Digital Circuit Testing
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Author |
: Francis C. Wong |
Publisher |
: Elsevier |
Total Pages |
: 248 |
Release |
: 2012-12-02 |
ISBN-10 |
: 9780080504346 |
ISBN-13 |
: 0080504345 |
Rating |
: 4/5 (46 Downloads) |
Synopsis Digital Circuit Testing by : Francis C. Wong
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author |
: Parag K. Lala |
Publisher |
: Springer Nature |
Total Pages |
: 99 |
Release |
: 2022-06-01 |
ISBN-10 |
: 9783031797859 |
ISBN-13 |
: 303179785X |
Rating |
: 4/5 (59 Downloads) |
Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author |
: Parag K. Lala |
Publisher |
: Academic Press |
Total Pages |
: 222 |
Release |
: 1997 |
ISBN-10 |
: 0124343309 |
ISBN-13 |
: 9780124343306 |
Rating |
: 4/5 (09 Downloads) |
Synopsis Digital Circuit Testing and Testability by : Parag K. Lala
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author |
: N. K. Jha |
Publisher |
: Cambridge University Press |
Total Pages |
: 1022 |
Release |
: 2003-05-08 |
ISBN-10 |
: 1139437437 |
ISBN-13 |
: 9781139437431 |
Rating |
: 4/5 (37 Downloads) |
Synopsis Testing of Digital Systems by : N. K. Jha
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author |
: Alexander Miczo |
Publisher |
: Wiley |
Total Pages |
: 480 |
Release |
: 1985-12 |
ISBN-10 |
: 0471604224 |
ISBN-13 |
: 9780471604228 |
Rating |
: 4/5 (24 Downloads) |
Synopsis Digital Logic Testing and Simulation by : Alexander Miczo
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Author |
: M. Bushnell |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 690 |
Release |
: 2006-04-11 |
ISBN-10 |
: 9780306470400 |
ISBN-13 |
: 0306470403 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author |
: Parag K. Lala |
Publisher |
: Morgan & Claypool Publishers |
Total Pages |
: 111 |
Release |
: 2009 |
ISBN-10 |
: 9781598293500 |
ISBN-13 |
: 1598293508 |
Rating |
: 4/5 (00 Downloads) |
Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author |
: Rene David |
Publisher |
: CRC Press |
Total Pages |
: 508 |
Release |
: 2020-11-26 |
ISBN-10 |
: 9781000146011 |
ISBN-13 |
: 1000146014 |
Rating |
: 4/5 (11 Downloads) |
Synopsis Random Testing of Digital Circuits by : Rene David
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author |
: Ian A. Grout |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 396 |
Release |
: 2005-08-22 |
ISBN-10 |
: 1846280230 |
ISBN-13 |
: 9781846280238 |
Rating |
: 4/5 (30 Downloads) |
Synopsis Integrated Circuit Test Engineering by : Ian A. Grout
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author |
: Ruey-wen Liu |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 290 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461597476 |
ISBN-13 |
: 1461597471 |
Rating |
: 4/5 (76 Downloads) |
Synopsis Testing and Diagnosis of Analog Circuits and Systems by : Ruey-wen Liu
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.