Generation and properties of x-rays; The measurement of x-ray intensity, x-ray detectors, and detector systems energy resolution; Absorptiometry with x-rays; x-ray spectra; The selection of x-ray wavelengths; x-ray diffraction in chemical analysis; Measurement of film thickness simple trace determinations; Reliability of x-ray emission spectrography statistical considerations; X-ray emission spectrography; Equipment and selected applications.

The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

Interaction of X rays and particle beams with materials.Radiaton generation and measuarement.Diffraction techniques applied to material analysis.

Relatively few analysts have regular working experience of x- ray diffraction and x-ray fluorescence techniques, and indeed many of the methods involved are more of an art than a science. X-Ray Methods aims to provide an insight into basic theory, instrumentation and the applications and limitations of these types of analysis. A variety of studies involving the use of actual x-ray data are included to provide a working knowledge of the results which may be obtained.

Simplified fundamentals; principles of x-ray generation, diffraction, and absorption; Excitation for x-ray analysis; Dispersion: spectrometer geometry and crystal properties; Detectons and circuits; Energy dispersion; Analysis, presision, and accuracy; Mathematical methods for quantitative analysis; Applications and specimen preparation; Eletron probe microanalysis.

Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study