This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Ever since television became practical in the early 1950s, closed-circuit television (CCTV) in conjunction with the light microscope has provided large screen display, raised image contrast, and made the images formed by ultraviolet and infrared rays visible. With the introduction of large-scale integrated circuits in the last decade, TV equipment has improved by leaps and bounds, as has its application in microscopy. With modem CCTV, sometimes with the help of digital computers, we can distill the image from a scene that appears to be nothing but noise; capture fluorescence too dim to be seen; visualize structures far below the limit of resolution; crispen images hidden in fog; measure, count, and sort objects; and record in time-lapsed and high-speed sequences through the light microscope without great difficulty. In fact, video is becoming indispensable for harnessing the fullest capacity of the light microscope, a capacity that itself is much greater than could have been envisioned just a few years ago. The time seemed ripe then to review the basics of video, and of microscopy, and to examine how the two could best be combined to accomplish these tasks. The Marine Biological Laboratory short courses on Analytical and Quantitative Light Microscopy in Biology, Medicine, and the Materials Sciences, and the many inquiries I received on video microscopy, supported such an effort, and Kirk Jensen of Plenum Press persuaded me of its worth.

This is a brief history of the development of microscopy, from the use of beads and water droplets in ancient Greece, through the simple magnifying glass, to the modern compound microscope. The technology and optical theory are developed in a straightforward manner, and this leads to a description and explanation of the most modern technologies in electron microscopy, and scanning electron microscopy as well as the new scanning probe microscopies. A series of very interesting applications of the various microscopic techniques are described. The most recent pioneering techniques in near field and confocal optical microscope technologies are described and evaluated for their future importance.

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Microscopy, which has served as a fundamental scientific technique for centuries, remains an invaluable tool in chemistry, biology, healthcare, and forensics. Increasingly, it is being integrated into modern chemical instrumentation and is of value as a powerful analytical tool across many scientific disciplines. Designed to serve as a primary reso

This comprehensive reference work provides an overview of, and practical guide to, the various computer-aided microscopical techniques used in materials science today. After introducing the reader to the basic concepts of optics, the interactions between light and matter, and image processing, the book goes on to discuss in depth both 2D reflection microscopy and confocal laser scanning microscopy. The application of these techniques to the characterisation of materials is abundantly illustrated by hundreds of photographs and illustrations, and through specific case studies. There is also discussion of other modern optical imaging techniques and of non-optical ones such as x-ray micrography. This reference text is essential both for beginners looking for an introduction to the subject as well as advanced materials researchers in the fields where optical microscopy is used. - Major reference work on the application of microscopy techniques to materials science research - Includes over 420 photographs and illustrations - Provides detailed coverage of the major light microscopical techniques including optical reflection microscopy and confocal laser scanning microscopy as well as novel techniques such raman microscopy, tomography and microtomography

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.