Proceedings Of The Third International Symposium On Defects In Silicon
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Author |
: Takao Abe |
Publisher |
: The Electrochemical Society |
Total Pages |
: 548 |
Release |
: 1999 |
ISBN-10 |
: 1566772230 |
ISBN-13 |
: 9781566772235 |
Rating |
: 4/5 (30 Downloads) |
Synopsis Proceedings of the Third International Symposium on Defects in Silicon by : Takao Abe
Author |
: Peter J. Hesketh |
Publisher |
: The Electrochemical Society |
Total Pages |
: 234 |
Release |
: 1997 |
ISBN-10 |
: 1566771323 |
ISBN-13 |
: 9781566771320 |
Rating |
: 4/5 (23 Downloads) |
Synopsis Proceedings of the Third International Symposium on Microstructures and Microfabricated Systems by : Peter J. Hesketh
Author |
: John P. Dismukes |
Publisher |
: The Electrochemical Society |
Total Pages |
: 1126 |
Release |
: 1993 |
ISBN-10 |
: 1566770602 |
ISBN-13 |
: 9781566770606 |
Rating |
: 4/5 (02 Downloads) |
Synopsis Proceedings of the Third International Symposium on Diamond Materials by : John P. Dismukes
Author |
: C. E. Hunt |
Publisher |
: |
Total Pages |
: 628 |
Release |
: 1995 |
ISBN-10 |
: 1566771013 |
ISBN-13 |
: 9781566771016 |
Rating |
: 4/5 (13 Downloads) |
Synopsis Proceedings of the Third International Symposium on Semiconductor Wafer Bonding by : C. E. Hunt
Author |
: W. Murray Bullis |
Publisher |
: |
Total Pages |
: 716 |
Release |
: 1991 |
ISBN-10 |
: UCAL:B4428174 |
ISBN-13 |
: |
Rating |
: 4/5 (74 Downloads) |
Synopsis Proceedings of the Second Symposium on Defects in Silicon by : W. Murray Bullis
Author |
: Robert B. Comizzoli |
Publisher |
: The Electrochemical Society |
Total Pages |
: 436 |
Release |
: 1994 |
ISBN-10 |
: 1566770882 |
ISBN-13 |
: 9781566770880 |
Rating |
: 4/5 (82 Downloads) |
Synopsis Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices by : Robert B. Comizzoli
Author |
: WM Bullis (ed) |
Publisher |
: |
Total Pages |
: |
Release |
: 1983 |
ISBN-10 |
: OCLC:985777416 |
ISBN-13 |
: |
Rating |
: 4/5 (16 Downloads) |
Synopsis Proceedings of the Symposium on Defects in Silicon (Volume 83/9). by : WM Bullis (ed)
Author |
: Niroj Maharjan |
Publisher |
: Springer Nature |
Total Pages |
: 418 |
Release |
: |
ISBN-10 |
: 9789819986439 |
ISBN-13 |
: 9819986435 |
Rating |
: 4/5 (39 Downloads) |
Synopsis Proceedings of the 3rd International Conference on Advanced Surface Enhancement (INCASE) 2023 by : Niroj Maharjan
Author |
: W. Murray Bullis |
Publisher |
: |
Total Pages |
: 648 |
Release |
: 1983 |
ISBN-10 |
: OCLC:312531570 |
ISBN-13 |
: |
Rating |
: 4/5 (70 Downloads) |
Synopsis Defects in Silicon by : W. Murray Bullis
Author |
: Howard R. Huff |
Publisher |
: |
Total Pages |
: 1170 |
Release |
: 1977 |
ISBN-10 |
: CORNELL:31924004734145 |
ISBN-13 |
: |
Rating |
: 4/5 (45 Downloads) |
Synopsis Semiconductor Silicon 1977 by : Howard R. Huff