Speckle Phenomena in Optics provides a comprehensive discussion of the statistical properties of speckle, as well as detailed coverage of its role in applications. Some of the applications discussed include speckle in astronomy, speckle in the eye, speckle in projection displays, speckle in coherence tomography, speckle in lithography, speckle in waveguides (modal noise), speckle in optical radar detection, and speckle in metrology. This book is aimed at graduate students and professionals working in a wide variety of fields.

With contributions by numerous experts

Laser Speckle and Applications in Optics focuses on developments in laser speckle techniques, with emphasis on the experimental aspect of phenomena and on applications in optics. These applications include interference with scattered light, optical processing of images, and studies of surface roughness as well as displacements and deformations of diffuse objects. This book is comprised of 10 chapters and begins by reviewing the elements of diffraction theory and the properties of speckle in the image of a diffuse object. The discussion then turns to speckle in the near field and interferometry with diffuse light, along with experiments in which interference patterns are produced from photographically superimposed laterally shifted speckle patterns. The following chapters consider optical processing of images modulated by speckle; deformations and displacements of diffuse objects; speckle applications in astronomy; and surface roughness measurements. The final chapter looks at the use of laser speckle to study transparent objects; the average shape of diffuse surfaces; the transfer functions and aberrations of optical systems; and the movement of diffuse objects. This monograph will be of value to physicists and researchers as well as those interested in lasers and optics.

This book discusses statistical methods that are useful for treating problems in modern optics, and the application of these methods to solving a variety of such problems This book covers a variety of statistical problems in optics, including both theory and applications. The text covers the necessary background in statistics, statistical properties of light waves of various types, the theory of partial coherence and its applications, imaging with partially coherent light, atmospheric degradations of images, and noise limitations in the detection of light. New topics have been introduced in the second edition, including: Analysis of the Vander Pol oscillator model of laser light Coverage on coherence tomography and coherence multiplexing of fiber sensors An expansion of the chapter on imaging with partially coherent light, including several new examples An expanded section on speckle and its properties New sections on the cross-spectrum and bispectrum techniques for obtaining images free from atmospheric distortions A new section on imaging through atmospheric turbulence using coherent light The addition of the effects of “read noise” to the discussions of limitations encountered in detecting very weak optical signals A number of new problems and many new references have been added Statistical Optics, Second Edition is written for researchers and engineering students interested in optics, physicists and chemists, as well as graduate level courses in a University Engineering or Physics Department.

Speckle study constitutes a multidisciplinary area with inherent complexities. In order to conquer challenges such as the variability of samples and sensitive measurements, researchers must develop a theoretical and statistical understanding of both biological and non-biological metrology using dynamic speckle laser. Dynamic Laser Speckle and Applications discusses the main methodologies used to analyze biospeckle phenomena with a strong focus on experimentation. After establishing a theoretical background in both speckle and biospeckle, the book presents the main methodologies for statistical and image analysis. It then deals with the concept of frequency decomposition before moving on to a discussion of fuzzy methods to treat dynamic speckle data. The book dedicates two sections to applications, including agricultural approaches. Additional features include photo images of experiments and software to aid in easy start-up of dynamic speckle usage. A systematic approach to new dynamic speckle laser phenomena, this book provides the physical theory and statistical background needed to analyze images formed by laser illumination in biological and non-biological samples.

The quantum statistical properties of radiation represent an important branch of modern physics with rapidly increasing applications in spectroscopy, quantum generators of radiation, optical communication, etc. They have also an increasing role in fields other than pure physics, such as biophysics, psychophysics, biology, etc. The present monograph represents an extension and continuation of the previous monograph of this author entitled Coherence of Light (Van Nostrand Reinhold Company, London 1972, translated into Russian in the Publishing House Mir, Moscow 1974) and of a review chapter in Progress in Optics, Vol. 18 (E. Wolf (Ed.), North-Holland Publishing Company, Amsterdam 1980), published just recently. It applies the fundamental tools of the coherent-state technique, as described in Coherence of Light, to particular studies of the quantum statistical properties of radiation in its interaction with matter. In particular, nonlinear optical processes are considered, and purely quantum phenomena such as antibunching of photons are discussed. This book will be useful to research workers in the fields of quantum optics and electronics, quantum generators, optical communication and solid-state physics, as well as to students of physics, optical engineering and opto-electronics.

Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.

Lithography is a field in which advances proceed at a swift pace. This book was written to address several needs, and the revisions for the second edition were made with those original objectives in mind. Many new topics have been included in this text commensurate with the progress that has taken place during the past few years, and several subjects are discussed in more detail. This book is intended to serve as an introduction to the science of microlithography for people who are unfamiliar with the subject. Topics directly related to the tools used to manufacture integrated circuits are addressed in depth, including such topics as overlay, the stages of exposure, tools, and light sources. This text also contains numerous references for students who want to investigate particular topics in more detail, and they provide the experienced lithographer with lists of references by topic as well. It is expected that the reader of this book will have a foundation in basic physics and chemistry. No topics will require knowledge of mathematics beyond elementary calculus.

Fundamentals of Photonics A complete, thoroughly updated, full-color third edition Fundamentals of Photonics, Third Edition is a self-contained and up-to-date introductory-level textbook that thoroughly surveys this rapidly expanding area of engineering and applied physics. Featuring a blend of theory and applications, coverage includes detailed accounts of the primary theories of light, including ray optics, wave optics, electromagnetic optics, and photon optics, as well as the interaction of light and matter. Presented at increasing levels of complexity, preliminary sections build toward more advanced topics, such as Fourier optics and holography, photonic-crystal optics, guided-wave and fiber optics, LEDs and lasers, acousto-optic and electro-optic devices, nonlinear optical devices, ultrafast optics, optical interconnects and switches, and optical fiber communications. The third edition features an entirely new chapter on the optics of metals and plasmonic devices. Each chapter contains highlighted equations, exercises, problems, summaries, and selected reading lists. Examples of real systems are included to emphasize the concepts governing applications of current interest. Each of the twenty-four chapters of the second edition has been thoroughly updated.