Leos 93 Conference Proceedings
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Author |
: IEEE Lasers and Electro-Optics Society |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: 866 |
Release |
: 1993 |
ISBN-10 |
: UCSD:31822016979700 |
ISBN-13 |
: |
Rating |
: 4/5 (00 Downloads) |
Synopsis LEOS '93 Conference Proceedings by : IEEE Lasers and Electro-Optics Society
Author |
: |
Publisher |
: |
Total Pages |
: 870 |
Release |
: 1993 |
ISBN-10 |
: UIUC:30112007973594 |
ISBN-13 |
: |
Rating |
: 4/5 (94 Downloads) |
Synopsis Conference Proceedings by :
Author |
: British Library. Document Supply Centre |
Publisher |
: |
Total Pages |
: 938 |
Release |
: 1997 |
ISBN-10 |
: UOM:39015048505625 |
ISBN-13 |
: |
Rating |
: 4/5 (25 Downloads) |
Synopsis Index of Conference Proceedings by : British Library. Document Supply Centre
Author |
: |
Publisher |
: |
Total Pages |
: 2264 |
Release |
: 1995 |
ISBN-10 |
: UOM:39015058373781 |
ISBN-13 |
: |
Rating |
: 4/5 (81 Downloads) |
Synopsis Cumulative Book Index by :
A world list of books in the English language.
Author |
: Ivan P. Kaminow |
Publisher |
: Academic Press |
Total Pages |
: 529 |
Release |
: 1997 |
ISBN-10 |
: 9780123951717 |
ISBN-13 |
: 0123951712 |
Rating |
: 4/5 (17 Downloads) |
Synopsis Optical Fiber Telecommunications III by : Ivan P. Kaminow
Author |
: |
Publisher |
: |
Total Pages |
: 502 |
Release |
: 1995 |
ISBN-10 |
: UOM:39015036274143 |
ISBN-13 |
: |
Rating |
: 4/5 (43 Downloads) |
Synopsis Proceedings by :
Author |
: |
Publisher |
: |
Total Pages |
: 2266 |
Release |
: 1995 |
ISBN-10 |
: STANFORD:36105117840913 |
ISBN-13 |
: |
Rating |
: 4/5 (13 Downloads) |
Synopsis The Cumulative Book Index by :
Author |
: Institute of Electrical and Electronics Engineers |
Publisher |
: |
Total Pages |
: 1168 |
Release |
: 1995 |
ISBN-10 |
: UOM:39015036270075 |
ISBN-13 |
: |
Rating |
: 4/5 (75 Downloads) |
Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers
Issues for 1973- cover the entire IEEE technical literature.
Author |
: Peter W. Epperlein |
Publisher |
: John Wiley & Sons |
Total Pages |
: 522 |
Release |
: 2013-01-25 |
ISBN-10 |
: 9781118481868 |
ISBN-13 |
: 1118481860 |
Rating |
: 4/5 (68 Downloads) |
Synopsis Semiconductor Laser Engineering, Reliability and Diagnostics by : Peter W. Epperlein
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author |
: |
Publisher |
: |
Total Pages |
: 308 |
Release |
: 1995 |
ISBN-10 |
: UOM:39015034226012 |
ISBN-13 |
: |
Rating |
: 4/5 (12 Downloads) |
Synopsis Proceedings of Advances in Laser and Light Spectroscopy to Diagnose Cancer and Other Diseases by :