The topic of variation in language has received considerable attention in the field of general linguistics in recent years. This includes research on linguistic micro-variation that is dependent on fine distinctions in syntax and information structure. However, relatively little work has been done on how this variation is acquired. This book focuses on how different types of variation are expressed in the input and how this is acquired by young children. The collection of papers includes studies of the acquisition of variation in a number of different languages, including English, German, Greek, Italian, Korean, Norwegian, Swiss German, Ukrainian, and American Sign Language. Different kinds of linguistic variation are considered, ranging from pure word order variation to optionally doubly filled COMPs and the resolution of scopal ambiguities. In addition, papers in the volume deal with the extreme case of variation found in bilingual acquisition.

This book provides a forum for methodological discussions emanating from researchers engaged in studying how individuals acquire an additional language. Whereas publications in the field of second language acquisition generally report on empirical studies with relatively little space dedicated to questions of method, the current book gave authors the opportunity to more fully develop a discussion piece around a methodological issue in connection with the interpretation of language-learning data. The result is a set of seven thought-provoking contributions from researchers with diverse interests. Three main topics are addressed in these chapters: the role of native-speaker norms in second-language analyses, the impact of epistemological stance on experimental design and/or data interpretation, and the challenges of transcription and annotation of language-learning data, with a focus on data ambiguity. Authors expand on these crucial issues, reflect on best practices, and provide in many instances concrete examples of the impact they have on data interpretation.

Are all children exposed to the same linguistic input, and do they follow the same route in acquisition? The answer is no: The language that children hear differs even within a social class or cultural setting, as do the paths individual children take. The linguistic signal itself is also variable, both within and across speakers - the same sound is different across words; the same speech act can be realized with different constructions. The challenge here is to explain, given their diversity of experience, how children arrive at similar generalizations about their first language. This volume brings together studies of phonology, morphology, and syntax in development, to present a new perspective on how experience and variation shape children's linguistic generalizations. The papers deal with variation in forms, learning processes, and speaker features, and assess the impact of variation on the mechanisms and outcomes of language learning.

Interim Report of the Committee on Geographic Variation in Health Care Spending and Promotion of High-Value Health Care: Preliminary Committee Observations is designed to provide the committee's preliminary observations for the 113th Congress as it considers further Medicare reform. This report contains only key preliminary observations related primarily to the committee's commissioned analyses of Medicare Parts A (Hospital Insurance program), B (Supplementary Medical Insurance program) and D (outpatient prescription drug benefit), complemented by other empirical investigations. It does not contain any observations related to the committee's commissioned analyses of the commercial insurer population, Medicare Advantage, or Medicaid, which will be presented in the committee's final report after completion of quality-control activities. This interim report excludes conclusions or recommendations related to the committee's consideration of the geographic value index or other payment reforms designed to promote highvalue care. Additional analyses are forthcoming, which will influence the committee's deliberations. These analyses include an exploration of how Medicare Part C (Medicare Advantage) and commercial spending, utilization, and quality vary compared with, and possibly are influenced by, Medicare Parts A and B spending, utilization, and quality. The committee also is assessing potential biases that may be inherent to Medicare and commercial claims-based measures of health status. Based on this new evidence and continued review of the literature, the committee will confirm the accuracy of the observations presented in this interim report and develop final conclusions and recommendations, which will be published in the committee's final report.

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.