Istfa 2009
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Author |
: |
Publisher |
: ASM International |
Total Pages |
: 371 |
Release |
: 2009-01-01 |
ISBN-10 |
: 9781615030927 |
ISBN-13 |
: 1615030921 |
Rating |
: 4/5 (27 Downloads) |
Synopsis ISTFA 2009 by :
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 643 |
Release |
: 2012 |
ISBN-10 |
: 9781615039951 |
ISBN-13 |
: 1615039953 |
Rating |
: 4/5 (51 Downloads) |
Synopsis ISTFA 2012 by : ASM International
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 487 |
Release |
: 2010-01-01 |
ISBN-10 |
: 9781615037278 |
ISBN-13 |
: 1615037276 |
Rating |
: 4/5 (78 Downloads) |
Author |
: A. S. M. International |
Publisher |
: ASM International |
Total Pages |
: 634 |
Release |
: 2013-01-01 |
ISBN-10 |
: 9781627080224 |
ISBN-13 |
: 1627080228 |
Rating |
: 4/5 (24 Downloads) |
Synopsis ISTFA 2013 by : A. S. M. International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 551 |
Release |
: 2008-01-01 |
ISBN-10 |
: 9781615030910 |
ISBN-13 |
: 1615030913 |
Rating |
: 4/5 (10 Downloads) |
Synopsis Thirty-fourth International Symposium for Testing and Failure Analysis by : ASM International
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 666 |
Release |
: 2017-12-01 |
ISBN-10 |
: 9781627081511 |
ISBN-13 |
: 1627081518 |
Rating |
: 4/5 (11 Downloads) |
Synopsis ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by : ASM International
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 479 |
Release |
: 2011 |
ISBN-10 |
: 9781615038503 |
ISBN-13 |
: 1615038507 |
Rating |
: 4/5 (03 Downloads) |
Author |
: Tejinder Gandhi |
Publisher |
: ASM International |
Total Pages |
: 750 |
Release |
: 2019-11-01 |
ISBN-10 |
: 9781627082464 |
ISBN-13 |
: 1627082468 |
Rating |
: 4/5 (64 Downloads) |
Synopsis Microelectronics Fialure Analysis Desk Reference, Seventh Edition by : Tejinder Gandhi
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author |
: ASM. International |
Publisher |
: |
Total Pages |
: |
Release |
: 2009 |
ISBN-10 |
: OCLC:1065017364 |
ISBN-13 |
: |
Rating |
: 4/5 (64 Downloads) |
Synopsis ISTFA 2009 Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA by : ASM. International
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 0 |
Release |
: 2009 |
ISBN-10 |
: 1615030085 |
ISBN-13 |
: 9781615030088 |
Rating |
: 4/5 (85 Downloads) |
Synopsis ISTFA 2009 by :
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.