Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.

This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

This book provides a basic understanding of the design guidelines for a wide range of hybrid circuits, both thick and thin film, covering a wide range of frequencies. It is intended for electronic engineering designers and design managers who seek a background in hybrid technology.

Anglo-American Microelectronics Data 1968-69, Volume One Manufacturers A-P covers semiconductor integrated circuits, thick and thin film technologies, and constructions outside the semiconductor integrated circuit area which come within the microelectronics range. The book discusses A.B. metal products thick film microcircuits; AMELCO series 16-701/46-701 tentative transistor-transistor logic; and American Micro-Systems B002e low-power logic binary. The book also describes Bunker-Ramo hybrid thin-film techniques; Centralab thick film integrated circuits; and CTS Cermet microelectronics. Elliott-automation; Erie R-C and hybrid integrated circuits; and Ether engineering series 2020 operational amplifiers are also considered. Other topics include Fair Child resistor-transistor micrologic; Hawker Siddeley micropacks; and Plessey SL20 series amplifiers. Designers, buyers, and users of microelectronic devices will find the text useful.

The book supplements Guidelines for Chemical Process Quantitative Risk Analysis by providing the failure rate data needed to perform a chemical process quantitative risk analysis.

This volume addresses design improvement from the perspective of prevention by introducing readers to the tools of the Six Sigma design process. The author discusses the issues of designing for Six Sigma, covering the topics that any Shogun Six Sigma Master must be familiar with: customer satisfaction, quality function deployment, benchmarking, sys

American Microelectronics Data Annual 1964-65 provides comprehensive information on different microelectronics available in the U.S. The microelectronics covered in the text includes thin film, semiconductor, and integrated and hybrid circuit assemblies. The selection also provides an index that can be utilized for locating assemblies by the virtue of circuit function or design category. Information on the techniques essential in the practice of microelectronics is also included. The book will be of great use to student and professional electronics engineers and technicians.