LEOS '93 Conference Proceedings

LEOS '93 Conference Proceedings
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Total Pages : 866
Release :
ISBN-10 : UCSD:31822016979700
ISBN-13 :
Rating : 4/5 (00 Downloads)

Synopsis LEOS '93 Conference Proceedings by : IEEE Lasers and Electro-Optics Society

Conference Proceedings

Conference Proceedings
Author :
Publisher :
Total Pages : 870
Release :
ISBN-10 : UIUC:30112007973594
ISBN-13 :
Rating : 4/5 (94 Downloads)

Synopsis Conference Proceedings by :

Index of Conference Proceedings

Index of Conference Proceedings
Author :
Publisher :
Total Pages : 938
Release :
ISBN-10 : UOM:39015048505625
ISBN-13 :
Rating : 4/5 (25 Downloads)

Synopsis Index of Conference Proceedings by : British Library. Document Supply Centre

Cumulative Book Index

Cumulative Book Index
Author :
Publisher :
Total Pages : 2264
Release :
ISBN-10 : UOM:39015058373781
ISBN-13 :
Rating : 4/5 (81 Downloads)

Synopsis Cumulative Book Index by :

A world list of books in the English language.

Optical Fiber Telecommunications III

Optical Fiber Telecommunications III
Author :
Publisher : Academic Press
Total Pages : 529
Release :
ISBN-10 : 9780123951717
ISBN-13 : 0123951712
Rating : 4/5 (17 Downloads)

Synopsis Optical Fiber Telecommunications III by : Ivan P. Kaminow

Proceedings

Proceedings
Author :
Publisher :
Total Pages : 502
Release :
ISBN-10 : UOM:39015036274143
ISBN-13 :
Rating : 4/5 (43 Downloads)

Synopsis Proceedings by :

The Cumulative Book Index

The Cumulative Book Index
Author :
Publisher :
Total Pages : 2266
Release :
ISBN-10 : STANFORD:36105117840913
ISBN-13 :
Rating : 4/5 (13 Downloads)

Synopsis The Cumulative Book Index by :

Index to IEEE Publications

Index to IEEE Publications
Author :
Publisher :
Total Pages : 1168
Release :
ISBN-10 : UOM:39015036270075
ISBN-13 :
Rating : 4/5 (75 Downloads)

Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers

Issues for 1973- cover the entire IEEE technical literature.

Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics
Author :
Publisher : John Wiley & Sons
Total Pages : 522
Release :
ISBN-10 : 9781118481868
ISBN-13 : 1118481860
Rating : 4/5 (68 Downloads)

Synopsis Semiconductor Laser Engineering, Reliability and Diagnostics by : Peter W. Epperlein

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.