2000 Ieee International Reliability Physics Symposium
Download 2000 Ieee International Reliability Physics Symposium full books in PDF, epub, and Kindle. Read online free 2000 Ieee International Reliability Physics Symposium ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads.
Author |
: Ieee |
Publisher |
: |
Total Pages |
: 0 |
Release |
: |
ISBN-10 |
: OCLC:1405091280 |
ISBN-13 |
: |
Rating |
: 4/5 (80 Downloads) |
Synopsis 2000 Ieee International Reliability Physics Symposium Proceedings 38th Annual by : Ieee
Author |
: |
Publisher |
: |
Total Pages |
: 456 |
Release |
: 2000 |
ISBN-10 |
: 0780358600 |
ISBN-13 |
: 9780780358607 |
Rating |
: 4/5 (00 Downloads) |
Synopsis 2000 IEEE International Reliability Physics Symposium by :
Author |
: IEEE, Electron Devices Society and Reliability Society Staff |
Publisher |
: |
Total Pages |
: |
Release |
: 2000 |
ISBN-10 |
: OCLC:1316295979 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis IEEE International Reliability Physics Symposium, 2000 by : IEEE, Electron Devices Society and Reliability Society Staff
Author |
: IEEE |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: 466 |
Release |
: 2000-05 |
ISBN-10 |
: 0780358600 |
ISBN-13 |
: 9780780358607 |
Rating |
: 4/5 (00 Downloads) |
Synopsis IEEE International Reliability Physics Symposium, 2000 by : IEEE
Author |
: International Reliability Physics Symposium |
Publisher |
: |
Total Pages |
: 492 |
Release |
: 2002 |
ISBN-10 |
: UIUC:30112050739835 |
ISBN-13 |
: |
Rating |
: 4/5 (35 Downloads) |
Synopsis IEEE International Reliability Physics Symposium Proceedings by : International Reliability Physics Symposium
Author |
: J. W. McPherson |
Publisher |
: Springer |
Total Pages |
: 469 |
Release |
: 2018-12-20 |
ISBN-10 |
: 9783319936833 |
ISBN-13 |
: 3319936832 |
Rating |
: 4/5 (33 Downloads) |
Synopsis Reliability Physics and Engineering by : J. W. McPherson
This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
Author |
: IEEE Staff |
Publisher |
: |
Total Pages |
: |
Release |
: 2017-04-02 |
ISBN-10 |
: 150906642X |
ISBN-13 |
: 9781509066421 |
Rating |
: 4/5 (2X Downloads) |
Synopsis 2017 IEEE International Reliability Physics Symposium (IRPS) by : IEEE Staff
Study of reliability as applied to semiconductor manufacturing, automotive, PV, and other engineering disciplines International participation
Author |
: IEEE |
Publisher |
: Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages |
: |
Release |
: 2000-10 |
ISBN-10 |
: 0780358635 |
ISBN-13 |
: 9780780358638 |
Rating |
: 4/5 (35 Downloads) |
Synopsis 2000 IEEE International Reliability Physics Symposium by : IEEE
Author |
: |
Publisher |
: |
Total Pages |
: |
Release |
: 2006 |
ISBN-10 |
: 1509092471 |
ISBN-13 |
: 9781509092475 |
Rating |
: 4/5 (71 Downloads) |
Synopsis Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International by :
Author |
: |
Publisher |
: |
Total Pages |
: 62 |
Release |
: 2001 |
ISBN-10 |
: UOM:39015047798346 |
ISBN-13 |
: |
Rating |
: 4/5 (46 Downloads) |