This report summarizes the results accomplished during the funding period of this grant (June 1, 1995 to May 31, 1998). The projects are (1) room-temperature atomic force microscopy (AFM) studies of NbSe3 doped with various elements and (2) low-temperature scanning tunneling microscopy (STM) studies of NbSe3. In addition, AFM was used to study the surface morphology and defects of GaAs films grown on Ge and Ge/Si substracts.

This report discusses the following topics: charge-density waves in layer structures; charge-density waves in linear chain compounds; spectroscopy with the STM; STM studies of oxides; and development of atomic force microscopy. (LSP).

This report discusses the atomic force microscopy and correlation of charge-density-wave energy gaps and impurity pinning in NbSe3. (LSP).

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.