Istfa 2006
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Author |
: Electronic Device Failure Analysis Society |
Publisher |
: ASM International |
Total Pages |
: 524 |
Release |
: 2006 |
ISBN-10 |
: 9781615030897 |
ISBN-13 |
: 1615030891 |
Rating |
: 4/5 (97 Downloads) |
Synopsis ISTFA 2006 by : Electronic Device Failure Analysis Society
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 524 |
Release |
: 2005-01-01 |
ISBN-10 |
: 9781615030880 |
ISBN-13 |
: 1615030883 |
Rating |
: 4/5 (80 Downloads) |
Synopsis Istfa 2005 by : ASM International
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 372 |
Release |
: 2007-01-01 |
ISBN-10 |
: 9781615030903 |
ISBN-13 |
: 1615030905 |
Rating |
: 4/5 (03 Downloads) |
Synopsis ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis by : ASM International
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 551 |
Release |
: 2008-01-01 |
ISBN-10 |
: 9781615030910 |
ISBN-13 |
: 1615030913 |
Rating |
: 4/5 (10 Downloads) |
Synopsis Thirty-fourth International Symposium for Testing and Failure Analysis by : ASM International
Author |
: A. S. M. International |
Publisher |
: ASM International |
Total Pages |
: 634 |
Release |
: 2013-01-01 |
ISBN-10 |
: 9781627080224 |
ISBN-13 |
: 1627080228 |
Rating |
: 4/5 (24 Downloads) |
Synopsis ISTFA 2013 by : A. S. M. International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author |
: A. S. M. International |
Publisher |
: ASM International |
Total Pages |
: 561 |
Release |
: 2014-11-01 |
ISBN-10 |
: 9781627080743 |
ISBN-13 |
: 1627080740 |
Rating |
: 4/5 (43 Downloads) |
Synopsis ISTFA 2014 by : A. S. M. International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 371 |
Release |
: 2009-01-01 |
ISBN-10 |
: 9781615030927 |
ISBN-13 |
: 1615030921 |
Rating |
: 4/5 (27 Downloads) |
Synopsis ISTFA 2009 by :
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 643 |
Release |
: 2012 |
ISBN-10 |
: 9781615039951 |
ISBN-13 |
: 1615039953 |
Rating |
: 4/5 (51 Downloads) |
Synopsis ISTFA 2012 by : ASM International
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 479 |
Release |
: 2011 |
ISBN-10 |
: 9781615038503 |
ISBN-13 |
: 1615038507 |
Rating |
: 4/5 (03 Downloads) |
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 487 |
Release |
: 2010-01-01 |
ISBN-10 |
: 9781615037278 |
ISBN-13 |
: 1615037276 |
Rating |
: 4/5 (78 Downloads) |