Recent Developments In Atomic Force Microscopy And Raman Spectroscopy For Materials Characterization
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Author |
: Chandra Shakher Pathak |
Publisher |
: BoD – Books on Demand |
Total Pages |
: 275 |
Release |
: 2022-01-07 |
ISBN-10 |
: 9781839682292 |
ISBN-13 |
: 1839682299 |
Rating |
: 4/5 (92 Downloads) |
Synopsis Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization by : Chandra Shakher Pathak
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Author |
: Ch Sateesh Kumar |
Publisher |
: CRC Press |
Total Pages |
: 145 |
Release |
: 2023-05-04 |
ISBN-10 |
: 9781000872293 |
ISBN-13 |
: 1000872297 |
Rating |
: 4/5 (93 Downloads) |
Synopsis Advanced Materials Characterization by : Ch Sateesh Kumar
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
Author |
: Tomasz Tański |
Publisher |
: BoD – Books on Demand |
Total Pages |
: 116 |
Release |
: 2019-01-30 |
ISBN-10 |
: 9781789851694 |
ISBN-13 |
: 1789851696 |
Rating |
: 4/5 (94 Downloads) |
Synopsis Atomic-force Microscopy and Its Applications by : Tomasz Tański
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
Author |
: Jian Zhong |
Publisher |
: Academic Press |
Total Pages |
: 385 |
Release |
: 2022-09-29 |
ISBN-10 |
: 9780128241325 |
ISBN-13 |
: 0128241322 |
Rating |
: 4/5 (25 Downloads) |
Synopsis Fundamentals and Application of Atomic Force Microscopy for Food Research by : Jian Zhong
Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. - Describes the application of AFM for food research - Covers applications of AFM for different types of food substances - Addresses future uses and perspectives of AFM for the development of food nanotechnology
Author |
: Ahmed Touhami |
Publisher |
: Morgan & Claypool Publishers |
Total Pages |
: 113 |
Release |
: 2020-05-11 |
ISBN-10 |
: 9781681738376 |
ISBN-13 |
: 1681738376 |
Rating |
: 4/5 (76 Downloads) |
Synopsis Atomic Force Microscopy by : Ahmed Touhami
Over the last two decades, Atomic Force Microscopy (AFM) has undoubtedly had a considerable impact in unraveling the structures and dynamics of microbial surfaces with nanometer resolution, and under physiological conditions. Moreover, the continuous innovations in AFM-based modalities as well as the combination of AFM with modern optical techniques, such as confocal fluorescence microscopy or Raman spectroscopy, increased the diversity and volume of data that can be acquired in an experiment. It is evident that these combinations provide new ways to investigate a broad spectrum of microbiological processes at the level of single cells. In this book, I have endeavored to highlight the wealth of AFM-based modalities that have been implemented over the recent years leading to the multiparametric and multifunctional characterization of, specifically, bacterial surfaces. Examples include the real-time imaging of the nanoscale organization of cell walls, the quantification of subcellular chemical heterogeneities, the mapping and functional analysis of individual cell wall constituents, and the probing of the nanomechanical properties of living bacteria. It is expected that in the near future more AFM-based modalities and complementary techniques will be combined into single experiments to address pertinent problems and challenges in microbial research. Such improvements may make it possible to address the dynamic nature of many more microbial cell surfaces and their constituents, including the restructuring of cellular membranes, pores and transporters, signaling of cell membrane receptors, and formation of cell-adhesion complexes. Ultimately, manifold discoveries and engineering possibilities will materialize as multiparametric tools allow systems of increasing complexity to be probed and manipulated.
Author |
: Kaushik Kumar |
Publisher |
: Walter de Gruyter GmbH & Co KG |
Total Pages |
: 270 |
Release |
: 2023-11-20 |
ISBN-10 |
: 9783110997590 |
ISBN-13 |
: 3110997592 |
Rating |
: 4/5 (90 Downloads) |
Synopsis Engineering Materials Characterization by : Kaushik Kumar
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.
Author |
: Henry H. Radamson |
Publisher |
: Springer Nature |
Total Pages |
: 291 |
Release |
: 2023-08-10 |
ISBN-10 |
: 9783031264344 |
ISBN-13 |
: 3031264347 |
Rating |
: 4/5 (44 Downloads) |
Synopsis Analytical Methods and Instruments for Micro- and Nanomaterials by : Henry H. Radamson
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
Author |
: Akira Otsuki |
Publisher |
: Elsevier |
Total Pages |
: 842 |
Release |
: 2023-09-01 |
ISBN-10 |
: 9780323984782 |
ISBN-13 |
: 0323984789 |
Rating |
: 4/5 (82 Downloads) |
Synopsis Non-Destructive Material Characterization Methods by : Akira Otsuki
Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments. From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis. - Provides an overview of a wide-range of NDT material characterization methods, strengths and weaknesses of these methods, when to apply them, and more - Includes eddy current sensing and imaging, ultrasonic sensing and imaging, RF and THz imaging, internet and cloud-based methods, among many others - Presents case studies, applications and other insights on putting these methods into practice
Author |
: R.W. Cahn |
Publisher |
: Elsevier |
Total Pages |
: 670 |
Release |
: 2016-01-22 |
ISBN-10 |
: 9781483287515 |
ISBN-13 |
: 1483287513 |
Rating |
: 4/5 (15 Downloads) |
Synopsis Concise Encyclopedia of Materials Characterization by : R.W. Cahn
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
Author |
: Ji-Xin Cheng |
Publisher |
: Elsevier |
Total Pages |
: 612 |
Release |
: 2021-12-04 |
ISBN-10 |
: 9780323903370 |
ISBN-13 |
: 0323903371 |
Rating |
: 4/5 (70 Downloads) |
Synopsis Stimulated Raman Scattering Microscopy by : Ji-Xin Cheng
Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. - Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy - Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics - Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics