Optical Characterization Of Epitaxial Semiconductor Layers
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Author |
: Günther Bauer |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 446 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9783642796784 |
ISBN-13 |
: 3642796788 |
Rating |
: 4/5 (84 Downloads) |
Synopsis Optical Characterization of Epitaxial Semiconductor Layers by : Günther Bauer
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real time observation of surface processes during epitaxial growth is possible with techniques like reflectance difference spectroscopy. Of course, optical spectroscopies complement techniques based on the inter action of electrons with matter, but whereas the latter usually require high or ultrahigh vacuum conditions, the former ones can be applied in different environments as well. This advantage could turn out extremely important for a rather technological point of view, i.e. for the surveillance of modern semiconductor processes. Despite the large potential of techniques based on the interaction of electromagnetic waves with surfaces and epilayers, optical techniques are apparently moving only slowly into this area of technology. One reason for this might be that some prejudices still exist regarding their sensitivity.
Author |
: Theodore Sidney Moise |
Publisher |
: |
Total Pages |
: |
Release |
: 1992 |
ISBN-10 |
: OCLC:702835988 |
ISBN-13 |
: |
Rating |
: 4/5 (88 Downloads) |
Synopsis Epitaxial Growth and Optical Characterization of (111)B Strained-layer Quantum Well Heterostructures by : Theodore Sidney Moise
Author |
: Henry Kressel |
Publisher |
: Elsevier Science & Technology |
Total Pages |
: 236 |
Release |
: 1976 |
ISBN-10 |
: UOM:39015006065679 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis Characterization of Epitaxial Semiconductor Films by : Henry Kressel
Author |
: Jeff J. Peterson |
Publisher |
: |
Total Pages |
: 634 |
Release |
: 2002 |
ISBN-10 |
: UCAL:X65146 |
ISBN-13 |
: |
Rating |
: 4/5 (46 Downloads) |
Synopsis Electronic and Material Characterization of SiGe and SiGeC Epitaxial Layers by : Jeff J. Peterson
Author |
: W. E. Quinn |
Publisher |
: |
Total Pages |
: 4 |
Release |
: 1992 |
ISBN-10 |
: OCLC:228025049 |
ISBN-13 |
: |
Rating |
: 4/5 (49 Downloads) |
Synopsis In Situ Optical Characterization and Control of Epitaxial III-V Crystal Growth by : W. E. Quinn
Device designers are placing new demands on crystal growers by requesting increasingly complex structures with more stringent constraints on composition, layer thickness and interface abruptness. Post growth analysis is no longer sufficient to meet these constraints and efforts are now underway to develop real lime methods of monitoring and controlling crystal growth. A number of diagnostic techniques are available for studying semiconductor surfaces during the growth process. Optical methods are preferred because they may be used at atmospheric pressure, in any transparent medium, and the photon flux is low so that the growth process is riot disturbed. However, optical techniques have a limited spectral range, and low surface sensitivity. Fortunately, the 1.5 to 6 eV energy range of quartz-optics systems contains most of the bonding-antibonding transitions for materials used in the growth of III-V semiconductors.
Author |
: O. J. Glembocki |
Publisher |
: SPIE-International Society for Optical Engineering |
Total Pages |
: 296 |
Release |
: 1987 |
ISBN-10 |
: UOM:39015012672609 |
ISBN-13 |
: |
Rating |
: 4/5 (09 Downloads) |
Synopsis Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices by : O. J. Glembocki
Author |
: Ted Wangensteen |
Publisher |
: |
Total Pages |
: 4 |
Release |
: 1997 |
ISBN-10 |
: OCLC:41602843 |
ISBN-13 |
: |
Rating |
: 4/5 (43 Downloads) |
Synopsis Optical Characterization of Epitaxial Ga(x)In(1-x)As Suitable for Thermophotovoltaic (TPV) Converters by : Ted Wangensteen
Author |
: Thomas B. Elliot |
Publisher |
: Nova Publishers |
Total Pages |
: 236 |
Release |
: 2006 |
ISBN-10 |
: 1594549206 |
ISBN-13 |
: 9781594549205 |
Rating |
: 4/5 (06 Downloads) |
Synopsis New Research on Semiconductors by : Thomas B. Elliot
Includes within its scope, topics such as: studies of the structural, electrical, optical and acoustical properties of bulk, low-dimensional and amorphous semiconductors; and, interface properties, including the physics and chemistry of heterojunctions, metal-semiconductor and insulator-semiconductor junctions.
Author |
: Antonio Cricenti |
Publisher |
: World Scientific |
Total Pages |
: 191 |
Release |
: 2008-01-15 |
ISBN-10 |
: 9789814471602 |
ISBN-13 |
: 9814471607 |
Rating |
: 4/5 (02 Downloads) |
Synopsis Epioptics-9 - Proceedings Of The 39th Course Of The International School Of Solid State Physics by : Antonio Cricenti
This special volume contains the proceedings of the 9th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 20 to 26, 2006. The workshop was the 9th in the Epioptics series and the 39th of the International School of Solid State Physics.The workshop was aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and at assessing the usefulness of these techniques for optimization of high-quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of non-linear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of scanning probe microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also presented.
Author |
: Antonio Cricenti |
Publisher |
: World Scientific |
Total Pages |
: 191 |
Release |
: 2008 |
ISBN-10 |
: 9789812794024 |
ISBN-13 |
: 9812794026 |
Rating |
: 4/5 (24 Downloads) |
Synopsis Epioptics-9 by : Antonio Cricenti
This special volume contains the proceedings of the 9th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 20 to 26, 2006. The workshop was the 9th in the Epioptics series and the 39th of the International School of Solid State Physics.The workshop was aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and at assessing the usefulness of these techniques for optimization of high-quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of non-linear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of scanning probe microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also presented.