SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

This collection of papers offers the principles and practices of electronic speckle pattern interferometry (ESPI). It covers topics such as: parameters for design and optimization; measurment of static and dynamic surface displacements; pulsed lasers; and TV holography.

Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

In Indian context.

Holographic and speckle interferometry are optical techniques which use lasers to make non-contracting field view measurements at a sensitivity of the wavelength of light on optically rough (i.e. non-mirrored) surfaces. They may be used to measure static or dynamic displacements, the shape of objects, and refractive index variations of transparent media. As such, these techniques have been applied to the solution of a wide range of problems in strain and vibrational analysis, non-destructive testing (NDT), component inspection and design analysis and fluid flow visualisation. This book provides a self-contained, unified, theoretical analysis of the basic principles and associated opto-electronic techniques (for example Electronic Speckle Pattern Interferometry). In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. In this new edition, the authors have taken the opportunity to include a much more coherent description of more than twenty individual case studies that are representative of the main uses to which the techniques are put. The Bibliography has also been brought up to date.

The Proceedings contain state-of-the-art reviews and original materials related to up-to-date developments in a wide range of optical control methods. They are devoted in particular to shape, displacement and deformation measurement, strain analysis, mechanical behavior evaluation, inspection and non-destructive testing. Three principal classes of methods are under consideration: speckle photography, holographic interferometry and speckle interferometry. Both the state-of-the-art practices and the actual leading-edge techniques are discussed within a single volume, with reference to theoretical backgrounds common to all methods. Usually, similar information is distributed over many specialised works. The book presents both conceptual and practical aspects: theoretical considerations are fully analysed and applications illustrate the emphasis on many experimental aspects.

SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.