This one-of-a-kind book presents many of the mathematical concepts, structures, and techniques used in the study of rays, waves, and scattering. Panoramic in scope, it includes discussions of how ocean waves are refracted around islands and underwater ridges, how seismic waves are refracted in the earth's interior, how atmospheric waves are scattered by mountains and ridges, how the scattering of light waves produces the blue sky, and meteorological phenomena such as rainbows and coronas. Rays, Waves, and Scattering is a valuable resource for practitioners, graduate students, and advanced undergraduates in applied mathematics, theoretical physics, and engineering. Bridging the gap between advanced treatments of the subject written for specialists and less mathematical books aimed at beginners, this unique mathematical compendium features problems and exercises throughout that are geared to various levels of sophistication, covering everything from Ptolemy's theorem to Airy integrals (as well as more technical material), and several informative appendixes. Provides a panoramic look at wave motion in many different contexts Features problems and exercises throughout Includes numerous appendixes, some on topics not often covered An ideal reference book for practitioners Can also serve as a supplemental text in classical applied mathematics, particularly wave theory and mathematical methods in physics and engineering Accessible to anyone with a strong background in ordinary differential equations, partial differential equations, and functions of a complex variable

A systematic and accessible treatment of light scattering and transport in disordered media from first principles.

Electromagnetic Scattering is a collection of studies that aims to discuss methods, state of the art, applications, and future research in electromagnetic scattering. The book covers topics related to the subject, which includes low-frequency electromagnetic scattering; the uniform asymptomatic theory of electromagnetic edge diffraction; analyses of problems involving high frequency diffraction and imperfect half planes; and multiple scattering of waves by periodic and random distribution. Also covered in this book are topics such as theories of scattering from wire grid and mesh structures; the electromagnetic inverse problem; computational methods for transmission of waves; and developments in the use of complex singularities in the electromagnetic theory. Engineers and physicists who are interested in the study, developments, and applications of electromagnetic scattering will find the text informative and helpful.

This volume outlines the fundamentals and applications of light scattering, absorption and polarization processes involving ice crystals.

A comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. The monograph discusses various sources, including free electron lasers, synchrotron radiation and other portable and non-portable X-ray sources. For scientists using synchrotron radiation or students and scientists with a background in X-ray scattering methods in general.

A rigorous self-contained exposition of the mathematical theory for wave propagation and general ray theory in layered viscoelastic media.

University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.