Microelectronic Failure Analysis Desk Reference
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Author |
: |
Publisher |
: ASM International |
Total Pages |
: 813 |
Release |
: 2004-01-01 |
ISBN-10 |
: 9780871708045 |
ISBN-13 |
: 0871708043 |
Rating |
: 4/5 (45 Downloads) |
Synopsis Microelectronics Failure Analysis by :
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Author |
: Tejinder Gandhi |
Publisher |
: ASM International |
Total Pages |
: 750 |
Release |
: 2019-11-01 |
ISBN-10 |
: 9781627082464 |
ISBN-13 |
: 1627082468 |
Rating |
: 4/5 (64 Downloads) |
Synopsis Microelectronics Fialure Analysis Desk Reference, Seventh Edition by : Tejinder Gandhi
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author |
: Thomas W. Lee |
Publisher |
: Asm International |
Total Pages |
: 404 |
Release |
: 1993 |
ISBN-10 |
: 087170479X |
ISBN-13 |
: 9780871704795 |
Rating |
: 4/5 (9X Downloads) |
Synopsis Microelectronic Failure Analysis by : Thomas W. Lee
A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical
Author |
: |
Publisher |
: ASM International(OH) |
Total Pages |
: 222 |
Release |
: 2002 |
ISBN-10 |
: UOM:39015055585627 |
ISBN-13 |
: |
Rating |
: 4/5 (27 Downloads) |
Synopsis Microelectronic Failure Analysis by :
This book/CD-ROM package, the 2002 Supplement to the Microelectronic Failure Analysis Desk Reference, 4th edition, is the second update to the 4th edition, following the 2001 Supplement. The main themes addressed are analysis techniques for submicron defects, failure analysis of microelectromechani
Author |
: Richard J. Ross |
Publisher |
: ASM International(OH) |
Total Pages |
: 664 |
Release |
: 1999 |
ISBN-10 |
: UOM:39015055923034 |
ISBN-13 |
: |
Rating |
: 4/5 (34 Downloads) |
Synopsis Microelectronic Failure Analysis by : Richard J. Ross
Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 162 |
Release |
: 2001-01-01 |
ISBN-10 |
: 9780871707451 |
ISBN-13 |
: 0871707454 |
Rating |
: 4/5 (51 Downloads) |
Synopsis Microelectronic Failure Analysis Desk Reference by :
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author |
: |
Publisher |
: ASM International |
Total Pages |
: 160 |
Release |
: 2002-01-01 |
ISBN-10 |
: 9780871707697 |
ISBN-13 |
: 0871707691 |
Rating |
: 4/5 (97 Downloads) |
Synopsis Microelectronic Failure Analysis by :
Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Author |
: EDFAS Desk Reference Committee |
Publisher |
: ASM International |
Total Pages |
: 673 |
Release |
: 2011 |
ISBN-10 |
: 9781615037261 |
ISBN-13 |
: 1615037268 |
Rating |
: 4/5 (61 Downloads) |
Synopsis Microelectronics Failure Analysis by : EDFAS Desk Reference Committee
Includes bibliographical references and index.
Author |
: ASM International |
Publisher |
: ASM International |
Total Pages |
: 534 |
Release |
: 2003-01-01 |
ISBN-10 |
: 9781615030866 |
ISBN-13 |
: 1615030867 |
Rating |
: 4/5 (66 Downloads) |
Synopsis Istfa 2003 by : ASM International
Author |
: Ed Doyle (Jr.) |
Publisher |
: |
Total Pages |
: 982 |
Release |
: 1981* |
ISBN-10 |
: OCLC:8179551 |
ISBN-13 |
: |
Rating |
: 4/5 (51 Downloads) |
Synopsis Microelectronic Failure Analysis Techniques by : Ed Doyle (Jr.)