Handbook Of X Ray Photoelectron Spectroscopy
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Author |
: John F. Moulder |
Publisher |
: Perkin-Elmer, Physical Electronics Division |
Total Pages |
: 261 |
Release |
: 1992 |
ISBN-10 |
: 0962702625 |
ISBN-13 |
: 9780962702624 |
Rating |
: 4/5 (25 Downloads) |
Synopsis Handbook of X-ray Photoelectron Spectroscopy by : John F. Moulder
Author |
: John F. Moulder |
Publisher |
: |
Total Pages |
: 261 |
Release |
: 1995 |
ISBN-10 |
: 096481241X |
ISBN-13 |
: 9780964812413 |
Rating |
: 4/5 (1X Downloads) |
Synopsis Handbook of X-ray Photoelectron Spectroscopy by : John F. Moulder
Author |
: Jill Chastain |
Publisher |
: |
Total Pages |
: 261 |
Release |
: 1995 |
ISBN-10 |
: OCLC:918340291 |
ISBN-13 |
: |
Rating |
: 4/5 (91 Downloads) |
Synopsis Handbook of X-ray Photoelectron Spectroscopy by : Jill Chastain
Author |
: Charles Daniel Wagner |
Publisher |
: |
Total Pages |
: 208 |
Release |
: 1979 |
ISBN-10 |
: CORNELL:31924058617964 |
ISBN-13 |
: |
Rating |
: 4/5 (64 Downloads) |
Synopsis Handbook of X-ray Photoelectron Spectroscopy by : Charles Daniel Wagner
Author |
: Siegfried Hofmann |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 544 |
Release |
: 2012-10-25 |
ISBN-10 |
: 9783642273803 |
ISBN-13 |
: 3642273807 |
Rating |
: 4/5 (03 Downloads) |
Synopsis Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by : Siegfried Hofmann
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author |
: B. Vincent Crist |
Publisher |
: John Wiley & Sons |
Total Pages |
: 562 |
Release |
: 2000-10-19 |
ISBN-10 |
: 9780471492658 |
ISBN-13 |
: 0471492655 |
Rating |
: 4/5 (58 Downloads) |
Synopsis Handbook of Monochromatic XPS Spectra by : B. Vincent Crist
These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials. Offers a clear presentation of spectra with the rightamount of experimental detail. All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.
Author |
: David Briggs |
Publisher |
: |
Total Pages |
: 418 |
Release |
: 1977 |
ISBN-10 |
: UOM:39015031418125 |
ISBN-13 |
: |
Rating |
: 4/5 (25 Downloads) |
Synopsis Handbook of X-ray and Ultraviolet Photoelectron Spectroscopy by : David Briggs
Author |
: J. Theo Kloprogge |
Publisher |
: Elsevier |
Total Pages |
: 534 |
Release |
: 2020-03-10 |
ISBN-10 |
: 9780128045237 |
ISBN-13 |
: 012804523X |
Rating |
: 4/5 (37 Downloads) |
Synopsis Handbook of Mineral Spectroscopy by : J. Theo Kloprogge
Handbook of Mineral Spectroscopy, Volume 1: X-ray Photoelectron Spectra presents a database of X-ray Photoelectron spectra showing both survey (with chemical analysis) and high-resolution spectra of more than 200 rock-forming and major ore minerals. XPS of minerals is a very powerful technique for analyzing not only the chemical composition of minerals – including, for other techniques, difficult elements such as F and Cl, but also the local environment of atoms in a crystal structure. The book includes a section on silicates and on non-silicates, and is further subdivided according to the normal mineral classes. - Brings together and expands upon the limited information available on the XPS of minerals into one handbook - Features 2,500 full color, X-ray Photoelectron survey and high-resolution Spectra for use by researchers in the lab and as a reference - Includes the chemical information of each mineral - Written by experts with more than 50 years of combined mineral spectroscopy experience
Author |
: D.R. Vij |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 748 |
Release |
: 2007-02-15 |
ISBN-10 |
: 9780387375908 |
ISBN-13 |
: 0387375902 |
Rating |
: 4/5 (08 Downloads) |
Synopsis Handbook of Applied Solid State Spectroscopy by : D.R. Vij
Solid-State spectroscopy is a burgeoning field with applications in many branches of science, including physics, chemistry, biosciences, surface science, and materials science. This handbook brings together in one volume information about various spectroscopic techniques that is currently scattered in the literature of these disciplines. This concise yet comprehensive volume covers theory and applications of a broad range of spectroscopies. It provides an overview of sixteen spectroscopic technique and self-contained chapters present up-to-date scientific and technical information and references with minimal overlap and redundancy.
Author |
: Günter H. Zschornack |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 969 |
Release |
: 2007-01-24 |
ISBN-10 |
: 9783540286189 |
ISBN-13 |
: 3540286187 |
Rating |
: 4/5 (89 Downloads) |
Synopsis Handbook of X-Ray Data by : Günter H. Zschornack
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.