This book presents a new approach to on-line observation and concurrent checking of processors by refining and improving known techniques and introducing new ideas.The proposed on-line error detection and fast recover techniques support and complement other established methods. In combination with other on-line observation priniciples and with a combined hardware-software test, these techniques are used to fulfill a complete self-check scheme for an embedded processor.

Containing papers presented at the 18th European Safety and Reliability Conference (Esrel 2009) in Prague, Czech Republic, September 2009.Reliability, Risk and Safety Theory and Applications will be of interest for academics and professionals working in a wide range of industrial and governmental sectors, including civil and environmental engineering, energy production and distribution, information technology and telecommunications, critical infrastructures, and insurance and finance.

As software systems become ubiquitous, the issues of dependability become more and more crucial. Given that solutions to these issues must be considered from the very beginning of the design process, it is reasonable that dependability is addressed at the architectural level. This book comes as a result of an effort to bring together the research communities of software architectures and dependability. This state-of-the-art survey contains 16 carefully selected papers originating from the Twin Workshops on Architecting Dependable Systems (WADS 2004) accomplished as part of the International Conference on Software Engineering (ICSE 2004) in Edinburgh, UK and of the International Conference on Dependable Systems and Networks (DSN 2004) in Florence, Italy. The papers are organised in topical sections on architectures for dependable services, monitoring and reconfiguration in software architectures, dependability support for software architectures, architectural evaluation, and architectural abstractions for dependability.

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

This book analyzes the causes of failures in computing systems, their consequences, as weIl as the existing solutions to manage them. The domain is tackled in a progressive and educational manner with two objectives: 1. The mastering of the basics of dependability domain at system level, that is to say independently ofthe technology used (hardware or software) and of the domain of application. 2. The understanding of the fundamental techniques available to prevent, to remove, to tolerate, and to forecast faults in hardware and software technologies. The first objective leads to the presentation of the general problem, the fault models and degradation mechanisms wh ich are at the origin of the failures, and finally the methods and techniques which permit the faults to be prevented, removed or tolerated. This study concerns logical systems in general, independently of the hardware and software technologies put in place. This knowledge is indispensable for two reasons: • A large part of a product' s development is independent of the technological means (expression of requirements, specification and most of the design stage). Very often, the development team does not possess this basic knowledge; hence, the dependability requirements are considered uniquely during the technological implementation. Such an approach is expensive and inefficient. Indeed, the removal of a preliminary design fault can be very difficult (if possible) if this fault is detected during the product's final testing.

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.