This book is devoted to a simple practical approach to neutron, X-ray and light scattering experiments, involving model calculation of the scattering and mathematical transformation. It is intended to attract colloid and polymer scientists using scattering methods in their laboratory or at common research facilities. The primary objective is to explain the current methodology of elastic and quasi-elastic scattering techniques (avoiding both under and over-exploitation of data) rather than a general course on colloids and polymers. Basic information on data interpretation, on the complementarity of the different types of radiation, as well as information on recent applications and developments are presented.

This book addresses the basic physical phenomenon of small-angle scattering (SAS) of neutrons, x-rays or light from complex hierarchical nano- and micro-structures. The emphasis is on developing theoretical models for the material structure containing self-similar or fractal clusters. Within the suggested framework, key approaches for extracting structural information from experimental scattering data are investigated and presented in detail. The range of parameters which can be obtained pave the road towards a better understanding of the correlations between geometrical and various physical properties (electrical, magnetic, mechanical, optical, dynamical, transport etc.) in fractal nano- and micro-materials.

This book provides the basic theoretical background for X-ray and neutron scattering experiments. Since these techniques are increasingly being used by biologists and chemists, as well as physicists, the book is intended to be accessible to a broad spectrum of scientists.

Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.

Also, to help students gain a unified view of diffraction, the distinction between wide-angle diffraction and small-angle scattering is postponed until late in the text."--BOOK JACKET.

This book provides a comprehensive and up-to-date introduction to the fundamental theory and applications of slow-neutron scattering.

- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books

This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.

Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.

The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.