Practical Analytical Electron Microscopy In Materials Science
Download Practical Analytical Electron Microscopy In Materials Science full books in PDF, epub, and Kindle. Read online free Practical Analytical Electron Microscopy In Materials Science ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads.
Author |
: David Bernard Williams |
Publisher |
: Electron Optics Publishing Group |
Total Pages |
: 170 |
Release |
: 1984 |
ISBN-10 |
: PSU:000025024623 |
ISBN-13 |
: |
Rating |
: 4/5 (23 Downloads) |
Synopsis Practical Analytical Electron Microscopy in Materials Science by : David Bernard Williams
Author |
: DAISUKE Shindo |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 162 |
Release |
: 2013-04-17 |
ISBN-10 |
: 9784431669883 |
ISBN-13 |
: 4431669884 |
Rating |
: 4/5 (83 Downloads) |
Synopsis Analytical Electron Microscopy for Materials Science by : DAISUKE Shindo
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
Author |
: Brent Fultz |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 775 |
Release |
: 2012-10-14 |
ISBN-10 |
: 9783642297601 |
ISBN-13 |
: 3642297609 |
Rating |
: 4/5 (01 Downloads) |
Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author |
: Joseph Goldstein |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 458 |
Release |
: 2013-11-11 |
ISBN-10 |
: 9781489920379 |
ISBN-13 |
: 1489920374 |
Rating |
: 4/5 (79 Downloads) |
Synopsis Principles of Analytical Electron Microscopy by : Joseph Goldstein
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Author |
: Joseph Goldstein |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 598 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461344223 |
ISBN-13 |
: 1461344220 |
Rating |
: 4/5 (23 Downloads) |
Synopsis Practical Scanning Electron Microscopy by : Joseph Goldstein
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Author |
: David B. Williams |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 708 |
Release |
: 2013-03-09 |
ISBN-10 |
: 9781475725193 |
ISBN-13 |
: 1475725191 |
Rating |
: 4/5 (93 Downloads) |
Synopsis Transmission Electron Microscopy by : David B. Williams
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author |
: Ray Egerton |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 224 |
Release |
: 2011-02-11 |
ISBN-10 |
: 0387258000 |
ISBN-13 |
: 9780387258003 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Physical Principles of Electron Microscopy by : Ray Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author |
: David B. Williams |
Publisher |
: Techbooks |
Total Pages |
: 180 |
Release |
: 1980-06-01 |
ISBN-10 |
: 1878907166 |
ISBN-13 |
: 9781878907165 |
Rating |
: 4/5 (66 Downloads) |
Synopsis Practical Analytical Electron Microscopy in Materials Science by : David B. Williams
Author |
: Daisuke Shindo |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 196 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9784431684220 |
ISBN-13 |
: 4431684220 |
Rating |
: 4/5 (20 Downloads) |
Synopsis High-Resolution Electron Microscopy for Materials Science by : Daisuke Shindo
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Author |
: Stephen J. Pennycook |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 764 |
Release |
: 2011-03-24 |
ISBN-10 |
: 9781441972002 |
ISBN-13 |
: 1441972005 |
Rating |
: 4/5 (02 Downloads) |
Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.