Reliability And Degradation Of Iii V Optical Devices
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Author |
: Osamu Ueda |
Publisher |
: Artech House Publishers |
Total Pages |
: 376 |
Release |
: 1996 |
ISBN-10 |
: UOM:39015038140292 |
ISBN-13 |
: |
Rating |
: 4/5 (92 Downloads) |
Synopsis Reliability and Degradation of III-V Optical Devices by : Osamu Ueda
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Author |
: Massimo Vanzi |
Publisher |
: Elsevier |
Total Pages |
: 270 |
Release |
: 2021-07-24 |
ISBN-10 |
: 9780081010891 |
ISBN-13 |
: 0081010893 |
Rating |
: 4/5 (91 Downloads) |
Synopsis Advanced Laser Diode Reliability by : Massimo Vanzi
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Author |
: Robert Herrick |
Publisher |
: Woodhead Publishing |
Total Pages |
: 336 |
Release |
: 2021-03-06 |
ISBN-10 |
: 9780128192559 |
ISBN-13 |
: 0128192550 |
Rating |
: 4/5 (59 Downloads) |
Synopsis Reliability of Semiconductor Lasers and Optoelectronic Devices by : Robert Herrick
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Author |
: Titu I. Băjenescu |
Publisher |
: Artech House |
Total Pages |
: 706 |
Release |
: 2010 |
ISBN-10 |
: 9781596934368 |
ISBN-13 |
: 1596934360 |
Rating |
: 4/5 (68 Downloads) |
Synopsis Component Reliability for Electronic Systems by : Titu I. Băjenescu
The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Author |
: Osamu Ueda |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 618 |
Release |
: 2012-09-22 |
ISBN-10 |
: 9781461443377 |
ISBN-13 |
: 1461443377 |
Rating |
: 4/5 (77 Downloads) |
Synopsis Materials and Reliability Handbook for Semiconductor Optical and Electron Devices by : Osamu Ueda
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author |
: A. Christou |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 571 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9789400924826 |
ISBN-13 |
: 9400924828 |
Rating |
: 4/5 (26 Downloads) |
Synopsis Semiconductor Device Reliability by : A. Christou
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Author |
: Shun Lien Chuang |
Publisher |
: John Wiley & Sons |
Total Pages |
: 842 |
Release |
: 2012-11-07 |
ISBN-10 |
: 9781118585658 |
ISBN-13 |
: 1118585658 |
Rating |
: 4/5 (58 Downloads) |
Synopsis Physics of Photonic Devices by : Shun Lien Chuang
The most up-to-date book available on the physics of photonic devices This new edition of Physics of Photonic Devices incorporates significant advancements in the field of photonics that have occurred since publication of the first edition (Physics of Optoelectronic Devices). New topics covered include a brief history of the invention of semiconductor lasers, the Lorentz dipole method and metal plasmas, matrix optics, surface plasma waveguides, optical ring resonators, integrated electroabsorption modulator-lasers, and solar cells. It also introduces exciting new fields of research such as: surface plasmonics and micro-ring resonators; the theory of optical gain and absorption in quantum dots and quantum wires and their applications in semiconductor lasers; and novel microcavity and photonic crystal lasers, quantum-cascade lasers, and GaN blue-green lasers within the context of advanced semiconductor lasers. Physics of Photonic Devices, Second Edition presents novel information that is not yet available in book form elsewhere. Many problem sets have been updated, the answers to which are available in an all-new Solutions Manual for instructors. Comprehensive, timely, and practical, Physics of Photonic Devices is an invaluable textbook for advanced undergraduate and graduate courses in photonics and an indispensable tool for researchers working in this rapidly growing field.
Author |
: Kazumi Wada |
Publisher |
: CRC Press |
Total Pages |
: 430 |
Release |
: 2001-11-06 |
ISBN-10 |
: 9056997149 |
ISBN-13 |
: 9789056997144 |
Rating |
: 4/5 (49 Downloads) |
Synopsis Defects in Optoelectronic Materials by : Kazumi Wada
Defects in Optoelectronic Materials bridges the gap between device process engineers and defect physicists by describing current problems in device processing and current understanding of these defects based on defect physics. The volume covers defects and their behaviors in epitaxial growth, in various processes such as plasma processing, deposition and implantation, and in device degradation. This book also provides graduate students cutting-edge information on devices and materials interaction.
Author |
: H. Q. Hou |
Publisher |
: The Electrochemical Society |
Total Pages |
: 664 |
Release |
: 1998 |
ISBN-10 |
: 1566771943 |
ISBN-13 |
: 9781566771948 |
Rating |
: 4/5 (43 Downloads) |
Synopsis Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors by : H. Q. Hou
Author |
: D. B. Holt |
Publisher |
: Cambridge University Press |
Total Pages |
: 625 |
Release |
: 2007-04-12 |
ISBN-10 |
: 9781139463591 |
ISBN-13 |
: 1139463594 |
Rating |
: 4/5 (91 Downloads) |
Synopsis Extended Defects in Semiconductors by : D. B. Holt
A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.