Fundamentals Of Atomic Force Microscopy
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Author |
: Bert Voigtländer |
Publisher |
: Springer |
Total Pages |
: 329 |
Release |
: 2019-05-23 |
ISBN-10 |
: 9783030136543 |
ISBN-13 |
: 303013654X |
Rating |
: 4/5 (43 Downloads) |
Synopsis Atomic Force Microscopy by : Bert Voigtländer
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Author |
: Arturo M. Baró |
Publisher |
: John Wiley & Sons |
Total Pages |
: 385 |
Release |
: 2012-05-14 |
ISBN-10 |
: 9783527327584 |
ISBN-13 |
: 3527327584 |
Rating |
: 4/5 (84 Downloads) |
Synopsis Atomic Force Microscopy in Liquid by : Arturo M. Baró
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Author |
: W. Richard Bowen |
Publisher |
: Butterworth-Heinemann |
Total Pages |
: 300 |
Release |
: 2009-06-30 |
ISBN-10 |
: 9780080949574 |
ISBN-13 |
: 0080949576 |
Rating |
: 4/5 (74 Downloads) |
Synopsis Atomic Force Microscopy in Process Engineering by : W. Richard Bowen
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement
Author |
: Ronald G. Reifenberger |
Publisher |
: World Scientific Publishing Company Incorporated |
Total Pages |
: 350 |
Release |
: 2015-02 |
ISBN-10 |
: 9814630349 |
ISBN-13 |
: 9789814630344 |
Rating |
: 4/5 (49 Downloads) |
Synopsis Fundamentals of Atomic Force Microscopy by : Ronald G. Reifenberger
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
Author |
: Ronald G Reifenberger |
Publisher |
: World Scientific |
Total Pages |
: 341 |
Release |
: 2015-09-29 |
ISBN-10 |
: 9789814630375 |
ISBN-13 |
: 9814630373 |
Rating |
: 4/5 (75 Downloads) |
Synopsis Fundamentals Of Atomic Force Microscopy - Part I: Foundations by : Ronald G Reifenberger
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Author |
: Wesley C. Sanders |
Publisher |
: CRC Press |
Total Pages |
: 140 |
Release |
: 2019-10-08 |
ISBN-10 |
: 9781000707946 |
ISBN-13 |
: 1000707946 |
Rating |
: 4/5 (46 Downloads) |
Synopsis Atomic Force Microscopy by : Wesley C. Sanders
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
Author |
: Mario Lanza |
Publisher |
: John Wiley & Sons |
Total Pages |
: 382 |
Release |
: 2017-12-04 |
ISBN-10 |
: 9783527340910 |
ISBN-13 |
: 3527340912 |
Rating |
: 4/5 (10 Downloads) |
Synopsis Conductive Atomic Force Microscopy by : Mario Lanza
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Author |
: Peter Eaton |
Publisher |
: Oxford University Press |
Total Pages |
: 257 |
Release |
: 2010-03-25 |
ISBN-10 |
: 9780199570454 |
ISBN-13 |
: 0199570450 |
Rating |
: 4/5 (54 Downloads) |
Synopsis Atomic Force Microscopy by : Peter Eaton
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Author |
: Ricardo García |
Publisher |
: John Wiley & Sons |
Total Pages |
: 212 |
Release |
: 2011-08-24 |
ISBN-10 |
: 9783527643943 |
ISBN-13 |
: 352764394X |
Rating |
: 4/5 (43 Downloads) |
Synopsis Amplitude Modulation Atomic Force Microscopy by : Ricardo García
Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.
Author |
: Jian Zhong |
Publisher |
: Academic Press |
Total Pages |
: 385 |
Release |
: 2022-09-29 |
ISBN-10 |
: 9780128241325 |
ISBN-13 |
: 0128241322 |
Rating |
: 4/5 (25 Downloads) |
Synopsis Fundamentals and Application of Atomic Force Microscopy for Food Research by : Jian Zhong
Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. - Describes the application of AFM for food research - Covers applications of AFM for different types of food substances - Addresses future uses and perspectives of AFM for the development of food nanotechnology