This book is based on the authors’ research on the stabilization and fault-tolerant control of batch processes, which are flourishing topics in the field of control system engineering. It introduces iterative learning control for linear/nonlinear single/multi-phase batch processes; iterative learning optimal guaranteed cost control; delay-dependent iterative learning control; and iterative learning fault-tolerant control for linear/nonlinear single/multi-phase batch processes. Providing important insights and useful methods and practical algorithms that can potentially be applied in batch process control and optimization, it is a valuable resource for researchers, scientists, and engineers in the field of process system engineering and control engineering.

This book focuses on plastics process analysis, instrumentation for modern manufacturing in the plastics industry. Process analysis is the starting point since plastics processing is different from processing of metals, ceramics, and other materials. Plastics materials show unique behavior in terms of heat transfer, fluid flow, viscoelastic behavior, and a dependence of the previous time, temperature and shear history which determines how the material responds during processing and its end use. Many of the manufacturing processes are continuous or cyclical in nature. The systems are flow systems in which the process variables, such as time, temperature, position, melt and hydraulic pressure, must be controlled to achieve a satisfactory product which is typically specified by critical dimensions and physical properties which vary with the processing conditions. Instrumentation has to be selected so that it survives the harsh manufacturing environment of high pressures, temperatures and shear rates, and yet it has to have a fast response to measure the process dynamics. At many times the measurements have to be in a non-contact mode so as not to disturb the melt or the finished product. Plastics resins are reactive systems. The resins will degrade if the process conditions are not controlled. Analysis of the process allows one to strategize how to minimize degradation and optimize end-use properties.

Robust and Fault-Tolerant Control proposes novel automatic control strategies for nonlinear systems developed by means of artificial neural networks and pays special attention to robust and fault-tolerant approaches. The book discusses robustness and fault tolerance in the context of model predictive control, fault accommodation and reconfiguration, and iterative learning control strategies. Expanding on its theoretical deliberations the monograph includes many case studies demonstrating how the proposed approaches work in practice. The most important features of the book include: a comprehensive review of neural network architectures with possible applications in system modelling and control; a concise introduction to robust and fault-tolerant control; step-by-step presentation of the control approaches proposed; an abundance of case studies illustrating the important steps in designing robust and fault-tolerant control; and a large number of figures and tables facilitating the performance analysis of the control approaches described. The material presented in this book will be useful for researchers and engineers who wish to avoid spending excessive time in searching neural-network-based control solutions. It is written for electrical, computer science and automatic control engineers interested in control theory and their applications. This monograph will also interest postgraduate students engaged in self-study of nonlinear robust and fault-tolerant control.

The book presents selected, extended and peer reviewed papers from the International Multiconference on System, Automation and Control held Leipzig in 2018. These are complemented with solicited contributions by international experts. Main topics are automatic control, robotics, synthesis of automation systems. Application examples range from man-machine interaction, mechatronics, on to biological and economical models.

This book belongs to the subject of control and systems theory. It studies a novel data-driven framework for the design and analysis of iterative learning control (ILC) for nonlinear discrete-time systems. A series of iterative dynamic linearization methods is discussed firstly to build a linear data mapping with respect of the system’s output and input between two consecutive iterations. On this basis, this work presents a series of data-driven ILC (DDILC) approaches with rigorous analysis. After that, this work also conducts significant extensions to the cases with incomplete data information, specified point tracking, higher order law, system constraint, nonrepetitive uncertainty, and event-triggered strategy to facilitate the real applications. The readers can learn the recent progress on DDILC for complex systems in practical applications. This book is intended for academic scholars, engineers, and graduate students who are interested in learning control, adaptive control, nonlinear systems, and related fields.

The book investigates the fractional calculus-based approaches and their benefits to adopting in complex real-time areas. Another objective is to provide initial solutions for new areas where fractional theory has yet to verify the expertise. The book focuses on the latest scientific interest and illustrates the basic idea of general fractional calculus with MATLAB codes. This book is ideal for researchers working on fractional calculus theory both in simulation and hardware. Researchers from academia and industry working or starting research in applied fractional calculus methods will find the book most useful. The scope of this book covers most of the theoretical and practical studies on linear and nonlinear systems using fractional-order integro-differential operators.

This book constitutes the proceedings of the International Symposium on Neural N- works (ISNN 2004) held in Dalian, Liaoning, China duringAugust 19–21, 2004. ISNN 2004 received over 800 submissions from authors in ?ve continents (Asia, Europe, North America, South America, and Oceania), and 23 countries and regions (mainland China, Hong Kong, Taiwan, South Korea, Japan, Singapore, India, Iran, Israel, Turkey, Hungary, Poland, Germany, France, Belgium, Spain, UK, USA, Canada, Mexico, - nezuela, Chile, andAustralia). Based on reviews, the Program Committee selected 329 high-quality papers for presentation at ISNN 2004 and publication in the proceedings. The papers are organized into many topical sections under 11 major categories (theo- tical analysis; learning and optimization; support vector machines; blind source sepa- tion,independentcomponentanalysis,andprincipalcomponentanalysis;clusteringand classi?cation; robotics and control; telecommunications; signal, image and time series processing; detection, diagnostics, and computer security; biomedical applications; and other applications) covering the whole spectrum of the recent neural network research and development. In addition to the numerous contributed papers, ?ve distinguished scholars were invited to give plenary speeches at ISNN 2004. ISNN 2004 was an inaugural event. It brought together a few hundred researchers, educators,scientists,andpractitionerstothebeautifulcoastalcityDalianinnortheastern China. It provided an international forum for the participants to present new results, to discuss the state of the art, and to exchange information on emerging areas and future trends of neural network research. It also created a nice opportunity for the participants to meet colleagues and make friends who share similar research interests.

Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.