Thirty Fourth International Symposium For Testing And Failure Analysis
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Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 551 |
Release |
: 2008-01-01 |
ISBN-10 |
: 9781615030910 |
ISBN-13 |
: 1615030913 |
Rating |
: 4/5 (10 Downloads) |
Synopsis Thirty-fourth International Symposium for Testing and Failure Analysis by : ASM International
Author |
: Sabu Thomas |
Publisher |
: Elsevier |
Total Pages |
: 462 |
Release |
: 2022-01-26 |
ISBN-10 |
: 9780323998277 |
ISBN-13 |
: 0323998275 |
Rating |
: 4/5 (77 Downloads) |
Synopsis Nickel-Titanium Smart Hybrid Materials by : Sabu Thomas
Nickel-Titanium Smart Hybrid Materials: From Micro- to Nano-structured Alloys for Emerging Applications describes advanced properties that can be adapted in NiTi-alloys. Nickel-Titanium (NiTi) systems are receiving wide demand in growing industries due to their smart, high-temperature or biocompatible behavior. These influenced behaviors are carefully described in the micro-scale and nanoscale range, with NiTi smart materials described on the basis of their shape memory effect (SME) and super-elastic (SE) properties for sensor and actuator application. This book discusses novel properties of nickel-titanium systems, helping materials scientists and engineers produce smart technologies and systems for the aeronautical, automobile, mechanical, healthcare and electronics industries. - Describes the use of nanotechnology and microtechnology in nickel-titanium-based systems - Outlines the major properties of Nickel-Titanium Nanoalloys - Assesses the major challenges of manufacturing nickel-titanium nanoalloys at an industrial scale
Author |
: ASM International |
Publisher |
: ASM International(OH) |
Total Pages |
: 528 |
Release |
: 2008-01-01 |
ISBN-10 |
: 0871707144 |
ISBN-13 |
: 9780871707147 |
Rating |
: 4/5 (44 Downloads) |
Synopsis Thirty-fourth International Symposium for Testing and Failure Analysis by : ASM International
Author |
: Zhiyong Ma |
Publisher |
: CRC Press |
Total Pages |
: 889 |
Release |
: 2017-03-27 |
ISBN-10 |
: 9781351733946 |
ISBN-13 |
: 135173394X |
Rating |
: 4/5 (46 Downloads) |
Synopsis Metrology and Diagnostic Techniques for Nanoelectronics by : Zhiyong Ma
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author |
: EDFAS Desk Reference Committee |
Publisher |
: ASM International |
Total Pages |
: 673 |
Release |
: 2011 |
ISBN-10 |
: 9781615037261 |
ISBN-13 |
: 1615037268 |
Rating |
: 4/5 (61 Downloads) |
Synopsis Microelectronics Failure Analysis by : EDFAS Desk Reference Committee
Includes bibliographical references and index.
Author |
: Yan Li |
Publisher |
: Springer Nature |
Total Pages |
: 628 |
Release |
: 2022-10-28 |
ISBN-10 |
: 9789811950537 |
ISBN-13 |
: 9811950539 |
Rating |
: 4/5 (37 Downloads) |
Synopsis Advanced Driver Assistance Systems and Autonomous Vehicles by : Yan Li
This book provides a comprehensive reference for both academia and industry on the fundamentals, technology details, and applications of Advanced Driver-Assistance Systems (ADAS) and autonomous driving, an emerging and rapidly growing area. The book written by experts covers the most recent research results and industry progress in the following areas: ADAS system design and test methodologies, advanced materials, modern automotive technologies, artificial intelligence, reliability concerns, and failure analysis in ADAS. Numerous images, tables, and didactic schematics are included throughout. This essential book equips readers with an in-depth understanding of all aspects of ADAS, providing insights into key areas for future research and development. • Provides comprehensive coverage of the state-of-the-art in ADAS • Covers advanced materials, deep learning, quality and reliability concerns, and fault isolation and failure analysis • Discusses ADAS system design and test methodologies, novel automotive technologies • Features contributions from both academic and industry authors, for a complete view of this important technology
Author |
: Tejinder Gandhi |
Publisher |
: ASM International |
Total Pages |
: 719 |
Release |
: 2019-11-01 |
ISBN-10 |
: 9781627082464 |
ISBN-13 |
: 1627082468 |
Rating |
: 4/5 (64 Downloads) |
Synopsis Microelectronics Fialure Analysis Desk Reference, Seventh Edition by : Tejinder Gandhi
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author |
: Yoshio Nishi |
Publisher |
: CRC Press |
Total Pages |
: 1720 |
Release |
: 2017-12-19 |
ISBN-10 |
: 9781420017663 |
ISBN-13 |
: 1420017667 |
Rating |
: 4/5 (63 Downloads) |
Synopsis Handbook of Semiconductor Manufacturing Technology by : Yoshio Nishi
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author |
: Baojiang Sun |
Publisher |
: Springer Nature |
Total Pages |
: 423 |
Release |
: 2022-03-30 |
ISBN-10 |
: 9789811909603 |
ISBN-13 |
: 9811909601 |
Rating |
: 4/5 (03 Downloads) |
Synopsis Proceedings of The Fourth International Technical Symposium on Deepwater Oil and Gas Engineering by : Baojiang Sun
This book is a compilation of selected papers from the Fourth International Technical Symposium on Deepwater Oil and Gas Engineering & The Third International Youth Forum on Gas Hydrate, held in Qingdao, China in December 2021. The work focuses on the advancement of techniques for the deepwater oil and gas exploitation and natural gas hydrate exploitation. The book introduces new ideas for exploring deepwater oil and gas hydrate in a safe and efficient way. Advances of the natural gas hydrate pilot production in South China Sea, in oil and gas flow assurance and emerging technologies based on clathrate hydrate will be presented. It is a valuable resource for both practitioners and academics working in the field of deepwater oil and gas engineering.
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 813 |
Release |
: 2004-01-01 |
ISBN-10 |
: 9780871708045 |
ISBN-13 |
: 0871708043 |
Rating |
: 4/5 (45 Downloads) |
Synopsis Microelectronics Failure Analysis by :
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron