Surface And Interface Characterization Of Thin Film Energy Devices
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Author |
: Wŏn-yong Yi |
Publisher |
: Stanford University |
Total Pages |
: 241 |
Release |
: 2010 |
ISBN-10 |
: STANFORD:wv521py4936 |
ISBN-13 |
: |
Rating |
: 4/5 (36 Downloads) |
Synopsis Surface and Interface Characterization of Thin Film Energy Devices by : Wŏn-yong Yi
Thin film devices for energy conversion have become a vital area of research to achieve high performance with low cost. As the surface-to-volume ratio becomes significant, the fundamental physics of the surface and interface microstructures and the reaction mechanisms are important to developing such energy devices or processes. My Ph.D. research is thus focus on surface and interface characterization of energy materials for thin film devices with engineered components fabricated by novel technologies. The first part of this dissertation discusses how surface microstructures influence fuel cell performance. According to the high resolution characterization of surface grain boundaries in solid oxide ion conductors, oxygen vacancy segregation at grain boundaries was observed, indicating that the grain boundaries can be more active sites for oxygen incorporation into the electrolyte. This preferred surface reaction at grain boundaries was verified by AC impedance spectroscopy. In addition, using atomic force microscopy, the local rearrangement of charged species on the oxide surface was investigated as a function of time and temperature to quantitatively analyze the diffusivity of oxygen vacancies on the surface. The second part discusses investigation of quantum confined structures that was aimed at contributing to the development of new solar cell architectures. The electronic properties of quantum confined structures, fabricated by atomic layer deposition (ALD), were characterized by scanning tunneling microscopy. In particular, the band gap of lead sulfide quantum well was tuned as a function of well thickness and potential barrier height. In addition, various nano-patterning techniques were developed to fabricate higher-order quantum confined structures, including area-selective ALD.
Author |
: Pankaj Vadgama |
Publisher |
: CRC Press |
Total Pages |
: 834 |
Release |
: 2005-06-14 |
ISBN-10 |
: 0849334462 |
ISBN-13 |
: 9780849334467 |
Rating |
: 4/5 (62 Downloads) |
Synopsis Surfaces and Interfaces for Biomaterials by : Pankaj Vadgama
Given such problems as rejection, the interface between an implant and its human host is a critical area in biomaterials. Surfaces and Interfaces for Biomaterials summarizes the wealth of research on understanding the surface properties of biomaterials and the way they interact with human tissue. The first part of the book reviews the way biomaterial surfaces form. Part Two then discusses ways of monitoring and characterizing surface structure and behavior. The final two parts of the book look at a range of in vitro and in vivo studies of the complex interactions between biomaterials and the body. Chapters cover such topics as bone and tissue regeneration, the role of interface interactions in biodegradable biomaterials, microbial biofilm formation, vascular tissue engineering and ways of modifying biomaterial surfaces to improve biocompatibility. Surfaces and Interfaces for Biomaterials will be a standard work on how to understand and control surface processes in ensuring biomaterials are used successfully in medicine.
Author |
: Orlando Auciello |
Publisher |
: John Wiley & Sons |
Total Pages |
: 282 |
Release |
: 2001 |
ISBN-10 |
: 0471241415 |
ISBN-13 |
: 9780471241416 |
Rating |
: 4/5 (15 Downloads) |
Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello
An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Author |
: Daniel Abou-Ras |
Publisher |
: John Wiley & Sons |
Total Pages |
: 760 |
Release |
: 2016-07-13 |
ISBN-10 |
: 9783527699018 |
ISBN-13 |
: 3527699015 |
Rating |
: 4/5 (18 Downloads) |
Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Author |
: Milton Ohring |
Publisher |
: Academic Press |
Total Pages |
: 744 |
Release |
: 1992 |
ISBN-10 |
: 012524990X |
ISBN-13 |
: 9780125249904 |
Rating |
: 4/5 (0X Downloads) |
Synopsis The Materials Science of Thin Films by : Milton Ohring
Prepared as a textbook complete with problems after each chapter, specifically intended for classroom use in universities.
Author |
: Jef Poortmans |
Publisher |
: John Wiley & Sons |
Total Pages |
: 504 |
Release |
: 2006-10-16 |
ISBN-10 |
: 9780470091265 |
ISBN-13 |
: 0470091266 |
Rating |
: 4/5 (65 Downloads) |
Synopsis Thin Film Solar Cells by : Jef Poortmans
Thin-film solar cells are either emerging or about to emerge from the research laboratory to become commercially available devices finding practical various applications. Currently no textbook outlining the basic theoretical background, methods of fabrication and applications currently exist. Thus, this book aims to present for the first time an in-depth overview of this topic covering a broad range of thin-film solar cell technologies including both organic and inorganic materials, presented in a systematic fashion, by the scientific leaders in the respective domains. It covers a broad range of related topics, from physical principles to design, fabrication, characterization, and applications of novel photovoltaic devices.
Author |
: Gernot Friedbacher |
Publisher |
: John Wiley & Sons |
Total Pages |
: 514 |
Release |
: 2011-03-31 |
ISBN-10 |
: 9783527636938 |
ISBN-13 |
: 3527636935 |
Rating |
: 4/5 (38 Downloads) |
Synopsis Surface and Thin Film Analysis by : Gernot Friedbacher
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Author |
: Hans Lüth |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 566 |
Release |
: 2013-04-17 |
ISBN-10 |
: 9783662043523 |
ISBN-13 |
: 3662043521 |
Rating |
: 4/5 (23 Downloads) |
Synopsis Solid Surfaces, Interfaces and Thin Films by : Hans Lüth
This book emphasises both experimental and theoretical aspects of surface, interface and thin film physics. Compa- red to the earlier editions, which bore the title "Surfaces and Interfaces of Solid Materials", the book now places more emphasis on thin films, including also their superconducting and ferromagnetic properties. The present 4th edition thus presents techniques of preparing well-defined solid surfaces and interfaces, fundamental aspects of adsorption and layer growth, as well as basic models for the descripti- on of structural, vibronic and electronic properties of sur- faces, interfaces and thin films. Because of their importan- ce for modern information technology, significant attention is paid to the electronic properties of semiconductor inter- faces and heterostructures. Collective phenomena , such as superconductivity and ferromagnetism, also feature promi- nently. Experimental sections covering essential measurement and preparation techniques are presented in separate panels.
Author |
: John C. Riviere |
Publisher |
: CRC Press |
Total Pages |
: 682 |
Release |
: 2009-06-24 |
ISBN-10 |
: 9781420007800 |
ISBN-13 |
: 1420007807 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Handbook of Surface and Interface Analysis by : John C. Riviere
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Author |
: John Venables |
Publisher |
: Cambridge University Press |
Total Pages |
: 392 |
Release |
: 2000-08-31 |
ISBN-10 |
: 0521785006 |
ISBN-13 |
: 9780521785006 |
Rating |
: 4/5 (06 Downloads) |
Synopsis Introduction to Surface and Thin Film Processes by : John Venables
This book covers the experimental and theoretical understanding of surface and thin film processes. It presents a unique description of surface processes in adsorption and crystal growth, including bonding in metals and semiconductors. Emphasis is placed on the strong link between science and technology in the description of, and research for, new devices based on thin film and surface science. Practical experimental design, sample preparation and analytical techniques are covered, including detailed discussions of Auger electron spectroscopy and microscopy. Thermodynamic and kinetic models of structure are emphasised throughout. The book provides extensive leads into practical and research literature, as well as resources on the World Wide Web (see http://venables.asu.edu/book). Each chapter contains problems which aim to develop awareness of the subject and the methods used. Aimed as a graduate textbook, this book will also be useful as a sourcebook for graduate students, researchers and practitioners in physics, chemistry, materials science and engineering.