This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.

X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: The history of X-ray fluorescence spectrometry-new to this edition. A critical review of the most useful X-ray spectrometers. Techniques and procedures for quantitative and qualitative analysis. Modern applications and industrial trends. X-ray spectra-new to this edition.

A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.

Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectroscopy and pays tribute to the scientific work of Prof. Yvette Cauchois. The text is organized into four parts. Part I covers the analysis of X-ray transitions between atomic levels and relativistic theories of X-ray emission satellites and electron BremsStrahlung. Part II reviews the means provided by X-ray spectroscopy for the determination of the electronic structure of solids, while Part III discusses methods of obtaining types of information from X-ray spectra. The fourth part discusses techniques available for studies in the field. Researchers and professionals dealing with X-ray technology will find this book a great source of information regarding its development.

Generation and properties of x-rays; The measurement of x-ray intensity, x-ray detectors, and detector systems energy resolution; Absorptiometry with x-rays; x-ray spectra; The selection of x-ray wavelengths; x-ray diffraction in chemical analysis; Measurement of film thickness simple trace determinations; Reliability of x-ray emission spectrography statistical considerations; X-ray emission spectrography; Equipment and selected applications.

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

The fields of X-Ray Spectroscopy in Atomic and Solid State Physics have undergone spectacular growth, sometimes rather anarchic, during the past decade. The old mold of X-ray spectroscopy has been burst, and this ASI provided an in-depth exploration of theory and recently developed techniques; however, some work still needs to be done to create a new frame and reduce anarchy in the field. The purpose of this Institute was to gather atomic and solid state physicists working in theoretical and new experimental techniques recently developed. The lectures were concerned with, among others, the following fields: theory of X-ray near-edge structure, XPS and AES with conventional and synchrotron radiation sources, PIXE, EXAFS, SEXAFS, XRF, SXS, and molecular spectroscopy. The Institute considered in detail some of these experimental tech niques and the pertinent theoretical interpretations by selecting an important list of lectures which summarize the scientific contents of the ASI. The truly international character of this NATO ASI, its size, and the high quality of the lecturers contributed to make this school a very fruitful scientific meeting. Two to four general lectures were given each working day and three afternoons were reserved for presentation of current work in the form of posters. We think that these poster presentations reflect the current research work of the participants.

This volume outlines the physical and methodical concepts of X-ray photoelectron spectroscopy (XPS) specifically for surface studies using both inner and valence electron levels. It discusses the theory and practice of XPS qualitative and quantitative analysis of solid state surfaces and provides lists of extended experimental and theoretical data necessary for the determination of concentration and thin film thicknesses. In addition it covers the many problems concerning in-depth profiling, ion sputtering rate and damages of the structure of altered layers, as well as applications of angular dependence of the intensities and photoelectron diffraction for surface studies. Also provided are the applications of XPS for the investigations of catalysts, adsorption, electronic surface states, oxydation of semi-conductors and alloys, minerals, including lunar regolith and natural gold, glasses, radiation damage, surface diffusion, polymers, etc.

The authoritative handbook to exploiting the full power and versatility of PIXE— now and in the next century Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory. Yet, its undeniable analytical potential in other areas of science has scarcely been tapped. This unique reference, from PIXE specialists in biomedicine, atmospheric science, earth science, and art and archaeology, features a user-based look at PIXE's conceptual basics and methodology, with a view toward new and creative analytical work. Touching on every facet of PIXE technology, from basic instrumentation, specimens, the characteristics of X-ray spectroscopy, standardization of quantitative analysis, to the accuracy of PIXE analysis and its limits of detection, the book offers an unprecedented look at the newer uses of PIXE in such areas as: Applications of macro- and micro-PIXE in medicine, zoology, and botany Analysis of atmospheric aerosols Geological and extra-terrestrial material Analysis of gem stones, pottery, glass, and alloys As an exploratory tool for pigments and paintings and "paper-like" materials Complete with a comparative look contrasting PIXE with more conventional forms of analysis, this important reference is key to grasping the technique's practical specifics and exploiting its full analytical potential.