An Introduction To Microwave Measurements
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Author |
: Ananjan Basu |
Publisher |
: CRC Press |
Total Pages |
: 314 |
Release |
: 2014-12-18 |
ISBN-10 |
: 9781482214369 |
ISBN-13 |
: 1482214369 |
Rating |
: 4/5 (69 Downloads) |
Synopsis An Introduction to Microwave Measurements by : Ananjan Basu
Go Beyond Basic Distributed Circuit AnalysisAn Introduction to Microwave Measurements has been written in a way that is different from many textbooks. As an instructor teaching a master's-level course on microwave measurements, the author recognized that few of today's graduate electrical engineering students are knowledgeable about microwave measu
Author |
: Joel P. Dunsmore |
Publisher |
: John Wiley & Sons |
Total Pages |
: 852 |
Release |
: 2020-06-29 |
ISBN-10 |
: 9781119477136 |
ISBN-13 |
: 1119477131 |
Rating |
: 4/5 (36 Downloads) |
Synopsis Handbook of Microwave Component Measurements by : Joel P. Dunsmore
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Author |
: Joel P. Dunsmore |
Publisher |
: John Wiley & Sons |
Total Pages |
: 620 |
Release |
: 2012-08-15 |
ISBN-10 |
: 9781118391259 |
ISBN-13 |
: 111839125X |
Rating |
: 4/5 (59 Downloads) |
Synopsis Handbook of Microwave Component Measurements by : Joel P. Dunsmore
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
Author |
: Valeria Teppati |
Publisher |
: Cambridge University Press |
Total Pages |
: 475 |
Release |
: 2013-06-20 |
ISBN-10 |
: 9781107036413 |
ISBN-13 |
: 1107036410 |
Rating |
: 4/5 (13 Downloads) |
Synopsis Modern RF and Microwave Measurement Techniques by : Valeria Teppati
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Author |
: Iain H. Woodhouse |
Publisher |
: CRC Press |
Total Pages |
: 321 |
Release |
: 2017-07-12 |
ISBN-10 |
: 9781351988551 |
ISBN-13 |
: 1351988557 |
Rating |
: 4/5 (51 Downloads) |
Synopsis Introduction to Microwave Remote Sensing by : Iain H. Woodhouse
Introduction to Microwave Remote Sensing offers an extensive overview of this versatile and extremely precise technology for technically oriented undergraduates and graduate students. This textbook emphasizes an important shift in conceptualization and directs it toward students with prior knowledge of optical remote sensing: the author dispels any linkage between microwave and optical remote sensing. Instead, he constructs the concept of microwave remote sensing by comparing it to the process of audio perception, explaining the workings of the ear as a metaphor for microwave instrumentation. This volume takes an “application-driven” approach. Instead of describing the technology and then its uses, this textbook justifies the need for measurement then explains how microwave technology addresses this need. Following a brief summary of the field and a history of the use of microwaves, the book explores the physical properties of microwaves and the polarimetric properties of electromagnetic waves. It examines the interaction of microwaves with matter, analyzes passive atmospheric and passive surface measurements, and describes the operation of altimeters and scatterometers. The textbook concludes by explaining how high resolution images are created using radars, and how techniques of interferometry can be applied to both passive and active sensors.
Author |
: Thomas H. Lee |
Publisher |
: Cambridge University Press |
Total Pages |
: 868 |
Release |
: 2004-08-30 |
ISBN-10 |
: 9781316175774 |
ISBN-13 |
: 1316175774 |
Rating |
: 4/5 (74 Downloads) |
Synopsis Planar Microwave Engineering by : Thomas H. Lee
Modern wireless communications hardware is underpinned by RF and microwave design techniques. This insightful book contains a wealth of circuit layouts, design tips, and practical measurement techniques for building and testing practical gigahertz systems. The book covers everything you need to know to design, build, and test a high-frequency circuit. Microstrip components are discussed, including tricks for extracting good performance from cheap materials. Connectors and cables are also described, as are discrete passive components, antennas, low-noise amplifiers, oscillators, and frequency synthesizers. Practical measurement techniques are presented in detail, including the use of network analyzers, sampling oscilloscopes, spectrum analyzers, and noise figure meters. Throughout the focus is practical, and many worked examples and design projects are included. There is also a CD-ROM that contains a variety of design and analysis programs. The book is packed with indispensable information for students taking courses on RF or microwave circuits and for practising engineers.
Author |
: Thomas S. Laverghetta |
Publisher |
: Artech House Publishers |
Total Pages |
: 574 |
Release |
: 1988 |
ISBN-10 |
: UOM:39015034836752 |
ISBN-13 |
: |
Rating |
: 4/5 (52 Downloads) |
Synopsis Modern Microwave Measurements and Techniques by : Thomas S. Laverghetta
Includes bibliography and index.
Author |
: Robert A. Witte |
Publisher |
: SciTech Publishing |
Total Pages |
: 328 |
Release |
: 2001 |
ISBN-10 |
: STANFORD:36105110179533 |
ISBN-13 |
: |
Rating |
: 4/5 (33 Downloads) |
Synopsis Spectrum and Network Measurements by : Robert A. Witte
This book covers the theory and practice of spectrum and network measurements in electronic systems. Areas covered include: decibels, Fourier analysis, FFT and swept analyzers, modulated signals, signal distortion, noise, pulsed waveforms, averaging and filtering, transmission lines and measurement connection techniques, two-port network theory, network analyzers, and instrument performance and specifications. Noble Publishing has reprinted the 1993 volume (from Prentice Hall) as a "classic" in the field. Witte works for Agilent Rechnologies. c. Book News Inc.
Author |
: Scott A. Wartenberg |
Publisher |
: Artech House |
Total Pages |
: 256 |
Release |
: 2002 |
ISBN-10 |
: 158053273X |
ISBN-13 |
: 9781580532730 |
Rating |
: 4/5 (3X Downloads) |
Synopsis RF Measurements of Die and Packages by : Scott A. Wartenberg
The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.
Author |
: Harry Albert Atwater |
Publisher |
: |
Total Pages |
: 288 |
Release |
: 1981 |
ISBN-10 |
: CHI:21334954 |
ISBN-13 |
: |
Rating |
: 4/5 (54 Downloads) |
Synopsis Introduction to Microwave Theory by : Harry Albert Atwater