Optical Methods In Engineering Metrology
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Author |
: Gary L. Cloud |
Publisher |
: Cambridge University Press |
Total Pages |
: 526 |
Release |
: 1998-05-28 |
ISBN-10 |
: 0521636426 |
ISBN-13 |
: 9780521636421 |
Rating |
: 4/5 (26 Downloads) |
Synopsis Optical Methods of Engineering Analysis by : Gary L. Cloud
Fundamental measurement problems in engineering, mechanics, manufacturing, and physics are now being solved by powerful optical methods. This book presents a lucid, up-to-date discussion of these optical methods. Beginning from a firm base in modern optics, the book proceeds through relevant theory of interference and diffraction and integrates this theory with descriptions of laboratory techniques and apparatus. Among the techniques discussed are classical interferometry, photoelasticity, geometric moire, spatial filtering, moire interferometry, holography, holographic interferometry, laser speckle interferometry, and video-based speckle methods. By providing a firm base in the physical principles and at the same time allowing the reader to perform meaningful experiments related to the topic being studied, the book offers a unique user-oriented approach that will appeal to students, researchers and practising engineers.
Author |
: Toru Yoshizawa |
Publisher |
: CRC Press |
Total Pages |
: 866 |
Release |
: 2017-07-28 |
ISBN-10 |
: 9781351831840 |
ISBN-13 |
: 1351831844 |
Rating |
: 4/5 (40 Downloads) |
Synopsis Handbook of Optical Metrology by : Toru Yoshizawa
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author |
: D.C. Williams |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 490 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9789401115643 |
ISBN-13 |
: 9401115648 |
Rating |
: 4/5 (43 Downloads) |
Synopsis Optical Methods in Engineering Metrology by : D.C. Williams
Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology. Requiring only a basic knowledge of optics, this text provides a compendium of practical information prepared by leaders in the field.
Author |
: Kevin Harding |
Publisher |
: Taylor & Francis |
Total Pages |
: 497 |
Release |
: 2016-04-19 |
ISBN-10 |
: 9781439854822 |
ISBN-13 |
: 1439854823 |
Rating |
: 4/5 (22 Downloads) |
Synopsis Handbook of Optical Dimensional Metrology by : Kevin Harding
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author |
: Rajpal S. Sirohi |
Publisher |
: CRC Press |
Total Pages |
: 449 |
Release |
: 2017-07-12 |
ISBN-10 |
: 9781482236118 |
ISBN-13 |
: 1482236117 |
Rating |
: 4/5 (18 Downloads) |
Synopsis Introduction to Optical Metrology by : Rajpal S. Sirohi
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Author |
: Richard Leach |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 333 |
Release |
: 2011-03-31 |
ISBN-10 |
: 9783642120121 |
ISBN-13 |
: 3642120121 |
Rating |
: 4/5 (21 Downloads) |
Synopsis Optical Measurement of Surface Topography by : Richard Leach
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Author |
: Pramod Rastogi |
Publisher |
: Artech House |
Total Pages |
: 473 |
Release |
: 2015-05-01 |
ISBN-10 |
: 9781608078073 |
ISBN-13 |
: 1608078078 |
Rating |
: 4/5 (73 Downloads) |
Synopsis Digital Optical Measurement Techniques and Applications by : Pramod Rastogi
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Author |
: Dahi Ghareab Abdelsalam Ibrahim |
Publisher |
: Cambridge Scholars Publishing |
Total Pages |
: 312 |
Release |
: 2019-07-31 |
ISBN-10 |
: 9781527537736 |
ISBN-13 |
: 1527537730 |
Rating |
: 4/5 (36 Downloads) |
Synopsis Optical Metrology with Interferometry by : Dahi Ghareab Abdelsalam Ibrahim
The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.
Author |
: David J. Whitehouse |
Publisher |
: Elsevier |
Total Pages |
: 425 |
Release |
: 2004-07-01 |
ISBN-10 |
: 9780080518237 |
ISBN-13 |
: 0080518230 |
Rating |
: 4/5 (37 Downloads) |
Synopsis Surfaces and their Measurement by : David J. Whitehouse
The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. · Written by one of the world's leading metrologists · Covers electronics and optics applications as well as mechanical · Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia
Author |
: Kjell J. Gåsvik |
Publisher |
: John Wiley & Sons |
Total Pages |
: 372 |
Release |
: 2003-04-11 |
ISBN-10 |
: 9780470846704 |
ISBN-13 |
: 0470846704 |
Rating |
: 4/5 (04 Downloads) |
Synopsis Optical Metrology by : Kjell J. Gåsvik
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.