Surface and Interface Characterization of Thin Film Energy Devices

Surface and Interface Characterization of Thin Film Energy Devices
Author :
Publisher : Stanford University
Total Pages : 241
Release :
ISBN-10 : STANFORD:wv521py4936
ISBN-13 :
Rating : 4/5 (36 Downloads)

Synopsis Surface and Interface Characterization of Thin Film Energy Devices by : Wŏn-yong Yi

Thin film devices for energy conversion have become a vital area of research to achieve high performance with low cost. As the surface-to-volume ratio becomes significant, the fundamental physics of the surface and interface microstructures and the reaction mechanisms are important to developing such energy devices or processes. My Ph.D. research is thus focus on surface and interface characterization of energy materials for thin film devices with engineered components fabricated by novel technologies. The first part of this dissertation discusses how surface microstructures influence fuel cell performance. According to the high resolution characterization of surface grain boundaries in solid oxide ion conductors, oxygen vacancy segregation at grain boundaries was observed, indicating that the grain boundaries can be more active sites for oxygen incorporation into the electrolyte. This preferred surface reaction at grain boundaries was verified by AC impedance spectroscopy. In addition, using atomic force microscopy, the local rearrangement of charged species on the oxide surface was investigated as a function of time and temperature to quantitatively analyze the diffusivity of oxygen vacancies on the surface. The second part discusses investigation of quantum confined structures that was aimed at contributing to the development of new solar cell architectures. The electronic properties of quantum confined structures, fabricated by atomic layer deposition (ALD), were characterized by scanning tunneling microscopy. In particular, the band gap of lead sulfide quantum well was tuned as a function of well thickness and potential barrier height. In addition, various nano-patterning techniques were developed to fabricate higher-order quantum confined structures, including area-selective ALD.

Surfaces and Interfaces for Biomaterials

Surfaces and Interfaces for Biomaterials
Author :
Publisher : CRC Press
Total Pages : 834
Release :
ISBN-10 : 0849334462
ISBN-13 : 9780849334467
Rating : 4/5 (62 Downloads)

Synopsis Surfaces and Interfaces for Biomaterials by : Pankaj Vadgama

Given such problems as rejection, the interface between an implant and its human host is a critical area in biomaterials. Surfaces and Interfaces for Biomaterials summarizes the wealth of research on understanding the surface properties of biomaterials and the way they interact with human tissue. The first part of the book reviews the way biomaterial surfaces form. Part Two then discusses ways of monitoring and characterizing surface structure and behavior. The final two parts of the book look at a range of in vitro and in vivo studies of the complex interactions between biomaterials and the body. Chapters cover such topics as bone and tissue regeneration, the role of interface interactions in biodegradable biomaterials, microbial biofilm formation, vascular tissue engineering and ways of modifying biomaterial surfaces to improve biocompatibility. Surfaces and Interfaces for Biomaterials will be a standard work on how to understand and control surface processes in ensuring biomaterials are used successfully in medicine.

In Situ Real-Time Characterization of Thin Films

In Situ Real-Time Characterization of Thin Films
Author :
Publisher : John Wiley & Sons
Total Pages : 282
Release :
ISBN-10 : 0471241415
ISBN-13 : 9780471241416
Rating : 4/5 (15 Downloads)

Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello

An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application

Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells
Author :
Publisher : John Wiley & Sons
Total Pages : 760
Release :
ISBN-10 : 9783527699018
ISBN-13 : 3527699015
Rating : 4/5 (18 Downloads)

Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras

The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

The Materials Science of Thin Films

The Materials Science of Thin Films
Author :
Publisher : Academic Press
Total Pages : 744
Release :
ISBN-10 : 012524990X
ISBN-13 : 9780125249904
Rating : 4/5 (0X Downloads)

Synopsis The Materials Science of Thin Films by : Milton Ohring

Prepared as a textbook complete with problems after each chapter, specifically intended for classroom use in universities.

Thin Film Solar Cells

Thin Film Solar Cells
Author :
Publisher : John Wiley & Sons
Total Pages : 504
Release :
ISBN-10 : 9780470091265
ISBN-13 : 0470091266
Rating : 4/5 (65 Downloads)

Synopsis Thin Film Solar Cells by : Jef Poortmans

Thin-film solar cells are either emerging or about to emerge from the research laboratory to become commercially available devices finding practical various applications. Currently no textbook outlining the basic theoretical background, methods of fabrication and applications currently exist. Thus, this book aims to present for the first time an in-depth overview of this topic covering a broad range of thin-film solar cell technologies including both organic and inorganic materials, presented in a systematic fashion, by the scientific leaders in the respective domains. It covers a broad range of related topics, from physical principles to design, fabrication, characterization, and applications of novel photovoltaic devices.

Surface and Thin Film Analysis

Surface and Thin Film Analysis
Author :
Publisher : John Wiley & Sons
Total Pages : 514
Release :
ISBN-10 : 9783527636938
ISBN-13 : 3527636935
Rating : 4/5 (38 Downloads)

Synopsis Surface and Thin Film Analysis by : Gernot Friedbacher

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Solid Surfaces, Interfaces and Thin Films

Solid Surfaces, Interfaces and Thin Films
Author :
Publisher : Springer Science & Business Media
Total Pages : 566
Release :
ISBN-10 : 9783662043523
ISBN-13 : 3662043521
Rating : 4/5 (23 Downloads)

Synopsis Solid Surfaces, Interfaces and Thin Films by : Hans Lüth

This book emphasises both experimental and theoretical aspects of surface, interface and thin film physics. Compa- red to the earlier editions, which bore the title "Surfaces and Interfaces of Solid Materials", the book now places more emphasis on thin films, including also their superconducting and ferromagnetic properties. The present 4th edition thus presents techniques of preparing well-defined solid surfaces and interfaces, fundamental aspects of adsorption and layer growth, as well as basic models for the descripti- on of structural, vibronic and electronic properties of sur- faces, interfaces and thin films. Because of their importan- ce for modern information technology, significant attention is paid to the electronic properties of semiconductor inter- faces and heterostructures. Collective phenomena , such as superconductivity and ferromagnetism, also feature promi- nently. Experimental sections covering essential measurement and preparation techniques are presented in separate panels.

Handbook of Surface and Interface Analysis

Handbook of Surface and Interface Analysis
Author :
Publisher : CRC Press
Total Pages : 682
Release :
ISBN-10 : 9781420007800
ISBN-13 : 1420007807
Rating : 4/5 (00 Downloads)

Synopsis Handbook of Surface and Interface Analysis by : John C. Riviere

The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear

Introduction to Surface and Thin Film Processes

Introduction to Surface and Thin Film Processes
Author :
Publisher : Cambridge University Press
Total Pages : 392
Release :
ISBN-10 : 0521785006
ISBN-13 : 9780521785006
Rating : 4/5 (06 Downloads)

Synopsis Introduction to Surface and Thin Film Processes by : John Venables

This book covers the experimental and theoretical understanding of surface and thin film processes. It presents a unique description of surface processes in adsorption and crystal growth, including bonding in metals and semiconductors. Emphasis is placed on the strong link between science and technology in the description of, and research for, new devices based on thin film and surface science. Practical experimental design, sample preparation and analytical techniques are covered, including detailed discussions of Auger electron spectroscopy and microscopy. Thermodynamic and kinetic models of structure are emphasised throughout. The book provides extensive leads into practical and research literature, as well as resources on the World Wide Web (see http://venables.asu.edu/book). Each chapter contains problems which aim to develop awareness of the subject and the methods used. Aimed as a graduate textbook, this book will also be useful as a sourcebook for graduate students, researchers and practitioners in physics, chemistry, materials science and engineering.