluidic. Previously, single line (profile) measurements were adequate to control manufacture of surfaces, but as the need to control the functionality of surfaces increases, there is a growing need for three-dimensional (areal) measurement and characterisation techniques. For this reason there has been considerable research, development and standardisation of areal techniques. This book will present the areal framework that is being adopted by the international community. Whereas previous books have concentrated on the measurement aspects, this book concentrates on the characterisation techniques, i.e. how to interpret the measurement data to give the appropriate (functional) information for a given task. The first part of the book presents the characterisation methods and the second part case studies that highlight the use of areal methods in a broad range of subject areas - from automobile manufacture to archaeology. Contents Introduction to Surface Topography The Areal Field Parameters The Areal Feature Parameters Areal Filtering Methods Areal Form Removal Areal Fractal Methods Choosing the Appropriate Parameter Characterisation of Individual Areal Features Multi-Scale Signature of Surface Topography Correlation of Areal Surface Texture Parameters to Solar Cell Efficiency Characterisation of Cylinder Liner Honing Textures for Production Control Characterisation of the Mechanical Bond Strength for Copper on Glass Plating Applications Inspection of Laser Structured Cams and Conrods Road Surfaces

The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. · Written by one of the world's leading metrologists · Covers electronics and optics applications as well as mechanical · Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia

An advanced 1999 text for those working in materials science and related inter-disciplinary subjects.