Without a doubt, ELEMENTAL SPECTRA signifies a significant milestone in the evolution of the ideological philosophy of Social Transcendentalism, since it introduces a stylistic and thematic consistency comparatively new to John O'Loughlin's work at this time (1989) and brings a new structural comprehensiveness to bear on it which does justice to each of the spectra of the Elements, as outlined and developed in this exceptional text, with its fourfold approach to philosophy which could not but bring the author into conflict with Arthur Koestler's tripartite theories and thus necessitate a critique and, ultimately, refutation of his sophisticated but logically flawed philosophy.

A unique advanced textbook on spectroscopy. This interactive tutorial presents text, software and data in a state-of-the-art introduction to the interpretation of 13C- and 1H-nuclear magnetic resonance, infrared, mass and UV/VIS spectra. Designed as a hands-on guide, the newcomer or student learns not only by reading but by experimenting, using the powerful software tools and data provided on the accompanying CD-ROM. The software, based on the outstanding SpecTool product, enables you to learn how to interpret molecular spectra correctly, rapidly and easily. Moreover, you can check your progress by working through the examples embedded in this self-study course that demonstrate how to identify an organic compound and to elucidate its structure. All the material and software presented are the essence of the two authors? longstanding teaching experience.

This landmark publication distills the body of knowledge that characterizes mineral processing and extractive metallurgy as disciplinary fields. It will inspire and inform current and future generations of minerals and metallurgy professionals. Mineral processing and extractive metallurgy are atypical disciplines, requiring a combination of knowledge, experience, and art. Investing in this trove of valuable information is a must for all those involved in the industry—students, engineers, mill managers, and operators. More than 192 internationally recognized experts have contributed to the handbook’s 128 thought-provoking chapters that examine nearly every aspect of mineral processing and extractive metallurgy. This inclusive reference addresses the magnitude of traditional industry topics and also addresses the new technologies and important cultural and social issues that are important today. Contents Mineral Characterization and AnalysisManagement and ReportingComminutionClassification and WashingTransport and StoragePhysical SeparationsFlotationSolid and Liquid SeparationDisposalHydrometallurgyPyrometallurgyProcessing of Selected Metals, Minerals, and Materials

Understanding Mass Spectra: A Basic Approach, Second Edition combines coverage of the principles underlying mass spectral analysis with clear guidelines on how to apply them in a laboratory setting. Completely revised from the first edition, an updated and unified approach to mass spectral interpretation emphasizes the application of basic principles from undergraduate organic, analytical, and physical chemistry courses. A detailed overview of theory and instrumentation, this useful guide contains step-by-step descriptions of interpretative strategies and convenient lists and tables detailing the information needed to solve unknowns. Other features include real-world case studies and examples, skill-building problems with clearly explained answers, and easy-to-follow explanations of the important mathematical derivations.

Although there are a number of books in this field, most of them lack an introduction of comprehensive analysis of MS and IR spectra, and others do not provide up-to-date information like tandem MS. This book fills the gap. The merit of this book is that the author will not only introduce knowledge for analyzing nuclear magnetic resonance spectra including 1H spectra (Chapter 1), 13C spectra (Chapter 2) and 2D NMR spectra (Chapter 3), he also arms readers systemically with knowledge of Mass spectra (including EI MS spectra and MS spectra by using soft ionizations) (Chapter 4) and IR spectra (Chapter 5). In each chapter the author presents very practical application skills by providing various challenging examples. The last chapter (Chapter 6) provides the strategy, skills and methods on how to identify an unknown compound through a combination of spectra. Based on nearly 40 years researching and teaching experience, the author also proposes some original and creative ideas, which are very practical for spectral interpretation.

This book is a printed edition of the Special Issue "Spectra of Ionized Atoms: From Laboratory to Space" that was published in Atoms

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.