This book provides insight into the underlying basic theories and concepts in X-ray, light, and neutron scattering. The three scattering principles are systematically presented, together with a unified description based on elastic scattering of electromagnetic waves and the Schrödinger wave from matter. These explanations are presented with an introduction of their common Born approximation using a consistent set of symbols and terminology and with step-by-step derivations of equations. This book emphasizes the combined applications of these three scattering methods, wherever and whenever possible, as a very powerful methodology for characterization of internal structures of soft matters in the length scale ranging from subnanometers to a few 10 micron meters. These applications include explorations for evolution of hierarchically self-organized internal structures of a variety of soft matters, including cells, under diverse environmental conditions. This book will not only be an excellent resource for graduate students and academic researchers who analyze structures of soft matters and polymers, but it will also be useful for researchers in industries.

Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.

The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

This book provides insight into the underlying basic theories and concepts in X-ray, light, and neutron scattering. The three scattering principles are systematically presented, together with a unified description based on elastic scattering of electromagnetic waves and the Schrödinger wave from matter. These explanations are presented with an introduction of their common Born approximation using a consistent set of symbols and terminology and with step-by-step derivations of equations. This book emphasizes the combined applications of these three scattering methods, wherever and whenever possible, as a very powerful methodology for characterization of internal structures of soft matters in the length scale ranging from subnanometers to a few 10 micron meters. These applications include explorations for evolution of hierarchically self-organized internal structures of a variety of soft matters, including cells, under diverse environmental conditions. This book will not only be an excellent resource for graduate students and academic researchers who analyze structures of soft matters and polymers, but it will also be useful for researchers in industries.

This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.

This book is devoted to a simple practical approach to neutron, X-ray and light scattering experiments, involving model calculation of the scattering and mathematical transformation. It is intended to attract colloid and polymer scientists using scattering methods in their laboratory or at common research facilities. The primary objective is to explain the current methodology of elastic and quasi-elastic scattering techniques (avoiding both under and over-exploitation of data) rather than a general course on colloids and polymers. Basic information on data interpretation, on the complementarity of the different types of radiation, as well as information on recent applications and developments are presented.

Scattering Methods and their Application in Colloid and Interface Science offers an overview of small-angle X-ray and neutron scattering techniques (SAXS & SANS), as well as static and dynamic light scattering (SLS & DLS). These scattering techniques are central to the study of soft matter, such as colloidal dispersions and surfactant self-assembly. The theoretical concepts are followed by an overview of instrumentation and a detailed description of the evaluation techniques in the first part of the book. In the second part, several typical application examples are used to show the strength and limitations of these techniques. - Features the latest input from the world-leading expert with personal experience in all the fields covered (SAXS, SANS, SLS and DLS) - Includes unified notation throughout the book to enhance its readability - Provides—in a single source—scattering theory, evaluation of techniques and a variety of applications

A comprehensive and up to date survey of the science and technology of polymeric dispersions. The book discusses the kinetics and mechanisms of polymerization in dispersed media, examines the processes controlling particle morphology, presents both off-line and on-line methods for the characterization of polymer colloids, considers reactor engineering and control, and covers a wide variety of applications, such as latex paint formulations, encapsulation of inorganic particles, reactive latexes, adhesives, paper coating, and biomedical and pharmaceutical applications. Audience: A valuable resource for scientists and engineers, academic and industrial, who are involved in the manufacture or application of polymeric dispersions.

Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.