Physics And Chemistry Of Mercury Cadmium Telluride And Novel Ir Detector Materials
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Author |
: David G. Seiler |
Publisher |
: American Institute of Physics |
Total Pages |
: 312 |
Release |
: 1991 |
ISBN-10 |
: UOM:39015029745562 |
ISBN-13 |
: |
Rating |
: 4/5 (62 Downloads) |
Synopsis Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials by : David G. Seiler
Author |
: |
Publisher |
: |
Total Pages |
: 8 |
Release |
: 1931 |
ISBN-10 |
: OCLC:667893091 |
ISBN-13 |
: |
Rating |
: 4/5 (91 Downloads) |
Synopsis Kampf um den Rigaer Dom 1931 im Spiegel der Presse by :
Author |
: US Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials (9, 1990, San Francisco, Calif.) |
Publisher |
: |
Total Pages |
: |
Release |
: 1991 |
ISBN-10 |
: OCLC:180422244 |
ISBN-13 |
: |
Rating |
: 4/5 (44 Downloads) |
Synopsis Proceedings of the 1990 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials by : US Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials (9, 1990, San Francisco, Calif.)
Author |
: David G. Seiler |
Publisher |
: |
Total Pages |
: |
Release |
: 1991 |
ISBN-10 |
: OCLC:636853219 |
ISBN-13 |
: |
Rating |
: 4/5 (19 Downloads) |
Synopsis Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials by : David G. Seiler
Author |
: National Institute of Standards and Technology (U.S.) |
Publisher |
: |
Total Pages |
: 160 |
Release |
: 2000 |
ISBN-10 |
: UOM:39015048215175 |
ISBN-13 |
: |
Rating |
: 4/5 (75 Downloads) |
Synopsis National Semiconductor Metrology Program by : National Institute of Standards and Technology (U.S.)
Author |
: |
Publisher |
: |
Total Pages |
: 602 |
Release |
: 1995 |
ISBN-10 |
: MINN:30000006324614 |
ISBN-13 |
: |
Rating |
: 4/5 (14 Downloads) |
Synopsis Scientific and Technical Aerospace Reports by :
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author |
: National Semiconductor Metrology Program (U.S.) |
Publisher |
: |
Total Pages |
: 148 |
Release |
: 1999 |
ISBN-10 |
: IND:30000097657534 |
ISBN-13 |
: |
Rating |
: 4/5 (34 Downloads) |
Synopsis National Semiconductor Metrology Program by : National Semiconductor Metrology Program (U.S.)
Author |
: |
Publisher |
: |
Total Pages |
: 148 |
Release |
: 1999 |
ISBN-10 |
: STANFORD:36105050030753 |
ISBN-13 |
: |
Rating |
: 4/5 (53 Downloads) |
Synopsis National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 by :
Author |
: Junhao Chu |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 613 |
Release |
: 2007-11-21 |
ISBN-10 |
: 9780387748016 |
ISBN-13 |
: 0387748016 |
Rating |
: 4/5 (16 Downloads) |
Synopsis Physics and Properties of Narrow Gap Semiconductors by : Junhao Chu
Narrow gap semiconductors are the most important materials for the preparation of advanced modern infrared systems. They often operate at the extremes of the rules of semiconductor science. This book offers clear descriptions of crystal growth and the fundamental structure and properties of these unique materials. Topics covered include band structure, optical and transport properties, and lattice vibrations and spectra. A thorough treatment of the properties of low-dimensional systems and their relation to infrared applications is provided.
Author |
: National Institute of Standards and Technology (U.S.) |
Publisher |
: |
Total Pages |
: 60 |
Release |
: 1993 |
ISBN-10 |
: PURD:32754064048519 |
ISBN-13 |
: |
Rating |
: 4/5 (19 Downloads) |
Synopsis Semiconductor Measurement Technology by : National Institute of Standards and Technology (U.S.)