Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

This comprehensive text discusses the fundamentals of analog electronics applications, design, and analysis. Unlike the physics approach in other analog electronics books, this text focuses on an engineering approach, from the main components of an analog circuit to general analog networks. Concentrating on development of standard formulae for conventional analog systems, the book is filled with practical examples and detailed explanations of procedures to analyze analog circuits. The book covers amplifiers, filters, and op-amps as well as general applications of analog design.

This is a comprehensive introduction to Support Vector Machines, a generation learning system based on advances in statistical learning theory.

This book gathers papers presented during the 4th International Conference on Electrical Engineering and Control Applications. It covers new control system models, troubleshooting tips and complex system requirements, such as increased speed, precision and remote capabilities. Additionally, the papers discuss not only the engineering aspects of signal processing and various practical issues in the broad field of information transmission, but also novel technologies for communication networks and modern antenna design. This book is intended for researchers, engineers and advanced postgraduate students in the fields of control and electrical engineering, computer science and signal processing, as well as mechanical and chemical engineering.

Fault detection, with the characteristics of strong uncertainty and randomness, has always been one of the research hotspots in the field of aerospace. Considering that devices will inevitably encounter various unknown interference in the process of use, which greatly limits the performance of many traditional fault detection methods. Therefore, the main aim of this paper is to address this problem from the perspective of uncertainty and randomness of measurement signal. In information engineering, interval-valued neutrosophic sets (IVNSs), belief rule base (BRB), and Dempster-Shafer (D-S) evidence reasoning are always characterized by the strong ability in revealing uncertainty, but each has its drawbacks. As a result, the three theories are firstly combined in this paper to form a powerful fault detection algorithm. Besides, a series of innovations are proposed to improve the method, including a new score function based on p-norm for IVNSs and a new approach of calculating the similarity between IVNSs, which are both proved by authoritative prerequisites. To illustrate the effectiveness of the proposed method, flush air data sensing (FADS), a technologically advanced airborne sensor, is adopted in this paper. The aerodynamic model of FADS is analyzed in detail using knowledge of aerodynamics under subsonic and supersonic conditions, meanwhile, the high-precision model is established based on the aerodynamic database obtained from CFD software.