Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method. Offers introduction and history of ATR before discussing theoretical aspects Includes informative illustrations and theoretical calculations Discusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance

Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.

Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method. Offers introduction and history of ATR before discussing theoretical aspects Includes informative illustrations and theoretical calculations Discusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance

Practical Sampling Techniques for Infrared Analysis provides a single-source guide to sample handling for routine analysis in infrared spectroscopy using commercially available instrumentation and accessories. Following a review of infrared spectroscopic theory, chapters consider individual techniques such as transmission methodology (e.g., solution cells, KBr pellets), internal reflectance, diffuse reflectance, photoacoustic FT-IR, infrared microscopy, GC/FT-IR, and quantitative analysis. In addition, two chapters elaborate on both typical and unusual samples and problems encountered in industrial laboratories and the process by which a spectroscopist chooses the most effective technique. Various short courses on infrared analysis are also listed. Practical Sampling Techniques for Infrared Analysis will be an important guide for all professional analytical chemists and technicians.

This volume contains all of the papers presented at the American Chemical Society Symposium on Reflectance Spectroscopy. The Symposium was presented under the sponsorship of the Division of Analytical Chemistry, and was held on September 11 and 12,1967, at the 154th National Meeting of the American Chemical Society, Chicago, Illinois. The papers presented herein represent a renaissance of interest in reflectance spectroscopy. The techni~ue of reflec tance spectroscopy is not, of course, a new techni~ue, however, it has only been applied to problems of a chemical interest in the last decade or so. The instrumentation for this techni~ue in the ultraviolet, visible, and near infrared regions of the spectrum has been available for many years. New and exciting research is being carried out at the present time to extend these techni~ues to the infrared and far infrared regions as well. It is a pleasure for the Editor to express his gratitude to Drs. John K. Taylor and E. C. Dunlop of the Division of Analytical Chemistry, ACS, for their cooperation in making the Symposium a reality. The assistance of Miss Julie Norris of the University of Houston for her typing and manuscript organi zation skill is greatly appreciated. And lastly, but certainly not the least, the Editor would like to acknowledge the coopera tion of all of the contributors to this volume. Certainly without their cooperation, this Symposium would not have been a success.

Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

IR spectroscopy has become without any doubt a key technique to answer questions raised when studying the interaction of proteins or peptides with solid surfaces for a fundamental point of view as well as for technological applications. Principle, experimental set ups, parameters and interpretation rules of several advanced IR-based techniques; application to biointerface characterisation through the presentation of recent examples, will be given in this book. It will describe how to characterise amino acids, protein or bacterial strain interactions with metal and oxide surfaces, by using infrared spectroscopy, in vacuum, in the air or in an aqueous medium. Results will highlight the performances and perspectives of the technique. - Description of the principles, expermental setups and parameter interpretation, and the theory for several advanced IR-based techniques for interface characterisation - Contains examples which demonstrate the capacity, potential and limits of the IR techniques - Helps finding the most adequate mode of analysis - Contains examples - Contains a glossary by techniques and by keywords

Attenuated total reflection (ATR) spectroscopy has been adapted to measure the rates of chemical reactions which modify silica surfaces. In this method, a silicon ATR substrate is oxidized to produce a silicon dioxide surface layer, which can be used as a model silica surface in measurements of the rates chemical modification. An ATR flow cell is filled with a solution of a surface active reagent, and spectra are obtained at regular intervals. Confinement of the infrared intensity to the interface by total internal reflection provides a measure of changes in concentrations of species which adsorb or bind to the surface.