"The material presented in this handbook is an introduction to help non-specialists in speckle techniques understand the basic principles of speckle interferometry. The book is mainly oriented to the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern interferometry (ESPI) techniques are presented using a simplified mathematical notation that includes rigid body displacements and the standard body displacements to estimate object pose changes with six degrees of freedom. Additionally, the adoption of temporal phase unwrapping instead of spatial unwrapping is promoted. This handbook also includes a summary of recent industrial applications with an update on the current research work in the ESPI field"--

Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

Holographic and speckle interferometry are optical techniques which use lasers to make non-contracting field view measurements at a sensitivity of the wavelength of light on optically rough (i.e. non-mirrored) surfaces. They may be used to measure static or dynamic displacements, the shape of objects, and refractive index variations of transparent media. As such, these techniques have been applied to the solution of a wide range of problems in strain and vibrational analysis, non-destructive testing (NDT), component inspection and design analysis and fluid flow visualisation. This book provides a self-contained, unified, theoretical analysis of the basic principles and associated opto-electronic techniques (for example Electronic Speckle Pattern Interferometry). In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. In this new edition, the authors have taken the opportunity to include a much more coherent description of more than twenty individual case studies that are representative of the main uses to which the techniques are put. The Bibliography has also been brought up to date.

"The material presented in this handbook is an introduction to help non-specialists in speckle techniques understand the basic principles of speckle interferometry. The book is mainly oriented to the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern interferometry (ESPI) techniques are presented using a simplified mathematical notation that includes rigid body displacements and the standard body displacements to estimate object pose changes with six degrees of freedom. Additionally, the adoption of temporal phase unwrapping instead of spatial unwrapping is promoted. This handbook also includes a summary of recent industrial applications with an update on the current research work in the ESPI field"--

These proceedings reflect the work presented at the conference "Interferometry in Speckle Light: Theory and Applications", held at the Ecole Polytechnique Federale de Lausanne, (EPFL), the Swiss Federal Institute of Technology in Lausanne, Switzerland. The event took place from September 25 to September 28, 2000. Thanks to the diligence of the authors, this book has been published just in time for the conference. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. This conference is not part of a series; on the contrary, it is a single event. The idea of gathering scientists and engineers for a general discussion on the theory and the practice of interferometry, involving rough, non-optically polished objects, was "in the air". An opportunity of this sort was not provided by any of the conferences scheduled when the present one was conceived. For this reason, it was easy to convince a small number of renowned researchers, all of them active in the field of holographic and speckle interferometry, to organize a conference. To be specific, they are the people listed below as members of the scientific and local committees. At the same time, a particular circumstance, namely the retirement of Professor L. Pflug, helped to detennine the location of the meeting.

The book presents the principles and methods of holographic interferometry - a coherent-optical measurement technique for deformation and stress analysis, for the determination of refractive-index distributions, or applied to non-destructive testing. Emphasis of the book is on the quantitative computer-aided evaluation of the holographic interferograms. Based upon wave-optics the evaluation methods, their implementation in computer-algorithms, and their applications in engineering are described.

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Review of Volume 4:'The Handbook can be a good reference for a higher-degree science student approaching the subject or for an expert in a similar field in astronomical instrumentation. The reader requiring an in-depth presentation of a specific topic will be guided by the rich reference lists included at the end of each chapter.'The ObservatoryOur goal is to produce a comprehensive handbook of the current state of the art of astronomical instrumentation with a forward view encompassing the next decade. The target audience is graduate students with an interest in astronomical instrumentation, as well as practitioners interested in learning about the state of the art in another wavelength band or field closely related to the one in which they currently work. We assume a working knowledge of the fundamental theory: optics, semiconductor physics, etc. The purpose of this handbook is to bring together some of the leading experts in the world to discuss the frontier of astronomical instrumentation across the electromagnetic spectrum and extending into multimessenger astronomy.

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.