The Limits Of Resolution
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Author |
: Geoffrey de Villiers |
Publisher |
: CRC Press |
Total Pages |
: 569 |
Release |
: 2016-10-03 |
ISBN-10 |
: 9781498758123 |
ISBN-13 |
: 1498758126 |
Rating |
: 4/5 (23 Downloads) |
Synopsis The Limits of Resolution by : Geoffrey de Villiers
"This beautiful book can be read as a novel presenting carefully our quest to get more and more information from our observations and measurements. Its authors are particularly good at relating it." --Pierre C. Sabatier "This is a unique text - a labor of love pulling together for the first time the remarkably large array of mathematical and statistical techniques used for analysis of resolution in many systems of importance today – optical, acoustical, radar, etc.... I believe it will find widespread use and value." --Dr. Robert G.W. Brown, Chief Executive Officer, American Institute of Physics "The mix of physics and mathematics is a unique feature of this book which can be basic not only for PhD students but also for researchers in the area of computational imaging." --Mario Bertero, Professor, University of Geneva "a tour-de-force covering aspects of history, mathematical theory and practical applications. The authors provide a penetrating insight into the often confused topic of resolution and in doing offer a unifying approach to the subject that is applicable not only to traditional optical systems but also modern day, computer-based systems such as radar and RF communications." --Prof. Ian Proudler, Loughborough University "a ‘must have’ for anyone interested in imaging and the spatial resolution of images. This book provides detailed and very readable account of resolution in imaging and organizes the recent history of the subject in excellent fashion.... I strongly recommend it." --Michael A. Fiddy, Professor, University of North Carolina at Charlotte This book brings together the concept of resolution, which limits what we can determine about our physical world, with the theory of linear inverse problems, emphasizing practical applications. The book focuses on methods for solving illposed problems that do not have unique stable solutions. After introducing basic concepts, the contents address problems with "continuous" data in detail before turning to cases of discrete data sets. As one of the unifying principles of the text, the authors explain how non-uniqueness is a feature of measurement problems in science where precision and resolution is essentially always limited by some kind of noise.
Author |
: OpenStax |
Publisher |
: |
Total Pages |
: 622 |
Release |
: 2016-11-04 |
ISBN-10 |
: 1680920456 |
ISBN-13 |
: 9781680920451 |
Rating |
: 4/5 (56 Downloads) |
Synopsis University Physics by : OpenStax
University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.
Author |
: Barry R. Masters |
Publisher |
: SPIE Press |
Total Pages |
: 236 |
Release |
: 2006 |
ISBN-10 |
: 0819461180 |
ISBN-13 |
: 9780819461186 |
Rating |
: 4/5 (80 Downloads) |
Synopsis Confocal Microscopy and Multiphoton Excitation Microscopy by : Barry R. Masters
This text guides you through the principles and practical techniques of confocal and multiphoton microscopy. It also describes the historical connections and parallel inventions that resulted in modern techniques of live cell imaging and their use in biology and medicine. You will find comparisons of different types of confocal and multiphoton microscopes, solutions to the problems one would encounter when using various microscopic techniques, tips on selecting equipment, and an extensive annotated bibliography of additional resources.
Author |
: Anwar Ul-Hamid |
Publisher |
: Springer |
Total Pages |
: 422 |
Release |
: 2018-10-26 |
ISBN-10 |
: 9783319984827 |
ISBN-13 |
: 3319984829 |
Rating |
: 4/5 (27 Downloads) |
Synopsis A Beginners' Guide to Scanning Electron Microscopy by : Anwar Ul-Hamid
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author |
: Geoffrey de Villiers |
Publisher |
: CRC Press |
Total Pages |
: 573 |
Release |
: 2016-10-03 |
ISBN-10 |
: 9781315350806 |
ISBN-13 |
: 1315350807 |
Rating |
: 4/5 (06 Downloads) |
Synopsis The Limits of Resolution by : Geoffrey de Villiers
"This beautiful book can be read as a novel presenting carefully our quest to get more and more information from our observations and measurements. Its authors are particularly good at relating it." --Pierre C. Sabatier "This is a unique text - a labor of love pulling together for the first time the remarkably large array of mathematical and statistical techniques used for analysis of resolution in many systems of importance today – optical, acoustical, radar, etc.... I believe it will find widespread use and value." --Dr. Robert G.W. Brown, Chief Executive Officer, American Institute of Physics "The mix of physics and mathematics is a unique feature of this book which can be basic not only for PhD students but also for researchers in the area of computational imaging." --Mario Bertero, Professor, University of Geneva "a tour-de-force covering aspects of history, mathematical theory and practical applications. The authors provide a penetrating insight into the often confused topic of resolution and in doing offer a unifying approach to the subject that is applicable not only to traditional optical systems but also modern day, computer-based systems such as radar and RF communications." --Prof. Ian Proudler, Loughborough University "a ‘must have’ for anyone interested in imaging and the spatial resolution of images. This book provides detailed and very readable account of resolution in imaging and organizes the recent history of the subject in excellent fashion.... I strongly recommend it." --Michael A.? Fiddy, Professor, University of North Carolina at Charlotte This book brings together the concept of resolution, which limits what we can determine about our physical world, with the theory of linear inverse problems, emphasizing practical applications. The book focuses on methods for solving illposed problems that do not have unique stable solutions. After introducing basic concepts, the contents address problems with "continuous" data in detail before turning to cases of discrete data sets. As one of the unifying principles of the text, the authors explain how non-uniqueness is a feature of measurement problems in science where precision and resolution is essentially always limited by some kind of noise.
Author |
: Barry R. Masters |
Publisher |
: Springer |
Total Pages |
: 0 |
Release |
: 2021-08-26 |
ISBN-10 |
: 3030216934 |
ISBN-13 |
: 9783030216931 |
Rating |
: 4/5 (34 Downloads) |
Synopsis Superresolution Optical Microscopy by : Barry R. Masters
This book presents a comprehensive and coherent summary of techniques for enhancing the resolution and image contrast provided by far-field optical microscopes. It takes a critical look at the body of knowledge that comprises optical microscopy, compares and contrasts the various instruments, provides a clear discussion of the physical principles that underpin these techniques, and describes advances in science and medicine for which superresolution microscopes are required and are making major contributions. The text fills significant gaps that exist in other works on superresolution imaging, firstly by placing a new emphasis on the specimen, a critical component of the microscope setup, giving equal importance to the enhancement of both resolution and contrast. Secondly, it covers several topics not typically discussed in depth, such as Bessel and Airy beams, the physics of the spiral phase plate, vortex beams and singular optics, photoactivated localization microscopy (PALM), stochastic optical reconstruction microscopy (STORM), structured illumination microscopy (SIM), and light-sheet fluorescence microscopy (LSFM). Several variants of these techniques are critically discussed. Noise, optical aberrations, specimen damage, and artifacts in microscopy are also covered. The importance of validation of superresolution images with electron microscopy is stressed. Additionally, the book includes translations and discussion of seminal papers by Abbe and Helmholtz that proved to be pedagogically relevant as well as historically significant. This book is written for students, researchers, and engineers in the life sciences, medicine, biological engineering, and materials science who plan to work with or already are working with superresolution light microscopes. The volume can serve as a reference for these areas while a selected set of individual chapters can be used as a textbook for a one-semester undergraduate or first-year graduate course on superresolution microscopy. Moreover, the text provides a captivating account of curiosity, skepticism, risk-taking, innovation, and creativity in science and technology. Good scientific practice is emphasized throughout, and the author’s lecture slides on responsible conduct of research are included as an online resource which will be of interest to students, course instructors, and scientists alike.
Author |
: Max Born |
Publisher |
: Elsevier |
Total Pages |
: 871 |
Release |
: 2013-06-01 |
ISBN-10 |
: 9781483103204 |
ISBN-13 |
: 148310320X |
Rating |
: 4/5 (04 Downloads) |
Synopsis Principles of Optics by : Max Born
Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, Sixth Edition covers optical phenomenon that can be treated with Maxwell's phenomenological theory. The book is comprised of 14 chapters that discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals. The text covers the elements of the theories of interference, interferometers, and diffraction. The book tackles several behaviors of light, including its diffraction when exposed to ultrasonic waves. The selection will be most useful to researchers whose work involves understanding the behavior of light.
Author |
: Pernille Rieker |
Publisher |
: Routledge |
Total Pages |
: 246 |
Release |
: 2016-03-09 |
ISBN-10 |
: 9781317151456 |
ISBN-13 |
: 1317151453 |
Rating |
: 4/5 (56 Downloads) |
Synopsis Dialogue and Conflict Resolution by : Pernille Rieker
Dialogue is typically hailed as a progressive force fostering mutual understanding and resolving conflicts. Can it really carry such a burden? Does dialogue really resolve conflicts? In this unique volume international experts critically assess the political role of dialogue, addressing its potential and limitations. Bringing fascinating insights to bear they examine the theoretical underpinnings and conceptual boundaries of dialogue as a tool for conflict resolution. Major recent crises such as the Russo-Georgian war in 2008, the conflict between Western powers and Gaddafi’s Libya, arguments over Iran’s nuclear programme, religious tensions in Egypt after the Arab Spring, the Afghan case, the Sudanese experience and the recent Russo-Ukraine conflict are all considered and the conflict resolution attempts discussed. Using these cases the contributors explore in depth the nature of the dialogue between the actors, the extent to which it worked and what determined its impact.
Author |
: Josef F. Bille |
Publisher |
: Springer |
Total Pages |
: 411 |
Release |
: 2019-08-13 |
ISBN-10 |
: 9783030166380 |
ISBN-13 |
: 3030166384 |
Rating |
: 4/5 (80 Downloads) |
Synopsis High Resolution Imaging in Microscopy and Ophthalmology by : Josef F. Bille
This open access book provides a comprehensive overview of the application of the newest laser and microscope/ophthalmoscope technology in the field of high resolution imaging in microscopy and ophthalmology. Starting by describing High-Resolution 3D Light Microscopy with STED and RESOLFT, the book goes on to cover retinal and anterior segment imaging and image-guided treatment and also discusses the development of adaptive optics in vision science and ophthalmology. Using an interdisciplinary approach, the reader will learn about the latest developments and most up to date technology in the field and how these translate to a medical setting. High Resolution Imaging in Microscopy and Ophthalmology – New Frontiers in Biomedical Optics has been written by leading experts in the field and offers insights on engineering, biology, and medicine, thus being a valuable addition for scientists, engineers, and clinicians with technical and medical interest who would like to understand the equipment, the applications and the medical/biological background. Lastly, this book is dedicated to the memory of Dr. Gerhard Zinser, co-founder of Heidelberg Engineering GmbH, a scientist, a husband, a brother, a colleague, and a friend.
Author |
: Earl J. Kirkland |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 289 |
Release |
: 2010-08-12 |
ISBN-10 |
: 9781441965332 |
ISBN-13 |
: 1441965335 |
Rating |
: 4/5 (32 Downloads) |
Synopsis Advanced Computing in Electron Microscopy by : Earl J. Kirkland
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.