Accelerated Life Models
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Author |
: Vilijandas Bagdonavicius |
Publisher |
: CRC Press |
Total Pages |
: 361 |
Release |
: 2001-11-28 |
ISBN-10 |
: 9781420035872 |
ISBN-13 |
: 1420035878 |
Rating |
: 4/5 (72 Downloads) |
Synopsis Accelerated Life Models by : Vilijandas Bagdonavicius
The authors of this monograph have developed a large and important class of survival analysis models that generalize most of the existing models. In a unified, systematic presentation, this monograph fully details those models and explores areas of accelerated life testing usually only touched upon in the literature. Accelerated Life Models:
Author |
: Wayne B. Nelson |
Publisher |
: John Wiley & Sons |
Total Pages |
: 626 |
Release |
: 2009-09-25 |
ISBN-10 |
: 9780470317471 |
ISBN-13 |
: 0470317477 |
Rating |
: 4/5 (71 Downloads) |
Synopsis Accelerated Testing by : Wayne B. Nelson
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." –Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." –Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
Author |
: Narayanaswamy Balakrishnan |
Publisher |
: John Wiley & Sons |
Total Pages |
: 240 |
Release |
: 2021-03-23 |
ISBN-10 |
: 9781119664000 |
ISBN-13 |
: 1119664004 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Accelerated Life Testing of One-shot Devices by : Narayanaswamy Balakrishnan
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Author |
: Tadashi Dohi |
Publisher |
: World Scientific |
Total Pages |
: 814 |
Release |
: 2006 |
ISBN-10 |
: 9789812567581 |
ISBN-13 |
: 9812567585 |
Rating |
: 4/5 (81 Downloads) |
Synopsis Advanced Reliability Modeling II by : Tadashi Dohi
The 2006 Asian International Workshop on Advanced Reliability Modeling (AIWARM) is the second symposium in a series of biennial workshops for the dissemination of state-of-art research and the presentation of practice in reliability and maintenance engineering in Asia. It brings together researchers and engineers from not only Asian countries but also all over world to discuss the state of research and practice in dealing with both reliability issues at the system design phase and maintenance issues at the system operation phase. The theme of AIWARM 2006 is ?reliability testing and improvement?. The contributions in this volume cover all the main topics in reliability and maintenance engineering, providing an in-depth presentation of theory and practice.
Author |
: Preeti Wanti Srivastava |
Publisher |
: World Scientific |
Total Pages |
: 444 |
Release |
: 2017-02-23 |
ISBN-10 |
: 9789813141278 |
ISBN-13 |
: 9813141271 |
Rating |
: 4/5 (78 Downloads) |
Synopsis Optimum Accelerated Life Testing Models With Time-varying Stresses by : Preeti Wanti Srivastava
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Author |
: Vilijandas Bagdonavicius |
Publisher |
: Chapman and Hall/CRC |
Total Pages |
: 334 |
Release |
: 2002-01 |
ISBN-10 |
: 1584881860 |
ISBN-13 |
: 9781584881865 |
Rating |
: 4/5 (60 Downloads) |
Synopsis Accelerated Life Models by : Vilijandas Bagdonavicius
The authors of this monograph have developed a large and important class of survival analysis models that generalize most of the existing models. In a unified, systematic presentation, this monograph fully details those models and explores areas of accelerated life testing usually only touched upon in the literature. Accelerated Life Models: Modeling and Statistical Analysis presents models, methods of data collection, and statistical analysis for failure-time regression data in accelerated life testing and for degradation data with explanatory variables. In addition to the classical results, the authors devote considerable attention to models with time-varying explanatory variables and to methods of semiparametric estimation. They also examine the simultaneous analysis of degradation and failure-time data when the intensities of failure in different modes depend on the level of degradation and the values of explanatory variables. The authors avoid technical details by explaining the ideas and referring to resources where thorough analysis can be found. Whether used for teaching, research or general reference, Accelerated Life Models: Modeling and Statistical Analysis provides new and known models and modern methods of accelerated life data analysis.
Author |
: Bryan Dodson |
Publisher |
: SAE International |
Total Pages |
: 252 |
Release |
: 2021-08-16 |
ISBN-10 |
: 9781468603514 |
ISBN-13 |
: 1468603515 |
Rating |
: 4/5 (14 Downloads) |
Synopsis Accelerated Testing by : Bryan Dodson
The application of accelerated testing theory is a difficult proposition, yet one that can result in considerable time and cost savings, as well as increasing a product's useful life. In Accelerated Testing: A Practitioner's Guide to Accelerated and Reliability Testing, readers are exposed to the latest, most practical knowledge available in this dynamic and important discipline. Authors Bryan Dodson and Harry Schwab draw on their considerable experience in the field to present comprehensive, insightful views in this book. Development and quality assurance tests are defined in detail and are presented from a practical viewpoint. Included are testing fundamentals, plans and models, and equipment and methods most commonly used in accelerated testing. Individuals seeking to evaluate and improve the design lives of components and systems will find this book a valuable reference, with special attention being paid to testing in the mobility industries.
Author |
: William Q. Meeker |
Publisher |
: John Wiley & Sons |
Total Pages |
: 708 |
Release |
: 2022-01-24 |
ISBN-10 |
: 9781118594483 |
ISBN-13 |
: 1118594487 |
Rating |
: 4/5 (83 Downloads) |
Synopsis Statistical Methods for Reliability Data by : William Q. Meeker
An authoritative guide to the most recent advances in statistical methods for quantifying reliability Statistical Methods for Reliability Data, Second Edition (SMRD2) is an essential guide to the most widely used and recently developed statistical methods for reliability data analysis and reliability test planning. Written by three experts in the area, SMRD2 updates and extends the long- established statistical techniques and shows how to apply powerful graphical, numerical, and simulation-based methods to a range of applications in reliability. SMRD2 is a comprehensive resource that describes maximum likelihood and Bayesian methods for solving practical problems that arise in product reliability and similar areas of application. SMRD2 illustrates methods with numerous applications and all the data sets are available on the book’s website. Also, SMRD2 contains an extensive collection of exercises that will enhance its use as a course textbook. The SMRD2's website contains valuable resources, including R packages, Stan model codes, presentation slides, technical notes, information about commercial software for reliability data analysis, and csv files for the 93 data sets used in the book's examples and exercises. The importance of statistical methods in the area of engineering reliability continues to grow and SMRD2 offers an updated guide for, exploring, modeling, and drawing conclusions from reliability data. SMRD2 features: Contains a wealth of information on modern methods and techniques for reliability data analysis Offers discussions on the practical problem-solving power of various Bayesian inference methods Provides examples of Bayesian data analysis performed using the R interface to the Stan system based on Stan models that are available on the book's website Includes helpful technical-problem and data-analysis exercise sets at the end of every chapter Presents illustrative computer graphics that highlight data, results of analyses, and technical concepts Written for engineers and statisticians in industry and academia, Statistical Methods for Reliability Data, Second Edition offers an authoritative guide to this important topic.
Author |
: John D. Kalbfleisch |
Publisher |
: John Wiley & Sons |
Total Pages |
: 462 |
Release |
: 2011-01-25 |
ISBN-10 |
: 9781118031230 |
ISBN-13 |
: 1118031237 |
Rating |
: 4/5 (30 Downloads) |
Synopsis The Statistical Analysis of Failure Time Data by : John D. Kalbfleisch
Contains additional discussion and examples on left truncationas well as material on more general censoring and truncationpatterns. Introduces the martingale and counting process formulation swillbe in a new chapter. Develops multivariate failure time data in a separate chapterand extends the material on Markov and semi Markovformulations. Presents new examples and applications of data analysis.
Author |
: Gerhard Tutz |
Publisher |
: Springer |
Total Pages |
: 252 |
Release |
: 2016-06-14 |
ISBN-10 |
: 9783319281582 |
ISBN-13 |
: 3319281585 |
Rating |
: 4/5 (82 Downloads) |
Synopsis Modeling Discrete Time-to-Event Data by : Gerhard Tutz
This book focuses on statistical methods for the analysis of discrete failure times. Failure time analysis is one of the most important fields in statistical research, with applications affecting a wide range of disciplines, in particular, demography, econometrics, epidemiology and clinical research. Although there are a large variety of statistical methods for failure time analysis, many techniques are designed for failure times that are measured on a continuous scale. In empirical studies, however, failure times are often discrete, either because they have been measured in intervals (e.g., quarterly or yearly) or because they have been rounded or grouped. The book covers well-established methods like life-table analysis and discrete hazard regression models, but also introduces state-of-the art techniques for model evaluation, nonparametric estimation and variable selection. Throughout, the methods are illustrated by real life applications, and relationships to survival analysis in continuous time are explained. Each section includes a set of exercises on the respective topics. Various functions and tools for the analysis of discrete survival data are collected in the R package discSurv that accompanies the book.