Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.

This book is devoted to non-destructive materials characterization (NDMC) using different non-destructive evaluation techniques. It presents theoretical basis, physical understanding, and technological developments in the field of NDMC with suitable examples for engineering and materials science applications. It is written for engineers and researchers in R&D, design, production, quality assurance, and non-destructive testing and evaluation. The relevance of NDMC is to achieve higher reliability, safety, and productivity for monitoring production processes and also for in-service inspections for detection of degradations, which are often precursors of macro-defects and failure of components. Ultrasonic, magnetic, electromagnetic and X-rays based NDMC techniques are discussed in detail with brief discussions on electron and positron based techniques.

Selected, peer reviewed papers from the 6th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation (MECA SENS VI 2011), September 7-9, 2011, Hamburg, Germany

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Comprehensive Hard Materials, Three Volume Set deals with the production, uses and properties of the carbides, nitrides and borides of these metals and those of titanium, as well as tools of ceramics, the superhard boron nitrides and diamond and related compounds. Articles include the technologies of powder production (including their precursor materials), milling, granulation, cold and hot compaction, sintering, hot isostatic pressing, hot-pressing, injection moulding, as well as on the coating technologies for refractory metals, hard metals and hard materials. The characterization, testing, quality assurance and applications are also covered. Comprehensive Hard Materials provides meaningful insights on materials at the leading edge of technology. It aids continued research and development of these materials and as such it is a critical information resource to academics and industry professionals facing the technological challenges of the future. Hard materials operate at the leading edge of technology, and continued research and development of such materials is critical to meet the technological challenges of the future. Users of this work can improve their knowledge of basic principles and gain a better understanding of process/structure/property relationships. With the convergence of nanotechnology, coating techniques, and functionally graded materials to the cognitive science of cemented carbides, cermets, advanced ceramics, super-hard materials and composites, it is evident that the full potential of this class of materials is far from exhausted. This work unites these important areas of research and will provide useful insights to users through its extensive cross-referencing and thematic presentation. To link academic to industrial usage of hard materials and vice versa, this work deals with the production, uses and properties of the carbides, nitrides and borides of these metals and those of titanium, as well as tools of ceramics, the superhard boron nitrides and diamond and related compounds.

This first book to cover the interaction of polymers with radiation from the entire electromagnetic spectrum adopts a multidisciplinary approach to bridge polymer chemistry and physics, photochemistry, photophysics and materials science. The text is equally unique in its scope, devoting equal amounts of attention to the three aspects of synthesis, characterization, and applications. The first part deals with the interaction of polymers with non-ionizing radiation in the frequency-range from sub-terahertz via infrared radiation to visible and ultraviolet light, while the second covers interaction with ionizing radiation from the extreme ultraviolet to ?-ray photons. The result is a systematic overview of how both types of radiation can be used for different polymerization approaches, spectroscopy methods and lithography techniques. Authored by a world-renowned researcher and teacher with over 40 years of experience in the field, this is a highly practical and authoritative guide.

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

An introductory and intermediate level handbook written in pragmatic style to explain residual stresses and to provide straightforward guidance about practical measurement methods. Residual stresses play major roles in engineering structures, with highly beneficial effects when designed well, and catastrophic effects when ignored. With ever-increasing concern for product performance and reliability, there is an urgent need for a renewed assessment of traditional and modern measurement techniques. Success critically depends on being able to make the most practical and effective choice of measurement method for a given application. Practical Residual Stress Measurement Methods provides the reader with the information needed to understand key residual stress concepts and to make informed technical decisions about optimal choice of measurement technique. Each chapter, written by invited specialists, follows a focused and pragmatic format, with subsections describing the measurement principle, residual stress evaluation, practical measurement procedures, example applications, references and further reading. The chapter authors represent both international academia and industry. Each of them brings to their writing substantial hands-on experience and expertise in their chosen field. Fully illustrated throughout, the book provides a much-needed practical approach to residual stress measurements. The material presented is essential reading for industrial practitioners, academic researchers and interested students. Key features: • Presents an overview of the principal residual stress measurement methods, both destructive and non-destructive, with coverage of new techniques and modern enhancements of established techniques • Includes stand-alone chapters, each with its own figures, tables and list of references, and written by an invited team of international specialists

The work in this thesis covers the design, growth and characterisation of neutron multilayers. The performance of these multilayers is highly dependent on the obtained interface width between the layers, even a modest improvement can offer a substantial increase in reflectivity performance. As multilayers are such an integral component of many neutron optical instruments, any improvement in terms of reflectivity performance has broad implications for all neutron scattering experiments. This project has been carried out with the construction of the European Spallation Source (ESS) in mind, but the principles extend to all neutron scattering sources. Ni/Ti is the conventional material system of choice for neutron optical components due to the high contrast in scattering length density (SLD). The reflected intensity of such components is largely dependent on the interface width, caused by the formation of nanocrystallites, interdiffusion, and/or intermixing. Apart from hampering the reflectivity performance, the finite interface width between the layers also limits the minimum usable layer thickness in the mirror stack. The formation of nanocrystallites has been eliminated by co-depositing of B4C . This has been combined with a modulated ion assistance scheme to smoothen the interfaces. X-ray reflectivity (XRR) measurements show significantly improvements compared to pure Ni/Ti multilayers. This has further been investigated using low neutron-absorbing 11B4C instead. After deposition, the 11B4C containing films have been characterized using neutron reflectometry, X-ray reflectivity, transmission electron microscopy, elastic recoil detection analysis, X-ray photoelectron spectroscopy. A large part of his work has focused on fitting X-ray and neutron reflectivity measurements in order to obtain structural parameters. The fits to the experimental data suggest a significant improvement in interface width for the samples that have been co-deposited with 11B4C using a modulated ion assistance scheme during deposition. Any accumulation of roughness has been eliminated, and the average initial interface width at the first bilayer has been reduced from 6.3 Å to 4.5 Å per bilayer. The respective reflectivity performance for these structural parameters have been simulated for a neutron supermirror (N = 5000) for both materials at a neutron wavelength at λ = 3 Å using the IMD software. The predicted reflectivity performance for the 11B4C containing samples amounts to about 71%, which is a significant increase compared to the pure Ni/Ti samples which have a predicted reflectivity of 62%. This results in a reflectivity increase from 0.84% to 3.3% after a total of 10 reflections, resulting in more than 400% higher neutron flux at experiment.