"This 1977 seminar edition is the first major revision of material previously published in the highly successful Analog-Digital Conversion Handbook, first published by Analog Devices, Inc.in 1972 and reprinted in 1976. This volume contains parts I and II of that book, updated wherever specific converted products are referred to, in order to reflect the revolution in cost, size and (in some cases) performance brought about by the development of converters in integrated-circuit and hybrid form. Two entirely new chapters have been added to further reflect changes in the structure of the technological marketplace brough about by the availability of both converters and computers as true components. Chapter II-2 is a consideration of the relationship between processes, configurations, and performance in miniature low-cost converters. Chapter I-4 considers the application of converters with parallel and serial digital interfaces, microcomputers, asynchronous serial data posts, and proprietary integrated data-conversion-subsystem architectures - a natural sequel to the wide-ranging discussion of system considerations in other chapters."--Page i.

This book covers the theory and applications of high-speed analog-to-digital conversion. An analog-to-digital converter takes real-world inputs (such as visual images, temperature readings, and rates of speed) and transforms them into digital form for processing by computer. This book discusses the design and uses of such circuits, with particular emphasis on improving the speed of the conversion process and the accuracy of its output--how well the output is a corresponding digital representation of the output*b1input signal. As computers become increasingly interfaced to the outside world, "ADC" techniques will become ever more important.

This comprehensive new handbook is a one-stop engineering reference covering data converter fundamentals, techniques, and applications. Beginning with the basic theoretical elements necessary for a complete understanding of data converters, the book covers all the latest advances made in this changing field. Details are provided on the design of high-speec ADCs, high accuracy DACs and ADCs, sample-and-hold amplifiers, voltage sources and current reference,noise-shaping coding, sigma-delta converters, and much more.

A handbook of analog-to-digital and digital-to-analog converters -- and the circuits and systems that use them -- from the world leader in conversion products.

This textbook is appropriate for use in graduate-level curricula in analog-to-digital conversion, as well as for practicing engineers in need of a state-of-the-art reference on data converters. It discusses various analog-to-digital conversion principles, including sampling, quantization, reference generation, nyquist architectures and sigma-delta modulation. This book presents an overview of the state of the art in this field and focuses on issues of optimizing accuracy and speed, while reducing the power level. This new, third edition emphasizes novel calibration concepts, the specific requirements of new systems, the consequences of 22-nm technology and the need for a more statistical approach to accuracy. Pedagogical enhancements to this edition include additional, new exercises, solved examples to introduce all key, new concepts and warnings, remarks and hints, from a practitioner's perspective, wherever appropriate. Considerable background information and practical tips, from designing a PCB, to lay-out aspects, to trade-offs on system level, complement the discussion of basic principles, making this book a valuable reference for the experienced engineer.

This book presents a novel logarithmic conversion architecture based on cross-coupled inverter. An overview of the current state of the art of logarithmic converters is given where most conventional logarithmic analog-to-digital converter architectures are derived or adapted from linear analog-to-digital converter architectures, implying the use of analog building blocks such as amplifiers. The conversion architecture proposed in this book differs from the conventional logarithmic architectures. Future possible studies on integrating calibration in the voltage to time conversion element and work on an improved conversion architecture derived from the architecture are also presented in this book.

Smart and Flexible Digital-to-Analog Converters proposes new concepts and implementations for flexibility and self-correction of current-steering digital-to-analog converters (DACs) which allow the attainment of a wide range of functional and performance specifications, with a much reduced dependence on the fabrication process. DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.“/p> DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.

Micro-electronics and so integrated circuit design are heavily driven by technology scaling. The main engine of scaling is an increased system performance at reduced manufacturing cost (per system). In most systems digital circuits dominate with respect to die area and functional complexity. Digital building blocks take full - vantage of reduced device geometries in terms of area, power per functionality, and switching speed. On the other hand, analog circuits rely not on the fast transition speed between a few discrete states but fairly on the actual shape of the trans- tor characteristic. Technology scaling continuously degrades these characteristics with respect to analog performance parameters like output resistance or intrinsic gain. Below the 100 nm technology node the design of analog and mixed-signal circuits becomes perceptibly more dif cult. This is particularly true for low supply voltages near to 1V or below. The result is not only an increased design effort but also a growing power consumption. The area shrinks considerably less than p- dicted by the digital scaling factor. Obviously, both effects are contradictory to the original goal of scaling. However, digital circuits become faster, smaller, and less power hungry. The fast switching transitions reduce the susceptibility to noise, e. g. icker noise in the transistors. There are also a few drawbacks like the generation of power supply noise or the lack of power supply rejection.