Introduction To Scanning Tunneling Microscopy Third Edition
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Author |
: C. Julian Chen |
Publisher |
: Oxford University Press |
Total Pages |
: 523 |
Release |
: 2021-03-04 |
ISBN-10 |
: 9780192598561 |
ISBN-13 |
: 0192598562 |
Rating |
: 4/5 (61 Downloads) |
Synopsis Introduction to Scanning Tunneling Microscopy Third Edition by : C. Julian Chen
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.
Author |
: C. Julian Chen |
Publisher |
: Oxford University Press |
Total Pages |
: 472 |
Release |
: 1993-05-20 |
ISBN-10 |
: 9780198023562 |
ISBN-13 |
: 0198023561 |
Rating |
: 4/5 (62 Downloads) |
Synopsis Introduction to Scanning Tunneling Microscopy by : C. Julian Chen
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Author |
: C. Julian Chen |
Publisher |
: Oxford University Press, USA |
Total Pages |
: 523 |
Release |
: 2021-01-29 |
ISBN-10 |
: 9780198856559 |
ISBN-13 |
: 0198856555 |
Rating |
: 4/5 (59 Downloads) |
Synopsis Introduction to Scanning Tunneling Microscopy Third Edition by : C. Julian Chen
This third edition is a thoroughly updated and improved version of the recognized "Bible" of the field.
Author |
: Roland Wiesendanger |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 415 |
Release |
: 2013-03-07 |
ISBN-10 |
: 9783642801181 |
ISBN-13 |
: 3642801188 |
Rating |
: 4/5 (81 Downloads) |
Synopsis Scanning Tunneling Microscopy III by : Roland Wiesendanger
Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the field of local probe methods. In this second edition the text has been updated and new methods are discussed.
Author |
: Ernst Meyer |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 215 |
Release |
: 2013-03-14 |
ISBN-10 |
: 9783662098011 |
ISBN-13 |
: 3662098016 |
Rating |
: 4/5 (11 Downloads) |
Synopsis Scanning Probe Microscopy by : Ernst Meyer
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author |
: Joseph A. Stroscio |
Publisher |
: Academic Press |
Total Pages |
: 481 |
Release |
: 2013-10-22 |
ISBN-10 |
: 9781483292878 |
ISBN-13 |
: 1483292878 |
Rating |
: 4/5 (78 Downloads) |
Synopsis Scanning Tunneling Microscopy by : Joseph A. Stroscio
Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
Author |
: Bert Voigtländer |
Publisher |
: Springer |
Total Pages |
: 375 |
Release |
: 2015-02-24 |
ISBN-10 |
: 9783662452400 |
ISBN-13 |
: 3662452405 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Scanning Probe Microscopy by : Bert Voigtländer
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Author |
: Roland Wiesendanger |
Publisher |
: Cambridge University Press |
Total Pages |
: 664 |
Release |
: 1994-09-29 |
ISBN-10 |
: 0521428475 |
ISBN-13 |
: 9780521428477 |
Rating |
: 4/5 (75 Downloads) |
Synopsis Scanning Probe Microscopy and Spectroscopy by : Roland Wiesendanger
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Author |
: C. Julian Chen |
Publisher |
: OUP Oxford |
Total Pages |
: 488 |
Release |
: 2007-09-13 |
ISBN-10 |
: 0199211507 |
ISBN-13 |
: 9780199211500 |
Rating |
: 4/5 (07 Downloads) |
Synopsis Introduction to Scanning Tunneling Microscopy by : C. Julian Chen
The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.
Author |
: Bert Voigtländer |
Publisher |
: Springer |
Total Pages |
: 329 |
Release |
: 2019-05-23 |
ISBN-10 |
: 9783030136543 |
ISBN-13 |
: 303013654X |
Rating |
: 4/5 (43 Downloads) |
Synopsis Atomic Force Microscopy by : Bert Voigtländer
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.