Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

The subject of this volume in the Astrophysics and Space Science Library is Electro magnetic Radiation in Space. It is essentially based on the lectures given at the third ESRO Summer School which was held from 19 July to 13 August, 1965, in Alpbach, Austria. Fifty-eight selected students attended the courses representing the following countries: Austria (2), Belgium (1), Denmark (1), France (12), Germany (10), Italy (7), Netherlands (2), Spain (4), Sweden (6), Switzerland (3), United Kingdom (9), United States (1). Thirteen lectures courses and nine seminars were given by sixteen different scientists in total. In this book the courses and seminars have been classified in three parts according to the kind of radiation which they mainly deal with: Ultraviolet Radiation, X Radiation and Cosmic Radiation. These parts can be broken down further in theo retical and observational aspects, whereas in the first and second part solar as well as stellar ultraviolet- and X-radiation can be distinguished. * Due to various reasons the publication of this volume had to be delayed; it was therefore judged appropriate to bring the text up to date. The various lecturers have been asked to revise the manuscripts and to eventually add new information which has been acquired in this rapidly evolving field of space astrophysics. Most authors have responded positively to this request, some even have completely rewritten the manuscript.

As part of the Vision for Space Exploration (VSE), NASA is planning for humans to revisit the Moon and someday go to Mars. An important consideration in this effort is protection against the exposure to space radiation. That radiation might result in severe long-term health consequences for astronauts on such missions if they are not adequately shielded. To help with these concerns, NASA asked the NRC to further the understanding of the risks of space radiation, to evaluate radiation shielding requirements, and recommend a strategic plan for developing appropriate mitigation capabilities. This book presents an assessment of current knowledge of the radiation environment; an examination of the effects of radiation on biological systems and mission equipment; an analysis of current plans for radiation protection; and a strategy for mitigating the risks to VSE astronauts.

A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.