The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.

This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.

Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

"Evaluating Measurement Accuracy" is intended for anyone who is concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: meteorologists, engineers and experimental scientists who use measurements as tools in their professions, graduate and undergraduate students in the natural sciences and engineering, and technicians performing complex measurements in industry, quality control, and trade. The material of the book is presented from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This inclusion is a notable and unique aspect of this title as complex measurements done in industry and trade are often neglected in metrological literature, leaving the practitioners of these measurements to devise their own ad-hoc techniques.

Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

“Evaluating Measurement Accuracy, 2nd Edition” is intended for those who are concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: scientists who advance the field of metrology, engineers and experimental scientists who use measurements as tool in their professions, students and graduate students in natural sciences and engineering, and, in parts describing practical recommendations, technicians performing mass measurements in industry, quality control, and trade. This book presents material from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This new edition adds a method for estimating accuracy of indirect measurements with independent arguments, whose development Dr. Rabinovich was able to complete very recently. This method, which is called the Method of Enumeration, produces estimates that are no longer approximate, similar to the way the method of reduction described in the first edition removed approximation in estimating uncertainty of indirect measurements with dependent arguments. The method of enumeration completes addressing the range of problems whose solutions signify the emergence of the new theory of accuracy of measurements. A new method is added for building a composition of histograms, and this method forms a theoretical basis for the method of enumeration.Additionally, as a companion to this book, a concise practical guide that assembles simple step-by-step procedures for typical tasks the practitioners are likely to encounter in measurement accuracy estimation is available at SpringerLink.

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing