Techniques For The Control Of Integrated Circuit Quality And Reliability Volume Ii Appendices
Download Techniques For The Control Of Integrated Circuit Quality And Reliability Volume Ii Appendices full books in PDF, epub, and Kindle. Read online free Techniques For The Control Of Integrated Circuit Quality And Reliability Volume Ii Appendices ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads.
Author |
: Erwin A. Herr |
Publisher |
: |
Total Pages |
: 317 |
Release |
: 1967 |
ISBN-10 |
: OCLC:227622723 |
ISBN-13 |
: |
Rating |
: 4/5 (23 Downloads) |
Synopsis Techniques for the Control of Integrated Circuit Quality and Reliability Volume Ii - Appendices by : Erwin A. Herr
This is a program directed to establish techniques for the control of integrated circuit quality and reliability. The primary objective of this program was to investigate a method to monitor integrated circuit fabrication which would provide information about the quality and reliability of the device. The use of the test pattern concept, TEG, for in-process quality control and device reliability of integrated circuits was investigated during the fabrication and reliability testing phases of integrated circuit production. The Test Element Group (TEG), which was diffused on the wafer at the same time as the elements of the integrated circuit, proved to be a very successful vehicle for achieving the goals of this program. The TEG was made up of a number of selected elements in the integrated circuit diffusion pattern, metallized and connected for test evaluation as discrete components. The relationship was investigated between in-process variables of semiconductor fabrication, pre-stress characteristics of TEGS and integrated circuits and the post-stress characteristics of TEGS and integrated circuits.
Author |
: Defense Documentation Center (U.S.) |
Publisher |
: |
Total Pages |
: 784 |
Release |
: 1967 |
ISBN-10 |
: UCBK:C108806237 |
ISBN-13 |
: |
Rating |
: 4/5 (37 Downloads) |
Synopsis Technical Abstract Bulletin by : Defense Documentation Center (U.S.)
Author |
: |
Publisher |
: |
Total Pages |
: 888 |
Release |
: 1974 |
ISBN-10 |
: UOM:39015004478858 |
ISBN-13 |
: |
Rating |
: 4/5 (58 Downloads) |
Synopsis Microcircuit Reliability Bibliography by :
Author |
: Eugene R. Hnatek |
Publisher |
: |
Total Pages |
: 736 |
Release |
: 1987 |
ISBN-10 |
: UOM:39015011996652 |
ISBN-13 |
: |
Rating |
: 4/5 (52 Downloads) |
Synopsis Integrated Circuit Quality and Reliability by : Eugene R. Hnatek
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Author |
: |
Publisher |
: |
Total Pages |
: 772 |
Release |
: 1994 |
ISBN-10 |
: UIUC:30112067190006 |
ISBN-13 |
: |
Rating |
: 4/5 (06 Downloads) |
Synopsis Scientific and Technical Aerospace Reports by :
Author |
: United States. National Bureau of Standards. Technical Information and Publications Division |
Publisher |
: |
Total Pages |
: 804 |
Release |
: 1978 |
ISBN-10 |
: UOM:39015086578187 |
ISBN-13 |
: |
Rating |
: 4/5 (87 Downloads) |
Synopsis Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1 Citations and abstracts. v. 2. pt. 1. Key word index (A through L). v. 2. pt. 2. Key word index (M through Z) by : United States. National Bureau of Standards. Technical Information and Publications Division
Author |
: |
Publisher |
: |
Total Pages |
: 1740 |
Release |
: 1981 |
ISBN-10 |
: CUB:U183019899733 |
ISBN-13 |
: |
Rating |
: 4/5 (33 Downloads) |
Synopsis Energy Research Abstracts by :
Author |
: Alan Bimson |
Publisher |
: |
Total Pages |
: 20 |
Release |
: 1974 |
ISBN-10 |
: 0905066014 |
ISBN-13 |
: 9780905066011 |
Rating |
: 4/5 (14 Downloads) |
Synopsis Modern Techniques in Quality Control of Plastic Encapsulated Integrated Circuits for High Reliability Application by : Alan Bimson
Author |
: National Institute of Standards and Technology (U.S.) |
Publisher |
: |
Total Pages |
: 492 |
Release |
: 1982 |
ISBN-10 |
: UIUC:30112101564869 |
ISBN-13 |
: |
Rating |
: 4/5 (69 Downloads) |
Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Author |
: United States. National Bureau of Standards |
Publisher |
: |
Total Pages |
: 548 |
Release |
: 1975 |
ISBN-10 |
: UOM:39015079557115 |
ISBN-13 |
: |
Rating |
: 4/5 (15 Downloads) |
Synopsis Publications by : United States. National Bureau of Standards