Measurements Of Dielectric Constants And Loss Tangents At E Band Using A Fabry Perot Interferometer
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Author |
: Constantine A. Balanis |
Publisher |
: |
Total Pages |
: 60 |
Release |
: 1969 |
ISBN-10 |
: UIUC:30112106745141 |
ISBN-13 |
: |
Rating |
: 4/5 (41 Downloads) |
Synopsis Measurements of Dielectric Constants and Loss Tangents at E-band Using a Fabry-Perot Interferometer by : Constantine A. Balanis
Fabry-Perot interferometer measurements of dielectric constants and loss for synthetic resins.
Author |
: |
Publisher |
: |
Total Pages |
: 1250 |
Release |
: 1970 |
ISBN-10 |
: UOM:39015022681756 |
ISBN-13 |
: |
Rating |
: 4/5 (56 Downloads) |
Synopsis Monthly Catalogue, United States Public Documents by :
Author |
: |
Publisher |
: |
Total Pages |
: 348 |
Release |
: 1970 |
ISBN-10 |
: MINN:30000011064858 |
ISBN-13 |
: |
Rating |
: 4/5 (58 Downloads) |
Synopsis Scientific and Technical Aerospace Reports by :
Author |
: United States. Superintendent of Documents |
Publisher |
: |
Total Pages |
: 1504 |
Release |
: 1979 |
ISBN-10 |
: STANFORD:36105019598296 |
ISBN-13 |
: |
Rating |
: 4/5 (96 Downloads) |
Synopsis Monthly Catalog of United States Government Publications, Cumulative Index by : United States. Superintendent of Documents
Author |
: United States. Superintendent of Documents |
Publisher |
: |
Total Pages |
: 1464 |
Release |
: 1966 |
ISBN-10 |
: WISC:89035089051 |
ISBN-13 |
: |
Rating |
: 4/5 (51 Downloads) |
Synopsis Monthly Catalog of United States Government Publications by : United States. Superintendent of Documents
Author |
: John W. Schultz |
Publisher |
: Artech House |
Total Pages |
: 331 |
Release |
: 2023-02-28 |
ISBN-10 |
: 9781630819477 |
ISBN-13 |
: 1630819476 |
Rating |
: 4/5 (77 Downloads) |
Synopsis Wideband Microwave Materials Characterization by : John W. Schultz
This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. You’ll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. You’ll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures, and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems.
Author |
: Mesut Gökten |
Publisher |
: Springer Nature |
Total Pages |
: 124 |
Release |
: 2022-06-01 |
ISBN-10 |
: 9783031017148 |
ISBN-13 |
: 3031017145 |
Rating |
: 4/5 (48 Downloads) |
Synopsis Multiresolution Frequency Domain Technique for Electromagnetics by : Mesut Gökten
In this book, a general frequency domain numerical method similar to the finite difference frequency domain (FDFD) technique is presented. The proposed method, called the multiresolution frequency domain (MRFD) technique, is based on orthogonal Battle-Lemarie and biorthogonal Cohen-Daubechies-Feauveau (CDF) wavelets. The objective of developing this new technique is to achieve a frequency domain scheme which exhibits improved computational efficiency figures compared to the traditional FDFD method: reduced memory and simulation time requirements while retaining numerical accuracy. The newly introduced MRFD scheme is successfully applied to the analysis of a number of electromagnetic problems, such as computation of resonance frequencies of one and three dimensional resonators, analysis of propagation characteristics of general guided wave structures, and electromagnetic scattering from two dimensional dielectric objects. The efficiency characteristics of MRFD techniques based on different wavelets are compared to each other and that of the FDFD method. Results indicate that the MRFD techniques provide substantial savings in terms of execution time and memory requirements, compared to the traditional FDFD method. Table of Contents: Introduction / Basics of the Finite Difference Method and Multiresolution Analysis / Formulation of the Multiresolution Frequency Domain Schemes / Application of MRFD Formulation to Closed Space Structures / Application of MRFD Formulation to Open Space Structures / A Multiresolution Frequency Domain Formulation for Inhomogeneous Media / Conclusion
Author |
: |
Publisher |
: |
Total Pages |
: 424 |
Release |
: 1971 |
ISBN-10 |
: MINN:319510008463471 |
ISBN-13 |
: |
Rating |
: 4/5 (71 Downloads) |
Synopsis NASA Technical Note by :
Author |
: |
Publisher |
: |
Total Pages |
: 1274 |
Release |
: 1972 |
ISBN-10 |
: PSU:000011909279 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis A Collection of Technical Papers by :
Author |
: Bruce M. Kendall |
Publisher |
: |
Total Pages |
: 52 |
Release |
: 1971 |
ISBN-10 |
: UIUC:30112106881540 |
ISBN-13 |
: |
Rating |
: 4/5 (40 Downloads) |
Synopsis Measurement of Electron Density of a Negative-glow Plasma with an E-band Fabry-Perot Interferometer by : Bruce M. Kendall