Reconstruction From Spatio Spectrally Coded Multispectral Light Fields
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Author |
: Schambach, Maximilian |
Publisher |
: KIT Scientific Publishing |
Total Pages |
: 238 |
Release |
: 2022-10-17 |
ISBN-10 |
: 9783731512103 |
ISBN-13 |
: 3731512106 |
Rating |
: 4/5 (03 Downloads) |
Synopsis Reconstruction from Spatio-Spectrally Coded Multispectral Light Fields by : Schambach, Maximilian
In dieser Arbeit werden spektral kodierte multispektrale Lichtfelder untersucht, wie sie von einer Lichtfeldkamera mit einem spektral kodierten Mikrolinsenarray aufgenommen werden. Für die Rekonstruktion der kodierten Lichtfelder werden zwei Methoden entwickelt, eine basierend auf den Prinzipien des Compressed Sensing sowie eine Deep Learning Methode. Anhand neuartiger synthetischer und realer Datensätze werden die vorgeschlagenen Rekonstruktionsansätze im Detail evaluiert. -In this work, spatio-spectrally coded multispectral light fields, as taken by a light field camera with a spectrally coded microlens array, are investigated. For the reconstruction of the coded light fields, two methods, one based on the principles of compressed sensing and one deep learning approach, are developed. Using novel synthetic as well as a real-world datasets, the proposed reconstruction approaches are evaluated in detail.
Author |
: Uhlig, David |
Publisher |
: KIT Scientific Publishing |
Total Pages |
: 284 |
Release |
: 2023-07-14 |
ISBN-10 |
: 9783731513063 |
ISBN-13 |
: 3731513064 |
Rating |
: 4/5 (63 Downloads) |
Synopsis Light Field Imaging for Deflectometry by : Uhlig, David
Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.
Author |
: Hartung, Julia |
Publisher |
: KIT Scientific Publishing |
Total Pages |
: 258 |
Release |
: 2024-03-08 |
ISBN-10 |
: 9783731513339 |
ISBN-13 |
: 3731513331 |
Rating |
: 4/5 (39 Downloads) |
Synopsis Machine Learning for Camera-Based Monitoring of Laser Welding Processes by : Hartung, Julia
The increasing use of automated laser welding processes causes high demands on process monitoring. This work demonstrates methods that use a camera mounted on the focussing optics to perform pre-, in-, and post-process monitoring of welding processes. The implementation uses machine learning methods. All algorithms consider the integration into industrial processes. These challenges include a small database, limited industrial manufacturing inference hardware, and user acceptance.
Author |
: Li, Lanxiao |
Publisher |
: KIT Scientific Publishing |
Total Pages |
: 256 |
Release |
: 2024-05-13 |
ISBN-10 |
: 9783731513469 |
ISBN-13 |
: 3731513463 |
Rating |
: 4/5 (69 Downloads) |
Synopsis Computational, label, and data efficiency in deep learning for sparse 3D data by : Li, Lanxiao
Deep learning is widely applied to sparse 3D data to perform challenging tasks, e.g., 3D object detection and semantic segmentation. However, the high performance of deep learning comes with high costs, including computational costs and the effort to capture and label data. This work investigates and improves the efficiency of deep learning for sparse 3D data to overcome the obstacles to the further development of this technology.
Author |
: Bächle, Matthias |
Publisher |
: KIT Scientific Publishing |
Total Pages |
: 218 |
Release |
: 2023-01-09 |
ISBN-10 |
: 9783731512523 |
ISBN-13 |
: 3731512521 |
Rating |
: 4/5 (23 Downloads) |
Synopsis Model-based Filtering of Interfering Signals in Ultrasonic Time Delay Estimations by : Bächle, Matthias
This work presents model-based algorithmic approaches for interference-invariant time delay estimation, which are specifically suited for the estimation of small time delay differences with a necessary resolution well below the sampling time. Therefore, the methods can be applied particularly well for transit-time ultrasonic flow measurements, since the problem of interfering signals is especially prominent in this application.
Author |
: Alan C. Eckbreth |
Publisher |
: CRC Press |
Total Pages |
: 636 |
Release |
: 1996-10-10 |
ISBN-10 |
: 9056995324 |
ISBN-13 |
: 9789056995324 |
Rating |
: 4/5 (24 Downloads) |
Synopsis Laser Diagnostics for Combustion Temperature and Species by : Alan C. Eckbreth
Focusing on spectroscopically-based, spatially-precise, laser techniques for temperature and chemical composition measurements in reacting and non-reacting flows, this book makes these powerful and important new tools in combustion research
Author |
: |
Publisher |
: |
Total Pages |
: 500 |
Release |
: 2000 |
ISBN-10 |
: UCSD:31822022801930 |
ISBN-13 |
: |
Rating |
: 4/5 (30 Downloads) |
Synopsis Optics Letters by :
Author |
: Saurabh Prasad |
Publisher |
: Springer Nature |
Total Pages |
: 464 |
Release |
: 2020-04-27 |
ISBN-10 |
: 9783030386177 |
ISBN-13 |
: 3030386171 |
Rating |
: 4/5 (77 Downloads) |
Synopsis Hyperspectral Image Analysis by : Saurabh Prasad
This book reviews the state of the art in algorithmic approaches addressing the practical challenges that arise with hyperspectral image analysis tasks, with a focus on emerging trends in machine learning and image processing/understanding. It presents advances in deep learning, multiple instance learning, sparse representation based learning, low-dimensional manifold models, anomalous change detection, target recognition, sensor fusion and super-resolution for robust multispectral and hyperspectral image understanding. It presents research from leading international experts who have made foundational contributions in these areas. The book covers a diverse array of applications of multispectral/hyperspectral imagery in the context of these algorithms, including remote sensing, face recognition and biomedicine. This book would be particularly beneficial to graduate students and researchers who are taking advanced courses in (or are working in) the areas of image analysis, machine learning and remote sensing with multi-channel optical imagery. Researchers and professionals in academia and industry working in areas such as electrical engineering, civil and environmental engineering, geosciences and biomedical image processing, who work with multi-channel optical data will find this book useful.
Author |
: Michael Ying Yang |
Publisher |
: Academic Press |
Total Pages |
: 424 |
Release |
: 2019-07-16 |
ISBN-10 |
: 9780128173596 |
ISBN-13 |
: 0128173599 |
Rating |
: 4/5 (96 Downloads) |
Synopsis Multimodal Scene Understanding by : Michael Ying Yang
Multimodal Scene Understanding: Algorithms, Applications and Deep Learning presents recent advances in multi-modal computing, with a focus on computer vision and photogrammetry. It provides the latest algorithms and applications that involve combining multiple sources of information and describes the role and approaches of multi-sensory data and multi-modal deep learning. The book is ideal for researchers from the fields of computer vision, remote sensing, robotics, and photogrammetry, thus helping foster interdisciplinary interaction and collaboration between these realms. Researchers collecting and analyzing multi-sensory data collections – for example, KITTI benchmark (stereo+laser) - from different platforms, such as autonomous vehicles, surveillance cameras, UAVs, planes and satellites will find this book to be very useful. - Contains state-of-the-art developments on multi-modal computing - Shines a focus on algorithms and applications - Presents novel deep learning topics on multi-sensor fusion and multi-modal deep learning
Author |
: Institute of Electrical and Electronics Engineers |
Publisher |
: |
Total Pages |
: 1260 |
Release |
: 1996 |
ISBN-10 |
: UOM:39015047338994 |
ISBN-13 |
: |
Rating |
: 4/5 (94 Downloads) |
Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers
Issues for 1973- cover the entire IEEE technical literature.